Search

Carol Rademaker

Examiner (ID: 10201)

Most Active Art Unit
2912
Art Unit(s)
2900, 2912
Total Applications
2914
Issued Applications
2884
Pending Applications
0
Abandoned Applications
30

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8959315 [patent_doc_number] => 08505109 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-08-06 [patent_title] => 'Measuring probe device for a probe microscope, measuring cell and scanning probe microscope' [patent_app_type] => utility [patent_app_number] => 12/670561 [patent_app_country] => US [patent_app_date] => 2008-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 5749 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12670561 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/670561
Measuring probe device for a probe microscope, measuring cell and scanning probe microscope Jul 23, 2008 Issued
Array ( [id] => 7545753 [patent_doc_number] => 08053726 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-08 [patent_title] => 'Inspection system by charged particle beam and method of manufacturing devices using the system' [patent_app_type] => utility [patent_app_number] => 12/216233 [patent_app_country] => US [patent_app_date] => 2008-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 50 [patent_figures_cnt] => 62 [patent_no_of_words] => 52327 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 251 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/053/08053726.pdf [firstpage_image] =>[orig_patent_app_number] => 12216233 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/216233
Inspection system by charged particle beam and method of manufacturing devices using the system Jun 30, 2008 Issued
Array ( [id] => 6074812 [patent_doc_number] => 20110047662 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-24 [patent_title] => 'APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFERENT MATERIALS' [patent_app_type] => utility [patent_app_number] => 12/666745 [patent_app_country] => US [patent_app_date] => 2008-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2224 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0047/20110047662.pdf [firstpage_image] =>[orig_patent_app_number] => 12666745 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/666745
Apparatus and method for investigating surface properties of different materials Jun 25, 2008 Issued
Array ( [id] => 5439236 [patent_doc_number] => 20090090875 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-09 [patent_title] => 'Higher pressure, modular target system for radioisotope production' [patent_app_type] => utility [patent_app_number] => 12/213614 [patent_app_country] => US [patent_app_date] => 2008-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4833 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20090090875.pdf [firstpage_image] =>[orig_patent_app_number] => 12213614 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/213614
Higher pressure, modular target system for radioisotope production Jun 22, 2008 Abandoned
Array ( [id] => 4537408 [patent_doc_number] => 07888662 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-15 [patent_title] => 'Ion source cleaning method and apparatus' [patent_app_type] => utility [patent_app_number] => 12/143247 [patent_app_country] => US [patent_app_date] => 2008-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3691 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/888/07888662.pdf [firstpage_image] =>[orig_patent_app_number] => 12143247 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/143247
Ion source cleaning method and apparatus Jun 19, 2008 Issued
Array ( [id] => 5582616 [patent_doc_number] => 20090101818 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-23 [patent_title] => 'Corrector' [patent_app_type] => utility [patent_app_number] => 12/213493 [patent_app_country] => US [patent_app_date] => 2008-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4433 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0101/20090101818.pdf [firstpage_image] =>[orig_patent_app_number] => 12213493 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/213493
Corrector Jun 19, 2008 Issued
Array ( [id] => 103625 [patent_doc_number] => 07723706 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-25 [patent_title] => 'Horizontal and vertical beam angle measurement technique' [patent_app_type] => utility [patent_app_number] => 12/142553 [patent_app_country] => US [patent_app_date] => 2008-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3573 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/723/07723706.pdf [firstpage_image] =>[orig_patent_app_number] => 12142553 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/142553
Horizontal and vertical beam angle measurement technique Jun 18, 2008 Issued
Array ( [id] => 64810 [patent_doc_number] => 07759657 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-20 [patent_title] => 'Methods for implanting B22Hx and its ionized lower mass byproducts' [patent_app_type] => utility [patent_app_number] => 12/142081 [patent_app_country] => US [patent_app_date] => 2008-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6905 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/759/07759657.pdf [firstpage_image] =>[orig_patent_app_number] => 12142081 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/142081
Methods for implanting B22Hx and its ionized lower mass byproducts Jun 18, 2008 Issued
Array ( [id] => 103624 [patent_doc_number] => 07723705 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-25 [patent_title] => 'Techniques for measuring ion beam emittance' [patent_app_type] => utility [patent_app_number] => 12/141570 [patent_app_country] => US [patent_app_date] => 2008-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 5287 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 40 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/723/07723705.pdf [firstpage_image] =>[orig_patent_app_number] => 12141570 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/141570
Techniques for measuring ion beam emittance Jun 17, 2008 Issued
Array ( [id] => 4756517 [patent_doc_number] => 20080308742 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'IN-CHAMBER ELECTRON DETECTOR' [patent_app_type] => utility [patent_app_number] => 12/141723 [patent_app_country] => US [patent_app_date] => 2008-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3892 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0308/20080308742.pdf [firstpage_image] =>[orig_patent_app_number] => 12141723 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/141723
In-chamber electron detector Jun 17, 2008 Issued
Array ( [id] => 4758478 [patent_doc_number] => 20080310704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'SCANNING ELECTRON MICROSCOPE AND METHOD OF IMAGING AN OBJECT BY USING THE SCANNING ELECTRON MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 12/139970 [patent_app_country] => US [patent_app_date] => 2008-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5384 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0310/20080310704.pdf [firstpage_image] =>[orig_patent_app_number] => 12139970 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/139970
Scanning electron microscope and method of imaging an object by using the scanning electron microscope Jun 15, 2008 Issued
Array ( [id] => 4849371 [patent_doc_number] => 20080315113 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-25 [patent_title] => 'BEAM GUIDANCE MAGNET' [patent_app_type] => utility [patent_app_number] => 12/138774 [patent_app_country] => US [patent_app_date] => 2008-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5376 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20080315113.pdf [firstpage_image] =>[orig_patent_app_number] => 12138774 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/138774
BEAM GUIDANCE MAGNET Jun 12, 2008 Abandoned
Array ( [id] => 4600543 [patent_doc_number] => 07977658 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-07-12 [patent_title] => 'Flexible infrared delivery apparatus and method' [patent_app_type] => utility [patent_app_number] => 12/137691 [patent_app_country] => US [patent_app_date] => 2008-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 29 [patent_no_of_words] => 5255 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/977/07977658.pdf [firstpage_image] =>[orig_patent_app_number] => 12137691 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/137691
Flexible infrared delivery apparatus and method Jun 11, 2008 Issued
Array ( [id] => 4563226 [patent_doc_number] => 07838832 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-11-23 [patent_title] => 'Electron beam apparatus and inspection method using dual illumination beams with dynamically controllable offsets' [patent_app_type] => utility [patent_app_number] => 12/135058 [patent_app_country] => US [patent_app_date] => 2008-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5411 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/838/07838832.pdf [firstpage_image] =>[orig_patent_app_number] => 12135058 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/135058
Electron beam apparatus and inspection method using dual illumination beams with dynamically controllable offsets Jun 5, 2008 Issued
Array ( [id] => 4462098 [patent_doc_number] => 07880139 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-01 [patent_title] => 'Method and apparatus of uniform gas-phase molecular matrix deposition for imaging mass spectrometry' [patent_app_type] => utility [patent_app_number] => 12/154912 [patent_app_country] => US [patent_app_date] => 2008-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 4304 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/880/07880139.pdf [firstpage_image] =>[orig_patent_app_number] => 12154912 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/154912
Method and apparatus of uniform gas-phase molecular matrix deposition for imaging mass spectrometry May 27, 2008 Issued
Array ( [id] => 72540 [patent_doc_number] => 07755038 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-13 [patent_title] => 'Nanostructured thin films and their uses' [patent_app_type] => utility [patent_app_number] => 12/121008 [patent_app_country] => US [patent_app_date] => 2008-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 27 [patent_no_of_words] => 9076 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/755/07755038.pdf [firstpage_image] =>[orig_patent_app_number] => 12121008 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/121008
Nanostructured thin films and their uses May 14, 2008 Issued
Array ( [id] => 6020928 [patent_doc_number] => 20110049353 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-03 [patent_title] => 'Mass Spectrometer' [patent_app_type] => utility [patent_app_number] => 12/600209 [patent_app_country] => US [patent_app_date] => 2008-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6240 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0049/20110049353.pdf [firstpage_image] =>[orig_patent_app_number] => 12600209 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/600209
Mass spectrometer May 13, 2008 Issued
Array ( [id] => 4723780 [patent_doc_number] => 20080203321 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'Radiation Source for Irradiating the Interior Walls of Elongated Cavities' [patent_app_type] => utility [patent_app_number] => 12/115569 [patent_app_country] => US [patent_app_date] => 2008-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2898 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0203/20080203321.pdf [firstpage_image] =>[orig_patent_app_number] => 12115569 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/115569
Radiation source for irradiating the interior walls of elongated cavities May 5, 2008 Issued
Array ( [id] => 63463 [patent_doc_number] => 07763849 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-07-27 [patent_title] => 'Reflecting ion cyclotron resonance cell' [patent_app_type] => utility [patent_app_number] => 12/113813 [patent_app_country] => US [patent_app_date] => 2008-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8856 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/763/07763849.pdf [firstpage_image] =>[orig_patent_app_number] => 12113813 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/113813
Reflecting ion cyclotron resonance cell Apr 30, 2008 Issued
Array ( [id] => 4756497 [patent_doc_number] => 20080308722 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'ELECTROSPRAY-ASSISTED LASER-INDUCED ACOUSTIC DESORPTION IONIZATION MASS SPECTROMETER AND A METHOD FOR MASS SPECTROMETRY' [patent_app_type] => utility [patent_app_number] => 12/112532 [patent_app_country] => US [patent_app_date] => 2008-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 42 [patent_figures_cnt] => 42 [patent_no_of_words] => 9073 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0308/20080308722.pdf [firstpage_image] =>[orig_patent_app_number] => 12112532 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/112532
ELECTROSPRAY-ASSISTED LASER-INDUCED ACOUSTIC DESORPTION IONIZATION MASS SPECTROMETER AND A METHOD FOR MASS SPECTROMETRY Apr 29, 2008 Abandoned
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