Search

Bryan Bui

Examiner (ID: 1865, Phone: (571)272-2271 , Office: P/2865 )

Most Active Art Unit
2863
Art Unit(s)
2865, 2414, 2764, 2863, 2857
Total Applications
2284
Issued Applications
2047
Pending Applications
88
Abandoned Applications
146

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 257851 [patent_doc_number] => 07577536 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-08-18 [patent_title] => 'Determination of ohmic losses in electrical devices' [patent_app_type] => utility [patent_app_number] => 11/760555 [patent_app_country] => US [patent_app_date] => 2007-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2515 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/577/07577536.pdf [firstpage_image] =>[orig_patent_app_number] => 11760555 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/760555
Determination of ohmic losses in electrical devices Jun 7, 2007 Issued
Array ( [id] => 219344 [patent_doc_number] => 07613578 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-03 [patent_title] => 'Method for noninvasive determination of a distribution of electrical current and apparatus for the same' [patent_app_type] => utility [patent_app_number] => 11/759555 [patent_app_country] => US [patent_app_date] => 2007-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5200 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/613/07613578.pdf [firstpage_image] =>[orig_patent_app_number] => 11759555 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/759555
Method for noninvasive determination of a distribution of electrical current and apparatus for the same Jun 6, 2007 Issued
Array ( [id] => 5088732 [patent_doc_number] => 20070228371 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-04 [patent_title] => 'Method for Evaluating Semiconductor Device' [patent_app_type] => utility [patent_app_number] => 11/758066 [patent_app_country] => US [patent_app_date] => 2007-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6861 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0228/20070228371.pdf [firstpage_image] =>[orig_patent_app_number] => 11758066 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/758066
Method for evaluating semiconductor device Jun 4, 2007 Issued
Array ( [id] => 4712297 [patent_doc_number] => 20080300823 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'METHODS AND SYSTEMS FOR MANUFACTURING LARGE COMPONENTS' [patent_app_type] => utility [patent_app_number] => 11/757739 [patent_app_country] => US [patent_app_date] => 2007-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3209 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0300/20080300823.pdf [firstpage_image] =>[orig_patent_app_number] => 11757739 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/757739
Methods and systems for manufacturing large components Jun 3, 2007 Issued
Array ( [id] => 4754020 [patent_doc_number] => 20080162096 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'Signal waveform analyzing device' [patent_app_type] => utility [patent_app_number] => 11/806646 [patent_app_country] => US [patent_app_date] => 2007-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3195 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0162/20080162096.pdf [firstpage_image] =>[orig_patent_app_number] => 11806646 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/806646
Signal waveform analyzing device May 31, 2007 Issued
Array ( [id] => 332308 [patent_doc_number] => 07512506 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-31 [patent_title] => 'IC chip stress testing' [patent_app_type] => utility [patent_app_number] => 11/755827 [patent_app_country] => US [patent_app_date] => 2007-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 5364 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 455 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/512/07512506.pdf [firstpage_image] =>[orig_patent_app_number] => 11755827 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/755827
IC chip stress testing May 30, 2007 Issued
Array ( [id] => 287084 [patent_doc_number] => 07552016 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-06-23 [patent_title] => 'Integrated circuit having a multi-purpose node configured to receive a threshold voltage and to provide a fault signal' [patent_app_type] => utility [patent_app_number] => 11/755295 [patent_app_country] => US [patent_app_date] => 2007-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3441 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/552/07552016.pdf [firstpage_image] =>[orig_patent_app_number] => 11755295 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/755295
Integrated circuit having a multi-purpose node configured to receive a threshold voltage and to provide a fault signal May 29, 2007 Issued
Array ( [id] => 320620 [patent_doc_number] => 07523017 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-04-21 [patent_title] => 'Workpiece assessment system and method for using the same' [patent_app_type] => utility [patent_app_number] => 11/755651 [patent_app_country] => US [patent_app_date] => 2007-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1544 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/523/07523017.pdf [firstpage_image] =>[orig_patent_app_number] => 11755651 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/755651
Workpiece assessment system and method for using the same May 29, 2007 Issued
Array ( [id] => 135351 [patent_doc_number] => 07702471 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-20 [patent_title] => 'Determining one or more profile parameters of a photomask covered by a pellicle' [patent_app_type] => utility [patent_app_number] => 11/753496 [patent_app_country] => US [patent_app_date] => 2007-05-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 4875 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 11 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/702/07702471.pdf [firstpage_image] =>[orig_patent_app_number] => 11753496 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/753496
Determining one or more profile parameters of a photomask covered by a pellicle May 23, 2007 Issued
Array ( [id] => 4780190 [patent_doc_number] => 20080288188 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-20 [patent_title] => 'Structure and Method for Monitoring Variation Within an Active Region of a Semiconductor Device Using Scaling' [patent_app_type] => utility [patent_app_number] => 11/749801 [patent_app_country] => US [patent_app_date] => 2007-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6330 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0288/20080288188.pdf [firstpage_image] =>[orig_patent_app_number] => 11749801 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/749801
Structure and method for monitoring variation within an active region of a semiconductor device using scaling May 16, 2007 Issued
Array ( [id] => 339617 [patent_doc_number] => 07505852 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-17 [patent_title] => 'Probabilistic stress wave analysis system and method' [patent_app_type] => utility [patent_app_number] => 11/750159 [patent_app_country] => US [patent_app_date] => 2007-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 16 [patent_no_of_words] => 9461 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/505/07505852.pdf [firstpage_image] =>[orig_patent_app_number] => 11750159 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/750159
Probabilistic stress wave analysis system and method May 16, 2007 Issued
Array ( [id] => 248534 [patent_doc_number] => 07587293 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-08 [patent_title] => 'Semiconductor CP (circuit probe) test management system and method' [patent_app_type] => utility [patent_app_number] => 11/746222 [patent_app_country] => US [patent_app_date] => 2007-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 3142 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/587/07587293.pdf [firstpage_image] =>[orig_patent_app_number] => 11746222 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/746222
Semiconductor CP (circuit probe) test management system and method May 8, 2007 Issued
Array ( [id] => 175307 [patent_doc_number] => 07660689 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-09 [patent_title] => 'Single and multiphase fluid measurements' [patent_app_type] => utility [patent_app_number] => 11/745356 [patent_app_country] => US [patent_app_date] => 2007-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 5772 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/660/07660689.pdf [firstpage_image] =>[orig_patent_app_number] => 11745356 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/745356
Single and multiphase fluid measurements May 6, 2007 Issued
Array ( [id] => 7686855 [patent_doc_number] => 20090177436 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-09 [patent_title] => 'Position Detecting Device and Position Detecting Method' [patent_app_type] => utility [patent_app_number] => 12/298445 [patent_app_country] => US [patent_app_date] => 2007-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5094 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0177/20090177436.pdf [firstpage_image] =>[orig_patent_app_number] => 12298445 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/298445
Position detecting device and position detecting method Apr 25, 2007 Issued
Array ( [id] => 332311 [patent_doc_number] => 07512509 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-31 [patent_title] => 'M1 testable addressable array for device parameter characterization' [patent_app_type] => utility [patent_app_number] => 11/740538 [patent_app_country] => US [patent_app_date] => 2007-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 22 [patent_no_of_words] => 5073 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/512/07512509.pdf [firstpage_image] =>[orig_patent_app_number] => 11740538 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/740538
M1 testable addressable array for device parameter characterization Apr 25, 2007 Issued
Array ( [id] => 4861180 [patent_doc_number] => 20080270030 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-30 [patent_title] => 'Real-time Stadium and Sports Weather Network' [patent_app_type] => utility [patent_app_number] => 11/740460 [patent_app_country] => US [patent_app_date] => 2007-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2074 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0270/20080270030.pdf [firstpage_image] =>[orig_patent_app_number] => 11740460 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/740460
Real-time Stadium and Sports Weather Network Apr 25, 2007 Abandoned
Array ( [id] => 5197162 [patent_doc_number] => 20070296480 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'Clock circuits and counting values in integrated circuits' [patent_app_type] => utility [patent_app_number] => 11/796150 [patent_app_country] => US [patent_app_date] => 2007-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3461 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20070296480.pdf [firstpage_image] =>[orig_patent_app_number] => 11796150 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/796150
Clock circuits and counting values in integrated circuits Apr 25, 2007 Issued
Array ( [id] => 350352 [patent_doc_number] => 07496476 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-02-24 [patent_title] => 'Method and system for analyzing performance of an information processing system' [patent_app_type] => utility [patent_app_number] => 11/739730 [patent_app_country] => US [patent_app_date] => 2007-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8067 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/496/07496476.pdf [firstpage_image] =>[orig_patent_app_number] => 11739730 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/739730
Method and system for analyzing performance of an information processing system Apr 24, 2007 Issued
Array ( [id] => 8424168 [patent_doc_number] => 08280664 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-02 [patent_title] => 'XY-coordinate compensation apparatus and method in sample pattern inspection apparatus' [patent_app_type] => utility [patent_app_number] => 12/226683 [patent_app_country] => US [patent_app_date] => 2007-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 28 [patent_figures_cnt] => 37 [patent_no_of_words] => 23872 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12226683 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/226683
XY-coordinate compensation apparatus and method in sample pattern inspection apparatus Apr 24, 2007 Issued
Array ( [id] => 7686848 [patent_doc_number] => 20090177443 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-09 [patent_title] => 'METHOD AND SYSTEM FOR DETECTING CHANGES IN SENSOR SAMPLE STREAMS' [patent_app_type] => utility [patent_app_number] => 11/738562 [patent_app_country] => US [patent_app_date] => 2007-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4349 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0177/20090177443.pdf [firstpage_image] =>[orig_patent_app_number] => 11738562 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/738562
Method and system for detecting changes in sensor sample streams Apr 22, 2007 Issued
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