
Carol Rademaker
Examiner (ID: 10201)
| Most Active Art Unit | 2912 |
| Art Unit(s) | 2900, 2912 |
| Total Applications | 2914 |
| Issued Applications | 2884 |
| Pending Applications | 0 |
| Abandoned Applications | 30 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5767337
[patent_doc_number] => 20060019173
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-01-26
[patent_title] => 'Method of designing charged particle beam mask, charged particle beam mask, and charged particle beam transfer method'
[patent_app_type] => utility
[patent_app_number] => 11/014867
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[pdf_file] => publications/A1/0019/20060019173.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/014867 | Method of designing charged particle beam mask, charged particle beam mask, and charged particle beam transfer method | Dec 19, 2004 | Abandoned |
Array
(
[id] => 827128
[patent_doc_number] => 07402795
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-07-22
[patent_title] => 'Particle sorting method'
[patent_app_type] => utility
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Array
(
[id] => 7234870
[patent_doc_number] => 20050139764
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[patent_kind] => A1
[patent_issue_date] => 2005-06-30
[patent_title] => 'Interfaces for a photoionization mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 11/004495
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/004495 | Interfaces for a photoionization mass spectrometer | Dec 2, 2004 | Issued |
Array
(
[id] => 691846
[patent_doc_number] => 07075071
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-07-11
[patent_title] => 'Conductive transparent probe and probe control apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/001038
[patent_app_country] => US
[patent_app_date] => 2004-12-02
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[pdf_file] => patents/07/075/07075071.pdf
[firstpage_image] =>[orig_patent_app_number] => 11001038
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/001038 | Conductive transparent probe and probe control apparatus | Dec 1, 2004 | Issued |
Array
(
[id] => 592327
[patent_doc_number] => 07435976
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-10-14
[patent_title] => 'Ion beam device'
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[patent_app_date] => 2004-12-02
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[pdf_file] => patents/07/435/07435976.pdf
[firstpage_image] =>[orig_patent_app_number] => 10581429
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/581429 | Ion beam device | Dec 1, 2004 | Issued |
Array
(
[id] => 655620
[patent_doc_number] => 07109484
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[patent_issue_date] => 2006-09-19
[patent_title] => 'Sheet beam-type inspection apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/989368
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[patent_app_date] => 2004-11-17
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[pdf_file] => patents/07/109/07109484.pdf
[firstpage_image] =>[orig_patent_app_number] => 10989368
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/989368 | Sheet beam-type inspection apparatus | Nov 16, 2004 | Issued |
Array
(
[id] => 876029
[patent_doc_number] => RE040221
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[patent_issue_date] => 2008-04-08
[patent_title] => 'Object observation apparatus and object observation'
[patent_app_type] => reissue
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[pdf_file] => patents/RE/040/RE040221.pdf
[firstpage_image] =>[orig_patent_app_number] => 10986576
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/986576 | Object observation apparatus and object observation | Nov 11, 2004 | Issued |
Array
(
[id] => 6988541
[patent_doc_number] => 20050087697
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[patent_kind] => A1
[patent_issue_date] => 2005-04-28
[patent_title] => 'Inspection by a transmission electron microscope of a sample'
[patent_app_type] => utility
[patent_app_number] => 10/974953
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[patent_app_date] => 2004-10-28
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[pdf_file] => publications/A1/0087/20050087697.pdf
[firstpage_image] =>[orig_patent_app_number] => 10974953
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/974953 | Inspection by a transmission electron microscope of a sample | Oct 27, 2004 | Issued |
Array
(
[id] => 239893
[patent_doc_number] => 07592610
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-09-22
[patent_title] => 'Mirror for use in a lithographic apparatus, lithographic apparatus, device manufacturing method, and device manufactured thereby'
[patent_app_type] => utility
[patent_app_number] => 10/968471
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[pdf_file] => patents/07/592/07592610.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/968471 | Mirror for use in a lithographic apparatus, lithographic apparatus, device manufacturing method, and device manufactured thereby | Oct 19, 2004 | Issued |
Array
(
[id] => 5811844
[patent_doc_number] => 20060082742
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-20
[patent_title] => 'Thermally insulated thermophoretic plate'
[patent_app_type] => utility
[patent_app_number] => 10/967123
[patent_app_country] => US
[patent_app_date] => 2004-10-19
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0082/20060082742.pdf
[firstpage_image] =>[orig_patent_app_number] => 10967123
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/967123 | Thermally insulated thermophoretic plate | Oct 18, 2004 | Issued |
Array
(
[id] => 5713154
[patent_doc_number] => 20060076517
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-13
[patent_title] => 'Optical curing apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/960080
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[firstpage_image] =>[orig_patent_app_number] => 10960080
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/960080 | Optical curing apparatus | Oct 7, 2004 | Abandoned |
Array
(
[id] => 4634848
[patent_doc_number] => 08013301
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[patent_title] => 'Measurement system and a method'
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Array
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[id] => 363770
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[patent_title] => 'Method for the automatic analysis of refuse containing polymers and an automatic analytical device for this purpose'
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Array
(
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[patent_title] => 'Method of charged particle beam lithography and equipment for charged particle beam lithography'
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Array
(
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Array
(
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Array
(
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[patent_title] => 'Bellows liner for an ion beam implanter'
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Array
(
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/931809 | Temperature compensated time-of-flight mass spectrometer | Aug 30, 2004 | Issued |