Bryan Bui

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Array ( [id] => 4470498 [patent_doc_number] => 07937233 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-03 [patent_title] => 'Preferential defect marking on a web' [patent_app_type] => utility [patent_app_number] => 12/104700 [patent_app_country] => US [patent_app_date] => 2008-04-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 10808 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/937/07937233.pdf [firstpage_image] =>[orig_patent_app_number] => 12104700 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4888400 [patent_doc_number] => 20080262732 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-23 [patent_title] => 'METHOD OF DETECTING, LOCATING, AND CLASSIFYING LIGHTNING' [patent_app_type] => utility [patent_app_number] => 12/103788 [patent_app_country] => US [patent_app_date] => 2008-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 7903 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0262/20080262732.pdf [firstpage_image] =>[orig_patent_app_number] => 12103788 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6260615 [patent_doc_number] => 20100030503 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-04 [patent_title] => 'SYSTEM AND CIRCUIT FOR DETERMINING DATA SIGNAL JITTER VIA ASYNCHRONOUS SAMPLING' [patent_app_type] => utility [patent_app_number] => 12/103689 [patent_app_country] => US [patent_app_date] => 2008-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4243 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20100030503.pdf [firstpage_image] =>[orig_patent_app_number] => 12103689 [rel_patent_id] =>[rel_patent_doc_number] =>)

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Array ( [id] => 7494696 [patent_doc_number] => 08032332 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-10-04 [patent_title] => 'Semiconductor inspecting apparatus' [patent_app_type] => utility [patent_app_number] => 12/099868 [patent_app_country] => US [patent_app_date] => 2008-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 20 [patent_no_of_words] => 8292 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 446 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/032/08032332.pdf [firstpage_image] =>[orig_patent_app_number] => 12099868 [rel_patent_id] =>[rel_patent_doc_number] =>)

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Array ( [id] => 86842 [patent_doc_number] => 07742889 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-22 [patent_title] => 'Designing an optical metrology system optimized with signal criteria' [patent_app_type] => utility [patent_app_number] => 12/057316 [patent_app_country] => US [patent_app_date] => 2008-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 7001 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 293 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/742/07742889.pdf [firstpage_image] =>[orig_patent_app_number] => 12057316 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5475174 [patent_doc_number] => 20090248340 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-01 [patent_title] => 'APPARATUS FOR DESIGNING AN OPTICAL METROLOGY SYSTEM OPTIMIZED WITH SIGNAL CRITERIA' [patent_app_type] => utility [patent_app_number] => 12/057332 [patent_app_country] => US [patent_app_date] => 2008-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6980 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0248/20090248340.pdf [firstpage_image] =>[orig_patent_app_number] => 12057332 [rel_patent_id] =>[rel_patent_doc_number] =>)

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