Search

Bruce C. Anderson

Examiner (ID: 15788)

Most Active Art Unit
2506
Art Unit(s)
2899, 2881, 2506, 2878, 2872
Total Applications
2208
Issued Applications
1947
Pending Applications
78
Abandoned Applications
183

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4176258 [patent_doc_number] => 06140655 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-31 [patent_title] => 'Method for water vapor enhanced charged-particle-beam machining' [patent_app_type] => 1 [patent_app_number] => 9/275296 [patent_app_country] => US [patent_app_date] => 1999-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2701 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/140/06140655.pdf [firstpage_image] =>[orig_patent_app_number] => 275296 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/275296
Method for water vapor enhanced charged-particle-beam machining Mar 23, 1999 Issued
Array ( [id] => 1461227 [patent_doc_number] => 06392226 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Mass spectrometer' [patent_app_type] => B1 [patent_app_number] => 09/254718 [patent_app_country] => US [patent_app_date] => 1999-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 8614 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392226.pdf [firstpage_image] =>[orig_patent_app_number] => 09254718 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/254718
Mass spectrometer Mar 11, 1999 Issued
Array ( [id] => 4209338 [patent_doc_number] => 06078043 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-20 [patent_title] => 'Mass selector' [patent_app_type] => 1 [patent_app_number] => 9/125824 [patent_app_country] => US [patent_app_date] => 1999-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4098 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/078/06078043.pdf [firstpage_image] =>[orig_patent_app_number] => 125824 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/125824
Mass selector Mar 7, 1999 Issued
Array ( [id] => 4308922 [patent_doc_number] => 06188065 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/260552 [patent_app_country] => US [patent_app_date] => 1999-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 20 [patent_no_of_words] => 8777 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/188/06188065.pdf [firstpage_image] =>[orig_patent_app_number] => 260552 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/260552
Mass spectrometer Mar 1, 1999 Issued
Array ( [id] => 4400824 [patent_doc_number] => 06297502 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-02 [patent_title] => 'Method and apparatus for force control of a scanning probe' [patent_app_type] => 1 [patent_app_number] => 9/258817 [patent_app_country] => US [patent_app_date] => 1999-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 15 [patent_no_of_words] => 4712 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/297/06297502.pdf [firstpage_image] =>[orig_patent_app_number] => 258817 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/258817
Method and apparatus for force control of a scanning probe Feb 25, 1999 Issued
Array ( [id] => 1423795 [patent_doc_number] => 06507029 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-01-14 [patent_title] => 'Sample processing apparatus and method for removing charge on sample through light irradiation' [patent_app_type] => B1 [patent_app_number] => 09/255700 [patent_app_country] => US [patent_app_date] => 1999-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 7107 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/507/06507029.pdf [firstpage_image] =>[orig_patent_app_number] => 09255700 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/255700
Sample processing apparatus and method for removing charge on sample through light irradiation Feb 22, 1999 Issued
Array ( [id] => 4413512 [patent_doc_number] => 06300642 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-09 [patent_title] => 'Method for monitoring Faraday cup operation in an ion implantation apparatus' [patent_app_type] => 1 [patent_app_number] => 9/250425 [patent_app_country] => US [patent_app_date] => 1999-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2760 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/300/06300642.pdf [firstpage_image] =>[orig_patent_app_number] => 250425 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/250425
Method for monitoring Faraday cup operation in an ion implantation apparatus Feb 15, 1999 Issued
Array ( [id] => 4375861 [patent_doc_number] => 06288389 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Method of fast evaluation of analytical mass spectra' [patent_app_type] => 1 [patent_app_number] => 9/248131 [patent_app_country] => US [patent_app_date] => 1999-02-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 5 [patent_no_of_words] => 3732 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288389.pdf [firstpage_image] =>[orig_patent_app_number] => 248131 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/248131
Method of fast evaluation of analytical mass spectra Feb 9, 1999 Issued
Array ( [id] => 1385789 [patent_doc_number] => 06555827 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-29 [patent_title] => 'Method of determining variations in the properties of a sample' [patent_app_type] => B1 [patent_app_number] => 09/147626 [patent_app_country] => US [patent_app_date] => 1999-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 1700 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/555/06555827.pdf [firstpage_image] =>[orig_patent_app_number] => 09147626 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/147626
Method of determining variations in the properties of a sample Feb 3, 1999 Issued
Array ( [id] => 1524787 [patent_doc_number] => 06353221 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-05 [patent_title] => 'Method and apparatus for cleaning a tip of a probe of a probe-based measuring instrument' [patent_app_type] => B1 [patent_app_number] => 09/240713 [patent_app_country] => US [patent_app_date] => 1999-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 22 [patent_no_of_words] => 5809 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/353/06353221.pdf [firstpage_image] =>[orig_patent_app_number] => 09240713 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/240713
Method and apparatus for cleaning a tip of a probe of a probe-based measuring instrument Jan 28, 1999 Issued
Array ( [id] => 4218429 [patent_doc_number] => RE037146 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-24 [patent_title] => 'Low power infrared scene projector array and method of manufacture' [patent_app_type] => 2 [patent_app_number] => 9/239304 [patent_app_country] => US [patent_app_date] => 1999-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 21 [patent_no_of_words] => 6663 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/RE/037/RE037146.pdf [firstpage_image] =>[orig_patent_app_number] => 239304 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/239304
Low power infrared scene projector array and method of manufacture Jan 28, 1999 Issued
Array ( [id] => 1554580 [patent_doc_number] => 06348688 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-02-19 [patent_title] => 'Tandem time-of-flight mass spectrometer with delayed extraction and method for use' [patent_app_type] => B1 [patent_app_number] => 09/233703 [patent_app_country] => US [patent_app_date] => 1999-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 14 [patent_no_of_words] => 8964 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/348/06348688.pdf [firstpage_image] =>[orig_patent_app_number] => 09233703 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/233703
Tandem time-of-flight mass spectrometer with delayed extraction and method for use Jan 18, 1999 Issued
Array ( [id] => 1436499 [patent_doc_number] => 06355933 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-12 [patent_title] => 'Ion source and method for using same' [patent_app_type] => B1 [patent_app_number] => 09/229326 [patent_app_country] => US [patent_app_date] => 1999-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3490 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/355/06355933.pdf [firstpage_image] =>[orig_patent_app_number] => 09229326 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/229326
Ion source and method for using same Jan 12, 1999 Issued
Array ( [id] => 1461239 [patent_doc_number] => 06392229 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'AFM-based lithography metrology tool' [patent_app_type] => B1 [patent_app_number] => 09/228930 [patent_app_country] => US [patent_app_date] => 1999-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 22 [patent_no_of_words] => 11221 [patent_no_of_claims] => 45 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392229.pdf [firstpage_image] =>[orig_patent_app_number] => 09228930 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/228930
AFM-based lithography metrology tool Jan 11, 1999 Issued
Array ( [id] => 1552718 [patent_doc_number] => 06399953 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-04 [patent_title] => 'Scanning electronic microscope and method for automatically observing semiconductor wafer' [patent_app_type] => B1 [patent_app_number] => 09/227231 [patent_app_country] => US [patent_app_date] => 1999-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4929 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/399/06399953.pdf [firstpage_image] =>[orig_patent_app_number] => 09227231 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/227231
Scanning electronic microscope and method for automatically observing semiconductor wafer Jan 7, 1999 Issued
Array ( [id] => 1447985 [patent_doc_number] => 06369397 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-09 [patent_title] => 'SPM base focal plane positioning' [patent_app_type] => B1 [patent_app_number] => 09/225120 [patent_app_country] => US [patent_app_date] => 1999-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 1323 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/369/06369397.pdf [firstpage_image] =>[orig_patent_app_number] => 09225120 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/225120
SPM base focal plane positioning Jan 3, 1999 Issued
Array ( [id] => 4387425 [patent_doc_number] => 06278112 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-21 [patent_title] => 'Method of setting a base energy level for an Auger electron spectroscopy analysis of a titanium nitride film, and method of analyzing the titanium nitride film' [patent_app_type] => 1 [patent_app_number] => 9/221829 [patent_app_country] => US [patent_app_date] => 1998-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 2762 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/278/06278112.pdf [firstpage_image] =>[orig_patent_app_number] => 221829 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/221829
Method of setting a base energy level for an Auger electron spectroscopy analysis of a titanium nitride film, and method of analyzing the titanium nitride film Dec 27, 1998 Issued
Array ( [id] => 4300573 [patent_doc_number] => 06198096 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-06 [patent_title] => 'High duty cycle pseudo-noise modulated time-of-flight mass spectrometry' [patent_app_type] => 1 [patent_app_number] => 9/219212 [patent_app_country] => US [patent_app_date] => 1998-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 4918 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/198/06198096.pdf [firstpage_image] =>[orig_patent_app_number] => 219212 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/219212
High duty cycle pseudo-noise modulated time-of-flight mass spectrometry Dec 21, 1998 Issued
Array ( [id] => 4413842 [patent_doc_number] => 06265723 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Magnetic shield apparatus' [patent_app_type] => 1 [patent_app_number] => 9/218501 [patent_app_country] => US [patent_app_date] => 1998-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 2988 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/265/06265723.pdf [firstpage_image] =>[orig_patent_app_number] => 218501 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/218501
Magnetic shield apparatus Dec 21, 1998 Issued
Array ( [id] => 4384974 [patent_doc_number] => 06303928 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-16 [patent_title] => 'Continuous cold atom beam atomic system' [patent_app_type] => 1 [patent_app_number] => 9/217722 [patent_app_country] => US [patent_app_date] => 1998-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4646 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/303/06303928.pdf [firstpage_image] =>[orig_patent_app_number] => 217722 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/217722
Continuous cold atom beam atomic system Dec 20, 1998 Issued
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