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Charles E. Cooley

Examiner (ID: 18585, Phone: (571)272-1139 , Office: P/1774 )

Most Active Art Unit
1774
Art Unit(s)
1797, 1754, 3405, 2402, 1774, 1723
Total Applications
4068
Issued Applications
3145
Pending Applications
298
Abandoned Applications
660

Applications

Application numberTitle of the applicationFiling DateStatus
90/010022 MULTI-CHIP DEVICE AND METHOD OF FABRICATION EMPLOYING LEADS OVER AND UNDER PROCESSES Dec 5, 2007 Issued
90/008813 ELECTRONIC CIRCUIT Nov 13, 2007 Issued
90/008825 ELECTRONIC CIRCUIT Nov 13, 2007 Issued
90/008914 METHOD OF FABRICATING A SEMICONDUCTOR DEVICE Nov 4, 2007 Issued
90/008912 METHOD OF FABRICATING SEMICONDUCTOR DEVICE FOR PREVENTING RISING-UP OF SILISIDE Nov 4, 2007 Issued
90/010044 TELEPHONE INTERFACE CALL PROCESSING SYSTEM WITH CALL SELECTIVITY Nov 4, 2007 Issued
90/008882 SEMICONDUCTOR DEVICE HAVING EXTERNALLY SETTABLE OPERATION MODE Oct 17, 2007 Pending
95/001006 SUBSTRATE WITHIN A NI/AU STRUCTURE ELECTROPLATED ON ELECTRICAL CONTACT PADS AND METHOD FOR FABRICATING THE SAME Sep 18, 2007 Issued
90/008696 SEMICONDUCTOR CHIP PACKAGE WITH CENTER CONTACTS Jun 10, 2007 Issued
90/008629 WIRE, LOOP, SEMICONDUCTOR DEVICE HAVING SAME, WIRE BONDING METHOD AND WIRE BONDING APPARATUS May 3, 2007 Issued
90/008321 SEMICONDUCTOR MANUFACTURING APPARATUS FOR PHOTOLITHOGRAPHIC PROCESS Feb 14, 2007 Issued
90/008483 FACE-UP SEMICONDUCTOR CHIP ASSEMBLY Feb 8, 2007 Issued
90/008485 SEMICONDUCTOR CHIP PACKAGE WITH CENTER CONTACTS Feb 8, 2007 Issued
95/000194 METHOD OF FABRICATING CMOS INVERTER AND INTEGRATED CIRCUITS UTILIZING STRAINED SILICON SURFACE CHANNEL MOSFETS Jan 11, 2007 Issued
90/008325 TELEPHONE INTERFACE CALL PROCESSING SYSTEM WITH CALL SELECTIVITY Nov 12, 2006 Issued
95/000177 LOW THREADING DISLOCATION DENSITY RELAXED MISMATCHED EPILAYERS WITHOUT HIGH TEMPERATURE GROWTH Nov 8, 2006 Issued
90/008219 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Oct 15, 2006 Issued
95/000180 HETEROINTEGRATION OF MATERIALS USING DEPOSITION AND BONDING Sep 27, 2006 Issued
95/000149 LOW THREADING DISLOCATION DENSITY RELAXED MISMATCHED EPILAYERS WITHOUT HIGH TEMPERATURE GROWTH Aug 20, 2006 Issued
95/000174 BURIED-CHANNEL DEVICES AND SUBSTRATES FOR FABRICATION OF SEMICONDUCTOR-BASED DEVICES Aug 15, 2006 Issued
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