Search

Chau N Nguyen

Examiner (ID: 17964, Phone: (571)272-1980 , Office: P/2847 )

Most Active Art Unit
2831
Art Unit(s)
2831, 2835, 2841, 3621, 2109, 2950, 2847
Total Applications
2818
Issued Applications
1931
Pending Applications
187
Abandoned Applications
700

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18356357 [patent_doc_number] => 11644755 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-09 [patent_title] => Lithographic method [patent_app_type] => utility [patent_app_number] => 17/279648 [patent_app_country] => US [patent_app_date] => 2019-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 11826 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17279648 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/279648
Lithographic method Sep 10, 2019 Issued
Array ( [id] => 15713959 [patent_doc_number] => 20200103746 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-04-02 [patent_title] => APPARATUS AND METHOD FOR MONITORING REFLECTIVITY OF THE COLLECTOR FOR EXTREME ULTRAVIOLET RADIATION SOURCE [patent_app_type] => utility [patent_app_number] => 16/568044 [patent_app_country] => US [patent_app_date] => 2019-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7209 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16568044 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/568044
Apparatus and method for monitoring reflectivity of the collector for extreme ultraviolet radiation source Sep 10, 2019 Issued
Array ( [id] => 17208608 [patent_doc_number] => 11168972 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-11-09 [patent_title] => Detection device [patent_app_type] => utility [patent_app_number] => 16/564846 [patent_app_country] => US [patent_app_date] => 2019-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1569 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 404 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16564846 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/564846
Detection device Sep 8, 2019 Issued
Array ( [id] => 16500711 [patent_doc_number] => 10866091 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-12-15 [patent_title] => Concentricity detection system [patent_app_type] => utility [patent_app_number] => 16/554823 [patent_app_country] => US [patent_app_date] => 2019-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1158 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16554823 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/554823
Concentricity detection system Aug 28, 2019 Issued
Array ( [id] => 17230314 [patent_doc_number] => 20210356871 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-11-18 [patent_title] => RADIATION SYSTEM [patent_app_type] => utility [patent_app_number] => 17/277554 [patent_app_country] => US [patent_app_date] => 2019-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12768 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17277554 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/277554
Radiation system Aug 27, 2019 Issued
Array ( [id] => 15257069 [patent_doc_number] => 20190377268 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-12 [patent_title] => METHOD FOR CORRECTING A REFLECTIVE OPTICAL ELEMENT FOR THE WAVELENGTH RANGE BETWEEN 5 NM AND 20 NM [patent_app_type] => utility [patent_app_number] => 16/550415 [patent_app_country] => US [patent_app_date] => 2019-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4449 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16550415 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/550415
Method for correcting a reflective optical element for the wavelength range between 5 nm and 20 nm Aug 25, 2019 Issued
Array ( [id] => 15257063 [patent_doc_number] => 20190377265 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-12 [patent_title] => IMPRINT LITHOGRAPHY [patent_app_type] => utility [patent_app_number] => 16/550451 [patent_app_country] => US [patent_app_date] => 2019-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 36591 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16550451 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/550451
Imprint lithography Aug 25, 2019 Issued
Array ( [id] => 15257061 [patent_doc_number] => 20190377264 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-12 [patent_title] => METROLOGY ROBUSTNESS BASED ON THROUGH-WAVELENGTH SIMILARITY [patent_app_type] => utility [patent_app_number] => 16/549661 [patent_app_country] => US [patent_app_date] => 2019-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15614 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16549661 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/549661
Metrology robustness based on through-wavelength similarity Aug 22, 2019 Issued
Array ( [id] => 17886429 [patent_doc_number] => 20220301907 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-22 [patent_title] => METHOD AND DEVICE FOR THE ALIGNMENT OF SUBSTRATES [patent_app_type] => utility [patent_app_number] => 17/631261 [patent_app_country] => US [patent_app_date] => 2019-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13071 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -24 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17631261 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/631261
METHOD AND DEVICE FOR THE ALIGNMENT OF SUBSTRATES Aug 22, 2019 Pending
Array ( [id] => 16030665 [patent_doc_number] => 10677743 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2020-06-09 [patent_title] => Inspection apparatus and inspection method [patent_app_type] => utility [patent_app_number] => 16/546526 [patent_app_country] => US [patent_app_date] => 2019-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 27 [patent_no_of_words] => 6086 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16546526 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/546526
Inspection apparatus and inspection method Aug 20, 2019 Issued
Array ( [id] => 17589137 [patent_doc_number] => 11327404 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-10 [patent_title] => Lithographic apparatus and device manufacturing method [patent_app_type] => utility [patent_app_number] => 16/544283 [patent_app_country] => US [patent_app_date] => 2019-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 15 [patent_no_of_words] => 8158 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16544283 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/544283
Lithographic apparatus and device manufacturing method Aug 18, 2019 Issued
Array ( [id] => 17743980 [patent_doc_number] => 11392043 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-07-19 [patent_title] => Method and metrology apparatus for determining estimated scattered radiation intensity [patent_app_type] => utility [patent_app_number] => 16/539208 [patent_app_country] => US [patent_app_date] => 2019-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 6889 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16539208 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/539208
Method and metrology apparatus for determining estimated scattered radiation intensity Aug 12, 2019 Issued
Array ( [id] => 17906930 [patent_doc_number] => 11460782 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-10-04 [patent_title] => Matching pupil determination [patent_app_type] => utility [patent_app_number] => 17/265632 [patent_app_country] => US [patent_app_date] => 2019-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 19647 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17265632 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/265632
Matching pupil determination Aug 11, 2019 Issued
Array ( [id] => 15458177 [patent_doc_number] => 20200041913 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-02-06 [patent_title] => SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUM [patent_app_type] => utility [patent_app_number] => 16/521052 [patent_app_country] => US [patent_app_date] => 2019-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8173 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16521052 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/521052
Substrate processing apparatus, substrate processing method, and storage medium Jul 23, 2019 Issued
Array ( [id] => 16493886 [patent_doc_number] => 10859922 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2020-12-08 [patent_title] => Lithography system and method [patent_app_type] => utility [patent_app_number] => 16/515245 [patent_app_country] => US [patent_app_date] => 2019-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 8874 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 272 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16515245 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/515245
Lithography system and method Jul 17, 2019 Issued
Array ( [id] => 16291135 [patent_doc_number] => 10767976 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-09-08 [patent_title] => Optical displacement meter [patent_app_type] => utility [patent_app_number] => 16/512462 [patent_app_country] => US [patent_app_date] => 2019-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 25 [patent_no_of_words] => 10011 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 277 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16512462 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/512462
Optical displacement meter Jul 15, 2019 Issued
Array ( [id] => 15026739 [patent_doc_number] => 20190324374 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-10-24 [patent_title] => LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD [patent_app_type] => utility [patent_app_number] => 16/460159 [patent_app_country] => US [patent_app_date] => 2019-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10497 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16460159 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/460159
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD Jul 1, 2019 Abandoned
Array ( [id] => 15515945 [patent_doc_number] => 10564555 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-02-18 [patent_title] => Method of reducing effects of reticle heating and/or cooling in a lithographic process [patent_app_type] => utility [patent_app_number] => 16/458601 [patent_app_country] => US [patent_app_date] => 2019-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 9550 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16458601 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/458601
Method of reducing effects of reticle heating and/or cooling in a lithographic process Jun 30, 2019 Issued
Array ( [id] => 15411719 [patent_doc_number] => 20200026182 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-01-23 [patent_title] => Metrology Apparatus and Method for Determining a Characteristic Relating to One or More Structures on a Substrate [patent_app_type] => utility [patent_app_number] => 16/456878 [patent_app_country] => US [patent_app_date] => 2019-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8948 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16456878 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/456878
Metrology apparatus and method for determining a characteristic relating to one or more structures on a substrate Jun 27, 2019 Issued
Array ( [id] => 17053984 [patent_doc_number] => 20210263418 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-08-26 [patent_title] => TOOL FOR MODIFYING A SUPPORT SURFACE [patent_app_type] => utility [patent_app_number] => 17/260649 [patent_app_country] => US [patent_app_date] => 2019-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11382 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17260649 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/260649
TOOL FOR MODIFYING A SUPPORT SURFACE Jun 26, 2019 Pending
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