Search

Charles S Bushey

Examiner (ID: 7388, Phone: (571)272-1153 , Office: P/1776 )

Most Active Art Unit
1776
Art Unit(s)
1724, 1797, 3621, 1754, 1776, 1305, 2899
Total Applications
3328
Issued Applications
2498
Pending Applications
237
Abandoned Applications
593

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3127986 [patent_doc_number] => 05381234 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-10 [patent_title] => 'Method and apparatus for real-time film surface detection for large area wafers' [patent_app_type] => 1 [patent_app_number] => 8/173390 [patent_app_country] => US [patent_app_date] => 1993-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5208 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/381/05381234.pdf [firstpage_image] =>[orig_patent_app_number] => 173390 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/173390
Method and apparatus for real-time film surface detection for large area wafers Dec 22, 1993 Issued
Array ( [id] => 3125874 [patent_doc_number] => 05450203 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-09-12 [patent_title] => 'Method and apparatus for determining an objects position, topography and for imaging' [patent_app_type] => 1 [patent_app_number] => 8/172426 [patent_app_country] => US [patent_app_date] => 1993-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8979 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/450/05450203.pdf [firstpage_image] =>[orig_patent_app_number] => 172426 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/172426
Method and apparatus for determining an objects position, topography and for imaging Dec 21, 1993 Issued
08/169396 DISPLACEMENT DETECTION APPARATUS Dec 19, 1993 Abandoned
Array ( [id] => 3469086 [patent_doc_number] => 05392124 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-02-21 [patent_title] => 'Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control' [patent_app_type] => 1 [patent_app_number] => 8/169876 [patent_app_country] => US [patent_app_date] => 1993-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 6407 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 489 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/392/05392124.pdf [firstpage_image] =>[orig_patent_app_number] => 169876 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/169876
Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control Dec 16, 1993 Issued
Array ( [id] => 3483534 [patent_doc_number] => 05432601 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-11 [patent_title] => 'Fine particle analyzing device' [patent_app_type] => 1 [patent_app_number] => 8/167086 [patent_app_country] => US [patent_app_date] => 1993-12-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4726 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 246 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/432/05432601.pdf [firstpage_image] =>[orig_patent_app_number] => 167086 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/167086
Fine particle analyzing device Dec 15, 1993 Issued
Array ( [id] => 3479956 [patent_doc_number] => 05477327 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-19 [patent_title] => 'High resolution low noise optical polarimeter' [patent_app_type] => 1 [patent_app_number] => 8/168119 [patent_app_country] => US [patent_app_date] => 1993-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 2073 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/477/05477327.pdf [firstpage_image] =>[orig_patent_app_number] => 168119 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/168119
High resolution low noise optical polarimeter Dec 14, 1993 Issued
08/165823 DUAL INTERFEROMETER APPARATUS COMPENSATING FOR ENVIRONMENTAL TURBULENCE OR FLUCTUATION Dec 13, 1993 Abandoned
Array ( [id] => 3495158 [patent_doc_number] => 05475485 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-12 [patent_title] => 'Instrument for working the surfaces of parts inside engineered cavities' [patent_app_type] => 1 [patent_app_number] => 8/164917 [patent_app_country] => US [patent_app_date] => 1993-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 2677 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 344 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/475/05475485.pdf [firstpage_image] =>[orig_patent_app_number] => 164917 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/164917
Instrument for working the surfaces of parts inside engineered cavities Dec 9, 1993 Issued
Array ( [id] => 3497781 [patent_doc_number] => 05440383 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-08 [patent_title] => 'Phase detection deflectometer-type optical device having a large measuring range' [patent_app_type] => 1 [patent_app_number] => 8/150127 [patent_app_country] => US [patent_app_date] => 1993-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 1863 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/440/05440383.pdf [firstpage_image] =>[orig_patent_app_number] => 150127 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/150127
Phase detection deflectometer-type optical device having a large measuring range Nov 29, 1993 Issued
08/157327 METHOD OF DETECTING IMPURITIES IN MOLTEN RESIN Nov 25, 1993 Abandoned
Array ( [id] => 3464350 [patent_doc_number] => 05402225 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-03-28 [patent_title] => 'Optical instrument evaluation using modulation transfer function chart' [patent_app_type] => 1 [patent_app_number] => 8/157617 [patent_app_country] => US [patent_app_date] => 1993-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2828 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/402/05402225.pdf [firstpage_image] =>[orig_patent_app_number] => 157617 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/157617
Optical instrument evaluation using modulation transfer function chart Nov 23, 1993 Issued
08/150648 OPTICAL DETECTORS AND SOURCES WITH MERGED HOLOGRAPHIC OPTICAL ELEMENTS SUITABLE FOR OPTOELECTRONIC INTERCONNECTS Nov 8, 1993 Abandoned
Array ( [id] => 3449415 [patent_doc_number] => 05430540 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-04 [patent_title] => 'Luminous flux measuring apparatus using an integrating hemisphere or an integrating quarter sphere' [patent_app_type] => 1 [patent_app_number] => 8/149046 [patent_app_country] => US [patent_app_date] => 1993-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 2468 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/430/05430540.pdf [firstpage_image] =>[orig_patent_app_number] => 149046 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/149046
Luminous flux measuring apparatus using an integrating hemisphere or an integrating quarter sphere Nov 7, 1993 Issued
08/144030 APPARATUS AND METHOD FOR DETECTION OF MATERIAL USED IN CONSTRUCTION OF CONTAINERS AND COLOR OF SAME Oct 31, 1993 Abandoned
Array ( [id] => 3599473 [patent_doc_number] => 05488493 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-30 [patent_title] => 'Holographic CHMSL including a hologram assembly and a refractive element laminarly attached thereto for diverging zero order beam' [patent_app_type] => 1 [patent_app_number] => 8/146244 [patent_app_country] => US [patent_app_date] => 1993-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2884 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/488/05488493.pdf [firstpage_image] =>[orig_patent_app_number] => 146244 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/146244
Holographic CHMSL including a hologram assembly and a refractive element laminarly attached thereto for diverging zero order beam Oct 31, 1993 Issued
Array ( [id] => 3560812 [patent_doc_number] => 05493425 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-02-20 [patent_title] => 'Optical pickup apparatus having a quadrant hologram and a quadrant photo detector' [patent_app_type] => 1 [patent_app_number] => 8/143145 [patent_app_country] => US [patent_app_date] => 1993-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 4245 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 258 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/493/05493425.pdf [firstpage_image] =>[orig_patent_app_number] => 143145 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/143145
Optical pickup apparatus having a quadrant hologram and a quadrant photo detector Oct 28, 1993 Issued
Array ( [id] => 3532599 [patent_doc_number] => 05504573 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-02 [patent_title] => 'Apparatus and method for analyzing particles deposited on a substrate using substantially continuous profile data' [patent_app_type] => 1 [patent_app_number] => 8/135683 [patent_app_country] => US [patent_app_date] => 1993-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 10 [patent_no_of_words] => 6294 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/504/05504573.pdf [firstpage_image] =>[orig_patent_app_number] => 135683 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/135683
Apparatus and method for analyzing particles deposited on a substrate using substantially continuous profile data Oct 12, 1993 Issued
Array ( [id] => 3133036 [patent_doc_number] => 05436725 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-25 [patent_title] => 'Cofocal optical system for thickness measurements of patterned wafers' [patent_app_type] => 1 [patent_app_number] => 8/134729 [patent_app_country] => US [patent_app_date] => 1993-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3270 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/436/05436725.pdf [firstpage_image] =>[orig_patent_app_number] => 134729 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/134729
Cofocal optical system for thickness measurements of patterned wafers Oct 11, 1993 Issued
08/130446 METHOD OF MEASURING PERFORMANCE OF PROJECTION OPTICAL SYSTEM AND A MASK FOR MEASURING THE IMAGING PERFORMANCE Sep 30, 1993 Abandoned
08/130015 FOURIER SPECTROMETER WITH EXCHANGEABLE ENTRANCE AND EXIT PORTS Sep 29, 1993 Abandoned
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