Charles S Bushey

Array ( [id] => 3521669 [patent_doc_number] => 05513021 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-30 [patent_title] => 'Optical detectors and sources with merged holographic optical elements suitable for optoelectronic interconnects' [patent_app_type] => 1 [patent_app_number] => 8/496997 [patent_app_country] => US [patent_app_date] => 1995-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 5997 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/513/05513021.pdf [firstpage_image] =>[orig_patent_app_number] => 496997 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3739710 [patent_doc_number] => 05694212 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-12-02 [patent_title] => 'Method for calibrating specimen with specimen holder of a microscope' [patent_app_type] => 1 [patent_app_number] => 8/492847 [patent_app_country] => US [patent_app_date] => 1995-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 2070 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 254 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/694/05694212.pdf [firstpage_image] =>[orig_patent_app_number] => 492847 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3665147 [patent_doc_number] => 05659397 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-08-19 [patent_title] => 'Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object' [patent_app_type] => 1 [patent_app_number] => 8/488996 [patent_app_country] => US [patent_app_date] => 1995-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 6652 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/659/05659397.pdf [firstpage_image] =>[orig_patent_app_number] => 488996 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3651230 [patent_doc_number] => 05637873 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-06-10 [patent_title] => 'Directional reflectometer for measuring optical bidirectional reflectance' [patent_app_type] => 1 [patent_app_number] => 8/484576 [patent_app_country] => US [patent_app_date] => 1995-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 4273 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/637/05637873.pdf [firstpage_image] =>[orig_patent_app_number] => 484576 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3628335 [patent_doc_number] => 05615006 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-03-25 [patent_title] => 'Imaging characteristic and asymetric abrerration measurement of projection optical system' [patent_app_type] => 1 [patent_app_number] => 8/469514 [patent_app_country] => US [patent_app_date] => 1995-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 48 [patent_no_of_words] => 14377 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/615/05615006.pdf [firstpage_image] =>[orig_patent_app_number] => 469514 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3514544 [patent_doc_number] => 05570181 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-29 [patent_title] => 'Method of detecting impurities in molten resin utilizing scattering light and the shadows of the impurities' [patent_app_type] => 1 [patent_app_number] => 8/471443 [patent_app_country] => US [patent_app_date] => 1995-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 17 [patent_no_of_words] => 3670 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/570/05570181.pdf [firstpage_image] =>[orig_patent_app_number] => 471443 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3670125 [patent_doc_number] => 05648943 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-07-15 [patent_title] => 'Disk recording/reproduction device of reduced thickness with driving mechanism for moving heads parallel to the disk face' [patent_app_type] => 1 [patent_app_number] => 8/455397 [patent_app_country] => US [patent_app_date] => 1995-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 44 [patent_no_of_words] => 14615 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 396 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/648/05648943.pdf [firstpage_image] =>[orig_patent_app_number] => 455397 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3632821 [patent_doc_number] => 05608520 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-03-04 [patent_title] => 'Plasma emission spectroscopy method of tumor therapy' [patent_app_type] => 1 [patent_app_number] => 8/455269 [patent_app_country] => US [patent_app_date] => 1995-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4169 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/608/05608520.pdf [firstpage_image] =>[orig_patent_app_number] => 455269 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3615812 [patent_doc_number] => 05589935 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-31 [patent_title] => 'Turbidity sensor with the capability of regulating the intensity of a light source' [patent_app_type] => 1 [patent_app_number] => 8/452607 [patent_app_country] => US [patent_app_date] => 1995-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5371 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 271 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/589/05589935.pdf [firstpage_image] =>[orig_patent_app_number] => 452607 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3689693 [patent_doc_number] => 05633715 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-27 [patent_title] => 'Centroid approach for estimating modulation peak in broad-bandwidth interferometry' [patent_app_type] => 1 [patent_app_number] => 8/446019 [patent_app_country] => US [patent_app_date] => 1995-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5020 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 248 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/633/05633715.pdf [firstpage_image] =>[orig_patent_app_number] => 446019 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3868047 [patent_doc_number] => 05706259 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-01-06 [patent_title] => 'Magneto-optical recording medium for magnetically induced super resolution' [patent_app_type] => 1 [patent_app_number] => 8/443701 [patent_app_country] => US [patent_app_date] => 1995-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 28 [patent_no_of_words] => 8438 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/706/05706259.pdf [firstpage_image] =>[orig_patent_app_number] => 443701 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3655611 [patent_doc_number] => 05638166 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-06-10 [patent_title] => 'Apparatus and method for rapid detection of explosives residue from the deflagration signature thereof' [patent_app_type] => 1 [patent_app_number] => 8/444976 [patent_app_country] => US [patent_app_date] => 1995-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2962 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/638/05638166.pdf [firstpage_image] =>[orig_patent_app_number] => 444976 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3732133 [patent_doc_number] => 05701181 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-12-23 [patent_title] => 'Fiber optic diffuse light reflectance sensor utilized in the detection of occult blood' [patent_app_type] => 1 [patent_app_number] => 8/440105 [patent_app_country] => US [patent_app_date] => 1995-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 4050 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 270 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/701/05701181.pdf [firstpage_image] =>[orig_patent_app_number] => 440105 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3667313 [patent_doc_number] => 05592295 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-01-07 [patent_title] => 'Apparatus and method for semiconductor wafer edge inspection' [patent_app_type] => 1 [patent_app_number] => 8/436840 [patent_app_country] => US [patent_app_date] => 1995-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 2436 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/592/05592295.pdf [firstpage_image] =>[orig_patent_app_number] => 436840 [rel_patent_id] =>[rel_patent_doc_number] =>)