
Bruce C. Anderson
Examiner (ID: 15788)
| Most Active Art Unit | 2506 |
| Art Unit(s) | 2899, 2881, 2506, 2878, 2872 |
| Total Applications | 2208 |
| Issued Applications | 1947 |
| Pending Applications | 78 |
| Abandoned Applications | 183 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1318716
[patent_doc_number] => 06608313
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-08-19
[patent_title] => 'Methods and devices for achieving alignment of a beam-propagation axis with a center of an aperture in a charged-particle-beam optical system'
[patent_app_type] => B2
[patent_app_number] => 09/765530
[patent_app_country] => US
[patent_app_date] => 2001-01-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 5621
[patent_no_of_claims] => 9
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[patent_words_short_claim] => 285
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/608/06608313.pdf
[firstpage_image] =>[orig_patent_app_number] => 09765530
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/765530 | Methods and devices for achieving alignment of a beam-propagation axis with a center of an aperture in a charged-particle-beam optical system | Jan 18, 2001 | Issued |
Array
(
[id] => 1343547
[patent_doc_number] => 06590208
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-07-08
[patent_title] => 'Balanced momentum probe holder'
[patent_app_type] => B2
[patent_app_number] => 09/766555
[patent_app_country] => US
[patent_app_date] => 2001-01-19
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[firstpage_image] =>[orig_patent_app_number] => 09766555
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/766555 | Balanced momentum probe holder | Jan 18, 2001 | Issued |
Array
(
[id] => 1402690
[patent_doc_number] => 06541771
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-04-01
[patent_title] => 'Scanning electron microscope'
[patent_app_type] => B2
[patent_app_number] => 09/759284
[patent_app_country] => US
[patent_app_date] => 2001-01-16
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[firstpage_image] =>[orig_patent_app_number] => 09759284
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/759284 | Scanning electron microscope | Jan 15, 2001 | Issued |
Array
(
[id] => 5964432
[patent_doc_number] => 20020088947
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-07-11
[patent_title] => 'Method of pole tip sample preparation using FIB'
[patent_app_type] => new
[patent_app_number] => 09/758305
[patent_app_country] => US
[patent_app_date] => 2001-01-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 2516
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[pdf_file] => publications/A1/0088/20020088947.pdf
[firstpage_image] =>[orig_patent_app_number] => 09758305
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/758305 | Method of pole tip sample preparation using FIB | Jan 9, 2001 | Issued |
Array
(
[id] => 1351350
[patent_doc_number] => 06583410
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-06-24
[patent_title] => 'Polarimeter'
[patent_app_type] => B1
[patent_app_number] => 09/743401
[patent_app_country] => US
[patent_app_date] => 2001-01-08
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[firstpage_image] =>[orig_patent_app_number] => 09743401
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/743401 | Polarimeter | Jan 7, 2001 | Issued |
Array
(
[id] => 1318665
[patent_doc_number] => 06608306
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[patent_kind] => B1
[patent_issue_date] => 2003-08-19
[patent_title] => 'Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structure'
[patent_app_type] => B1
[patent_app_number] => 09/743202
[patent_app_country] => US
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[pdf_file] => patents/06/608/06608306.pdf
[firstpage_image] =>[orig_patent_app_number] => 09743202
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/743202 | Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structure | Jan 7, 2001 | Issued |
Array
(
[id] => 5964429
[patent_doc_number] => 20020088944
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-07-11
[patent_title] => 'Charge exchange device for charged particle accelerator'
[patent_app_type] => new
[patent_app_number] => 09/755554
[patent_app_country] => US
[patent_app_date] => 2001-01-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 6636
[patent_no_of_claims] => 31
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[pdf_file] => publications/A1/0088/20020088944.pdf
[firstpage_image] =>[orig_patent_app_number] => 09755554
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/755554 | Charge exchange device for charged particle accelerator | Jan 4, 2001 | Abandoned |
Array
(
[id] => 6566225
[patent_doc_number] => 20020084258
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-07-04
[patent_title] => 'Apparatus and method for distribution of dopant gases or vapors in an arc chamber for use in an ionization source'
[patent_app_type] => new
[patent_app_number] => 09/754442
[patent_app_country] => US
[patent_app_date] => 2001-01-04
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0084/20020084258.pdf
[firstpage_image] =>[orig_patent_app_number] => 09754442
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/754442 | Apparatus and method for distribution of dopant gases or vapors in an arc chamber for use in an ionization source | Jan 3, 2001 | Issued |
Array
(
[id] => 1544118
[patent_doc_number] => 06373054
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-16
[patent_title] => 'Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same'
[patent_app_type] => B1
[patent_app_number] => 09/752468
[patent_app_country] => US
[patent_app_date] => 2001-01-03
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[pdf_file] => patents/06/373/06373054.pdf
[firstpage_image] =>[orig_patent_app_number] => 09752468
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/752468 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Jan 2, 2001 | Issued |
Array
(
[id] => 1301975
[patent_doc_number] => 06624426
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-09-23
[patent_title] => 'Split magnetic lens for controlling a charged particle beam'
[patent_app_type] => B2
[patent_app_number] => 09/734409
[patent_app_country] => US
[patent_app_date] => 2000-12-11
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 2017
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[pdf_file] => patents/06/624/06624426.pdf
[firstpage_image] =>[orig_patent_app_number] => 09734409
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/734409 | Split magnetic lens for controlling a charged particle beam | Dec 10, 2000 | Issued |
Array
(
[id] => 6891716
[patent_doc_number] => 20010017878
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[patent_issue_date] => 2001-08-30
[patent_title] => 'Method of inspecting pattern and inspecting instrument'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/725900 | Method of inspecting pattern and inspecting instrument | Nov 29, 2000 | Issued |
Array
(
[id] => 1496751
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[patent_title] => 'Multipole ion guide for mass spectrometry'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/727285 | Multipole ion guide for mass spectrometry | Nov 29, 2000 | Issued |
Array
(
[id] => 5996971
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[patent_title] => 'Ion trap mass spectroscopy'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/725533 | Ion trap mass spectroscopy | Nov 28, 2000 | Issued |
| 09/714133 | Apparatus for detection of format accuracy of a web of corrugated board | Nov 16, 2000 | Abandoned |
Array
(
[id] => 1534409
[patent_doc_number] => 06410912
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[patent_issue_date] => 2002-06-25
[patent_title] => 'Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/712109 | Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation | Nov 13, 2000 | Issued |
Array
(
[id] => 1343651
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[patent_title] => 'Leak detection lamp'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/704543 | Leak detection lamp | Nov 2, 2000 | Issued |
Array
(
[id] => 1409155
[patent_doc_number] => 06534765
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[patent_kind] => B1
[patent_issue_date] => 2003-03-18
[patent_title] => 'Atmospheric pressure photoionization (APPI): a new ionization method for liquid chromatography-mass spectrometry'
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[patent_app_number] => 09/697401
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/697401 | Atmospheric pressure photoionization (APPI): a new ionization method for liquid chromatography-mass spectrometry | Oct 26, 2000 | Issued |
Array
(
[id] => 1363462
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[patent_issue_date] => 2003-06-03
[patent_title] => 'Method and apparatus for laser analysis of dioxins'
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[patent_app_number] => 09/696005
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[firstpage_image] =>[orig_patent_app_number] => 09696005
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/696005 | Method and apparatus for laser analysis of dioxins | Oct 25, 2000 | Issued |
Array
(
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/689059 | Particle optical apparatus | Oct 11, 2000 | Issued |