
Bruce I. Ebersman
Examiner (ID: 8045, Phone: (571)270-3442 , Office: P/3692 )
| Most Active Art Unit | 3692 |
| Art Unit(s) | 3693, 3691, 3698, 3692 |
| Total Applications | 748 |
| Issued Applications | 440 |
| Pending Applications | 73 |
| Abandoned Applications | 253 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3690049
[patent_doc_number] => 05674008
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-10-07
[patent_title] => 'Pulsed temperature monitoring circuit and method'
[patent_app_type] => 1
[patent_app_number] => 8/484711
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 2610
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/674/05674008.pdf
[firstpage_image] =>[orig_patent_app_number] => 484711
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/484711 | Pulsed temperature monitoring circuit and method | Jun 6, 1995 | Issued |
Array
(
[id] => 3750499
[patent_doc_number] => 05741070
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-04-21
[patent_title] => 'Apparatus for real-time semiconductor wafer temperature measurement based on a surface roughness characteristic of the wafer'
[patent_app_type] => 1
[patent_app_number] => 8/474213
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 6520
[patent_no_of_claims] => 4
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[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/741/05741070.pdf
[firstpage_image] =>[orig_patent_app_number] => 474213
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/474213 | Apparatus for real-time semiconductor wafer temperature measurement based on a surface roughness characteristic of the wafer | Jun 6, 1995 | Issued |
Array
(
[id] => 3651185
[patent_doc_number] => 05647669
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-07-15
[patent_title] => 'Method for generating a simulated signal relating to a temperature in the exhaust system of an internal combustion engine'
[patent_app_type] => 1
[patent_app_number] => 8/477037
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2695
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 87
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/647/05647669.pdf
[firstpage_image] =>[orig_patent_app_number] => 477037
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/477037 | Method for generating a simulated signal relating to a temperature in the exhaust system of an internal combustion engine | Jun 6, 1995 | Issued |
Array
(
[id] => 3650192
[patent_doc_number] => 05655837
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-12
[patent_title] => 'Radiation thermometers'
[patent_app_type] => 1
[patent_app_number] => 8/460271
[patent_app_country] => US
[patent_app_date] => 1995-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 1202
[patent_no_of_claims] => 11
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/655/05655837.pdf
[firstpage_image] =>[orig_patent_app_number] => 460271
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/460271 | Radiation thermometers | Jun 1, 1995 | Issued |
Array
(
[id] => 3637084
[patent_doc_number] => 05628565
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-13
[patent_title] => 'Multifunctional air data sensing probes'
[patent_app_type] => 1
[patent_app_number] => 8/460103
[patent_app_country] => US
[patent_app_date] => 1995-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 3837
[patent_no_of_claims] => 4
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/628/05628565.pdf
[firstpage_image] =>[orig_patent_app_number] => 460103
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/460103 | Multifunctional air data sensing probes | Jun 1, 1995 | Issued |
Array
(
[id] => 3650203
[patent_doc_number] => 05655838
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-12
[patent_title] => 'Radiation thermometer with a focusing system'
[patent_app_type] => 1
[patent_app_number] => 8/460654
[patent_app_country] => US
[patent_app_date] => 1995-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[patent_no_of_words] => 970
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/655/05655838.pdf
[firstpage_image] =>[orig_patent_app_number] => 460654
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/460654 | Radiation thermometer with a focusing system | Jun 1, 1995 | Issued |
Array
(
[id] => 3723115
[patent_doc_number] => 05697705
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-12-16
[patent_title] => 'Method for testing a heat source'
[patent_app_type] => 1
[patent_app_number] => 8/457829
[patent_app_country] => US
[patent_app_date] => 1995-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 2600
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 156
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/697/05697705.pdf
[firstpage_image] =>[orig_patent_app_number] => 457829
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/457829 | Method for testing a heat source | May 31, 1995 | Issued |
Array
(
[id] => 3657140
[patent_doc_number] => 05597237
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-28
[patent_title] => 'Apparatus for measuring the emissivity of a semiconductor wafer'
[patent_app_type] => 1
[patent_app_number] => 8/450659
[patent_app_country] => US
[patent_app_date] => 1995-05-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 2292
[patent_no_of_claims] => 2
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[patent_words_short_claim] => 363
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/597/05597237.pdf
[firstpage_image] =>[orig_patent_app_number] => 450659
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/450659 | Apparatus for measuring the emissivity of a semiconductor wafer | May 29, 1995 | Issued |
Array
(
[id] => 3777768
[patent_doc_number] => 05779365
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-07-14
[patent_title] => 'Temperature sensor for medical application'
[patent_app_type] => 1
[patent_app_number] => 8/436435
[patent_app_country] => US
[patent_app_date] => 1995-05-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 5788
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/779/05779365.pdf
[firstpage_image] =>[orig_patent_app_number] => 436435
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/436435 | Temperature sensor for medical application | May 23, 1995 | Issued |
Array
(
[id] => 3650244
[patent_doc_number] => 05655841
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-12
[patent_title] => 'Error-compensated temperature measuring system'
[patent_app_type] => 1
[patent_app_number] => 8/442892
[patent_app_country] => US
[patent_app_date] => 1995-05-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 31
[patent_figures_cnt] => 56
[patent_no_of_words] => 9796
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/655/05655841.pdf
[firstpage_image] =>[orig_patent_app_number] => 442892
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/442892 | Error-compensated temperature measuring system | May 16, 1995 | Issued |
Array
(
[id] => 3563999
[patent_doc_number] => 05579659
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-03
[patent_title] => 'Method for testing a spring pack of a motor operated valve'
[patent_app_type] => 1
[patent_app_number] => 8/435121
[patent_app_country] => US
[patent_app_date] => 1995-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 2770
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[pdf_file] => patents/05/579/05579659.pdf
[firstpage_image] =>[orig_patent_app_number] => 435121
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/435121 | Method for testing a spring pack of a motor operated valve | May 4, 1995 | Issued |
Array
(
[id] => 3685239
[patent_doc_number] => 05618108
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-08
[patent_title] => 'Temperature distribution measuring apparatus using an optical fiber'
[patent_app_type] => 1
[patent_app_number] => 8/434948
[patent_app_country] => US
[patent_app_date] => 1995-05-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => patents/05/618/05618108.pdf
[firstpage_image] =>[orig_patent_app_number] => 434948
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/434948 | Temperature distribution measuring apparatus using an optical fiber | May 3, 1995 | Issued |
Array
(
[id] => 3761504
[patent_doc_number] => 05816707
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-10-06
[patent_title] => 'Reversible chemical thermometer'
[patent_app_type] => 1
[patent_app_number] => 8/425162
[patent_app_country] => US
[patent_app_date] => 1995-04-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/816/05816707.pdf
[firstpage_image] =>[orig_patent_app_number] => 425162
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/425162 | Reversible chemical thermometer | Apr 25, 1995 | Issued |
Array
(
[id] => 3594958
[patent_doc_number] => 05550592
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-08-27
[patent_title] => 'Film mode progressive scan conversion'
[patent_app_type] => 1
[patent_app_number] => 8/429254
[patent_app_country] => US
[patent_app_date] => 1995-04-25
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 1814
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/550/05550592.pdf
[firstpage_image] =>[orig_patent_app_number] => 429254
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/429254 | Film mode progressive scan conversion | Apr 24, 1995 | Issued |
Array
(
[id] => 3604543
[patent_doc_number] => 05613399
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-03-25
[patent_title] => 'Method for liquid level detection'
[patent_app_type] => 1
[patent_app_number] => 8/422859
[patent_app_country] => US
[patent_app_date] => 1995-04-17
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/613/05613399.pdf
[firstpage_image] =>[orig_patent_app_number] => 422859
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/422859 | Method for liquid level detection | Apr 16, 1995 | Issued |
Array
(
[id] => 3673120
[patent_doc_number] => RE035639
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-10-21
[patent_title] => 'Method and apparatus for measuring ratio of mass flow rates and energy flow in a gas pipeline'
[patent_app_type] => 2
[patent_app_number] => 8/420254
[patent_app_country] => US
[patent_app_date] => 1995-04-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/RE/035/RE035639.pdf
[firstpage_image] =>[orig_patent_app_number] => 420254
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/420254 | Method and apparatus for measuring ratio of mass flow rates and energy flow in a gas pipeline | Apr 10, 1995 | Issued |
| 08/415338 | METHOD FOR MEASURING TEMPERATURE USING OPTICAL FIBER AND APPARATUS THEREFOR | Apr 2, 1995 | Abandoned |
Array
(
[id] => 3625689
[patent_doc_number] => 05630667
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-20
[patent_title] => 'Model and method for predicting heat cracking of heat-resistant members'
[patent_app_type] => 1
[patent_app_number] => 8/413160
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[patent_app_date] => 1995-03-29
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/630/05630667.pdf
[firstpage_image] =>[orig_patent_app_number] => 413160
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/413160 | Model and method for predicting heat cracking of heat-resistant members | Mar 28, 1995 | Issued |
Array
(
[id] => 3577742
[patent_doc_number] => 05584579
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-17
[patent_title] => 'Thermal detector'
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[pdf_file] => patents/05/584/05584579.pdf
[firstpage_image] =>[orig_patent_app_number] => 405977
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/405977 | Thermal detector | Mar 16, 1995 | Issued |
Array
(
[id] => 3649304
[patent_doc_number] => 05622430
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-22
[patent_title] => 'Method of testing the heat insulation action of bodies especially of heat insulation bodies'
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[patent_app_country] => US
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/622/05622430.pdf
[firstpage_image] =>[orig_patent_app_number] => 404089
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/404089 | Method of testing the heat insulation action of bodies especially of heat insulation bodies | Mar 13, 1995 | Issued |