
Bruce C. Anderson
Examiner (ID: 15788)
| Most Active Art Unit | 2506 |
| Art Unit(s) | 2899, 2881, 2506, 2878, 2872 |
| Total Applications | 2208 |
| Issued Applications | 1947 |
| Pending Applications | 78 |
| Abandoned Applications | 183 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4176258
[patent_doc_number] => 06140655
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-10-31
[patent_title] => 'Method for water vapor enhanced charged-particle-beam machining'
[patent_app_type] => 1
[patent_app_number] => 9/275296
[patent_app_country] => US
[patent_app_date] => 1999-03-24
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[pdf_file] => patents/06/140/06140655.pdf
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Array
(
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[patent_kind] => B1
[patent_issue_date] => 2002-05-21
[patent_title] => 'Mass spectrometer'
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[patent_app_date] => 1999-03-12
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Array
(
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[patent_issue_date] => 2000-06-20
[patent_title] => 'Mass selector'
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Array
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[patent_issue_date] => 2001-02-13
[patent_title] => 'Mass spectrometer'
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Array
(
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[patent_issue_date] => 2001-10-02
[patent_title] => 'Method and apparatus for force control of a scanning probe'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/258817 | Method and apparatus for force control of a scanning probe | Feb 25, 1999 | Issued |
Array
(
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[patent_doc_number] => 06507029
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[patent_issue_date] => 2003-01-14
[patent_title] => 'Sample processing apparatus and method for removing charge on sample through light irradiation'
[patent_app_type] => B1
[patent_app_number] => 09/255700
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Array
(
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[patent_issue_date] => 2001-10-09
[patent_title] => 'Method for monitoring Faraday cup operation in an ion implantation apparatus'
[patent_app_type] => 1
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/250425 | Method for monitoring Faraday cup operation in an ion implantation apparatus | Feb 15, 1999 | Issued |
Array
(
[id] => 4375861
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[patent_issue_date] => 2001-09-11
[patent_title] => 'Method of fast evaluation of analytical mass spectra'
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[patent_app_number] => 9/248131
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[firstpage_image] =>[orig_patent_app_number] => 248131
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/248131 | Method of fast evaluation of analytical mass spectra | Feb 9, 1999 | Issued |
Array
(
[id] => 1385789
[patent_doc_number] => 06555827
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[patent_issue_date] => 2003-04-29
[patent_title] => 'Method of determining variations in the properties of a sample'
[patent_app_type] => B1
[patent_app_number] => 09/147626
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Array
(
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[patent_doc_number] => 06353221
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[patent_issue_date] => 2002-03-05
[patent_title] => 'Method and apparatus for cleaning a tip of a probe of a probe-based measuring instrument'
[patent_app_type] => B1
[patent_app_number] => 09/240713
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/240713 | Method and apparatus for cleaning a tip of a probe of a probe-based measuring instrument | Jan 28, 1999 | Issued |
Array
(
[id] => 4218429
[patent_doc_number] => RE037146
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[patent_issue_date] => 2001-04-24
[patent_title] => 'Low power infrared scene projector array and method of manufacture'
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Array
(
[id] => 1554580
[patent_doc_number] => 06348688
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[patent_title] => 'Tandem time-of-flight mass spectrometer with delayed extraction and method for use'
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Array
(
[id] => 1436499
[patent_doc_number] => 06355933
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[patent_title] => 'Ion source and method for using same'
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/228930 | AFM-based lithography metrology tool | Jan 11, 1999 | Issued |
Array
(
[id] => 1552718
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Array
(
[id] => 1447985
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Array
(
[id] => 4387425
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[patent_issue_date] => 2001-08-21
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/217722 | Continuous cold atom beam atomic system | Dec 20, 1998 | Issued |