Application number | Title of the application | Filing Date | Status |
---|
Array
(
[id] => 3127986
[patent_doc_number] => 05381234
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-01-10
[patent_title] => 'Method and apparatus for real-time film surface detection for large area wafers'
[patent_app_type] => 1
[patent_app_number] => 8/173390
[patent_app_country] => US
[patent_app_date] => 1993-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 5208
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 74
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/381/05381234.pdf
[firstpage_image] =>[orig_patent_app_number] => 173390
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/173390 | Method and apparatus for real-time film surface detection for large area wafers | Dec 22, 1993 | Issued |
Array
(
[id] => 3125874
[patent_doc_number] => 05450203
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-12
[patent_title] => 'Method and apparatus for determining an objects position, topography and for imaging'
[patent_app_type] => 1
[patent_app_number] => 8/172426
[patent_app_country] => US
[patent_app_date] => 1993-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 8979
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 15
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/450/05450203.pdf
[firstpage_image] =>[orig_patent_app_number] => 172426
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/172426 | Method and apparatus for determining an objects position, topography and for imaging | Dec 21, 1993 | Issued |
08/169396 | DISPLACEMENT DETECTION APPARATUS | Dec 19, 1993 | Abandoned |
Array
(
[id] => 3469086
[patent_doc_number] => 05392124
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-02-21
[patent_title] => 'Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control'
[patent_app_type] => 1
[patent_app_number] => 8/169876
[patent_app_country] => US
[patent_app_date] => 1993-12-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 6407
[patent_no_of_claims] => 40
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 489
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/392/05392124.pdf
[firstpage_image] =>[orig_patent_app_number] => 169876
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/169876 | Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control | Dec 16, 1993 | Issued |
Array
(
[id] => 3483534
[patent_doc_number] => 05432601
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-11
[patent_title] => 'Fine particle analyzing device'
[patent_app_type] => 1
[patent_app_number] => 8/167086
[patent_app_country] => US
[patent_app_date] => 1993-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4726
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 246
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/432/05432601.pdf
[firstpage_image] =>[orig_patent_app_number] => 167086
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/167086 | Fine particle analyzing device | Dec 15, 1993 | Issued |
Array
(
[id] => 3479956
[patent_doc_number] => 05477327
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-19
[patent_title] => 'High resolution low noise optical polarimeter'
[patent_app_type] => 1
[patent_app_number] => 8/168119
[patent_app_country] => US
[patent_app_date] => 1993-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 2073
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 236
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/477/05477327.pdf
[firstpage_image] =>[orig_patent_app_number] => 168119
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/168119 | High resolution low noise optical polarimeter | Dec 14, 1993 | Issued |
08/165823 | DUAL INTERFEROMETER APPARATUS COMPENSATING FOR ENVIRONMENTAL TURBULENCE OR FLUCTUATION | Dec 13, 1993 | Abandoned |
Array
(
[id] => 3495158
[patent_doc_number] => 05475485
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-12
[patent_title] => 'Instrument for working the surfaces of parts inside engineered cavities'
[patent_app_type] => 1
[patent_app_number] => 8/164917
[patent_app_country] => US
[patent_app_date] => 1993-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 2677
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 344
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/475/05475485.pdf
[firstpage_image] =>[orig_patent_app_number] => 164917
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/164917 | Instrument for working the surfaces of parts inside engineered cavities | Dec 9, 1993 | Issued |
Array
(
[id] => 3497781
[patent_doc_number] => 05440383
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-08
[patent_title] => 'Phase detection deflectometer-type optical device having a large measuring range'
[patent_app_type] => 1
[patent_app_number] => 8/150127
[patent_app_country] => US
[patent_app_date] => 1993-11-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 1863
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/440/05440383.pdf
[firstpage_image] =>[orig_patent_app_number] => 150127
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/150127 | Phase detection deflectometer-type optical device having a large measuring range | Nov 29, 1993 | Issued |
08/157327 | METHOD OF DETECTING IMPURITIES IN MOLTEN RESIN | Nov 25, 1993 | Abandoned |
Array
(
[id] => 3464350
[patent_doc_number] => 05402225
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-28
[patent_title] => 'Optical instrument evaluation using modulation transfer function chart'
[patent_app_type] => 1
[patent_app_number] => 8/157617
[patent_app_country] => US
[patent_app_date] => 1993-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2828
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/402/05402225.pdf
[firstpage_image] =>[orig_patent_app_number] => 157617
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/157617 | Optical instrument evaluation using modulation transfer function chart | Nov 23, 1993 | Issued |
08/150648 | OPTICAL DETECTORS AND SOURCES WITH MERGED HOLOGRAPHIC OPTICAL ELEMENTS SUITABLE FOR OPTOELECTRONIC INTERCONNECTS | Nov 8, 1993 | Abandoned |
Array
(
[id] => 3449415
[patent_doc_number] => 05430540
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-04
[patent_title] => 'Luminous flux measuring apparatus using an integrating hemisphere or an integrating quarter sphere'
[patent_app_type] => 1
[patent_app_number] => 8/149046
[patent_app_country] => US
[patent_app_date] => 1993-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 6
[patent_no_of_words] => 2468
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 110
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/430/05430540.pdf
[firstpage_image] =>[orig_patent_app_number] => 149046
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/149046 | Luminous flux measuring apparatus using an integrating hemisphere or an integrating quarter sphere | Nov 7, 1993 | Issued |
08/144030 | APPARATUS AND METHOD FOR DETECTION OF MATERIAL USED IN CONSTRUCTION OF CONTAINERS AND COLOR OF SAME | Oct 31, 1993 | Abandoned |
Array
(
[id] => 3599473
[patent_doc_number] => 05488493
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-30
[patent_title] => 'Holographic CHMSL including a hologram assembly and a refractive element laminarly attached thereto for diverging zero order beam'
[patent_app_type] => 1
[patent_app_number] => 8/146244
[patent_app_country] => US
[patent_app_date] => 1993-11-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2884
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 62
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/488/05488493.pdf
[firstpage_image] =>[orig_patent_app_number] => 146244
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/146244 | Holographic CHMSL including a hologram assembly and a refractive element laminarly attached thereto for diverging zero order beam | Oct 31, 1993 | Issued |
Array
(
[id] => 3560812
[patent_doc_number] => 05493425
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-02-20
[patent_title] => 'Optical pickup apparatus having a quadrant hologram and a quadrant photo detector'
[patent_app_type] => 1
[patent_app_number] => 8/143145
[patent_app_country] => US
[patent_app_date] => 1993-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 16
[patent_no_of_words] => 4245
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 258
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/493/05493425.pdf
[firstpage_image] =>[orig_patent_app_number] => 143145
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/143145 | Optical pickup apparatus having a quadrant hologram and a quadrant photo detector | Oct 28, 1993 | Issued |
Array
(
[id] => 3532599
[patent_doc_number] => 05504573
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-02
[patent_title] => 'Apparatus and method for analyzing particles deposited on a substrate using substantially continuous profile data'
[patent_app_type] => 1
[patent_app_number] => 8/135683
[patent_app_country] => US
[patent_app_date] => 1993-10-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 10
[patent_no_of_words] => 6294
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 138
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/504/05504573.pdf
[firstpage_image] =>[orig_patent_app_number] => 135683
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/135683 | Apparatus and method for analyzing particles deposited on a substrate using substantially continuous profile data | Oct 12, 1993 | Issued |
Array
(
[id] => 3133036
[patent_doc_number] => 05436725
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-25
[patent_title] => 'Cofocal optical system for thickness measurements of patterned wafers'
[patent_app_type] => 1
[patent_app_number] => 8/134729
[patent_app_country] => US
[patent_app_date] => 1993-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3270
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 106
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/436/05436725.pdf
[firstpage_image] =>[orig_patent_app_number] => 134729
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/134729 | Cofocal optical system for thickness measurements of patterned wafers | Oct 11, 1993 | Issued |
08/130446 | METHOD OF MEASURING PERFORMANCE OF PROJECTION OPTICAL SYSTEM AND A MASK FOR MEASURING THE IMAGING PERFORMANCE | Sep 30, 1993 | Abandoned |
08/130015 | FOURIER SPECTROMETER WITH EXCHANGEABLE ENTRANCE AND EXIT PORTS | Sep 29, 1993 | Abandoned |