
Christine Trinh Le Tu
Examiner (ID: 15624, Phone: (571)272-3831 , Office: P/2117 )
| Most Active Art Unit | 2117 |
| Art Unit(s) | 2313, 2117, 2133, 2785, 2138, 2111, 2413, 2784 |
| Total Applications | 1748 |
| Issued Applications | 1571 |
| Pending Applications | 27 |
| Abandoned Applications | 152 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 258195
[patent_doc_number] => 07577883
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-08-18
[patent_title] => 'Data transmission speed test system and method'
[patent_app_type] => utility
[patent_app_number] => 11/778073
[patent_app_country] => US
[patent_app_date] => 2007-07-16
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[pdf_file] => patents/07/577/07577883.pdf
[firstpage_image] =>[orig_patent_app_number] => 11778073
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/778073 | Data transmission speed test system and method | Jul 15, 2007 | Issued |
Array
(
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[patent_doc_number] => 20090016130
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[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'MEMORY DEVICE AND METHOD OF TESTING A MEMORY DEVICE'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/777189 | MEMORY DEVICE AND METHOD OF TESTING A MEMORY DEVICE | Jul 11, 2007 | Abandoned |
Array
(
[id] => 4731748
[patent_doc_number] => 20080048726
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-28
[patent_title] => 'Signal Integrity Measurement Systems and Methods Using a Predominantly Digital Time-Base Generator'
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[patent_app_number] => 11/776825
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[pdf_file] => publications/A1/0048/20080048726.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/776825 | Signal integrity measurement systems and methods using a predominantly digital time-base generator | Jul 11, 2007 | Issued |
Array
(
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[patent_doc_number] => 08201032
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[patent_issue_date] => 2012-06-12
[patent_title] => 'Generalized BIST for multiport memories'
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[patent_app_date] => 2007-07-11
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[pdf_file] => patents/08/201/08201032.pdf
[firstpage_image] =>[orig_patent_app_number] => 11775956
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/775956 | Generalized BIST for multiport memories | Jul 10, 2007 | Issued |
Array
(
[id] => 5248961
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[patent_kind] => A1
[patent_issue_date] => 2007-10-18
[patent_title] => 'METHOD, SYSTEM AND PROGRAM PRODUCT FOR BOUNDARY I/O TESTING EMPLOYING A LOGIC BUILT-IN SELF-TEST OF AN INTEGRATED CIRCUIT'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/764502 | Method, system and program product for boundary I/O testing employing a logic built-in self-test of an integrated circuit | Jun 17, 2007 | Issued |
Array
(
[id] => 5127754
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[patent_title] => 'METHOD, SYSTEM, AND PROGRAM PRODUCT FOR CONTROLLING TEST DATA OF A LOGIC BUILT-IN SELF-TEST OF AN INTEGRATED CIRCUIT'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/762889 | Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit | Jun 13, 2007 | Issued |
Array
(
[id] => 5064792
[patent_doc_number] => 20070226434
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[patent_issue_date] => 2007-09-27
[patent_title] => 'DATA RECOVERY IN A MEMORY SYSTEM USING TRACKING CELLS'
[patent_app_type] => utility
[patent_app_number] => 11/752024
[patent_app_country] => US
[patent_app_date] => 2007-05-22
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[patent_drawing_sheets_cnt] => 11
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[firstpage_image] =>[orig_patent_app_number] => 11752024
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/752024 | Data recovery in a memory system using tracking cells | May 21, 2007 | Issued |
Array
(
[id] => 832692
[patent_doc_number] => 07401280
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-07-15
[patent_title] => 'Self-verification of configuration memory in programmable logic devices'
[patent_app_type] => utility
[patent_app_number] => 11/750790
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11750790
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/750790 | Self-verification of configuration memory in programmable logic devices | May 17, 2007 | Issued |
Array
(
[id] => 5167222
[patent_doc_number] => 20070288811
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[patent_issue_date] => 2007-12-13
[patent_title] => 'SYSTEM AND METHOD FOR TESTING A DATA STORAGE DEVICE WITHOUT REVEALING MEMORY CONTENT'
[patent_app_type] => utility
[patent_app_number] => 11/741992
[patent_app_country] => US
[patent_app_date] => 2007-04-30
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/741992 | System and method for testing a data storage device without revealing memory content | Apr 29, 2007 | Issued |
Array
(
[id] => 5212161
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[patent_title] => 'METHOD AND SYSTEM FOR TESTING A MEMORY DEVICE'
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[patent_app_number] => 11/735176
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Array
(
[id] => 245166
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[patent_title] => 'Tap and linking module for scan access of multiple cores with IEEE 1149.1 test access ports'
[patent_app_type] => utility
[patent_app_number] => 11/691600
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/691600 | Tap and linking module for scan access of multiple cores with IEEE 1149.1 test access ports | Mar 26, 2007 | Issued |
Array
(
[id] => 4741896
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[patent_issue_date] => 2008-09-25
[patent_title] => 'TEST APPARATUS AND ELECTRONIC DEVICE'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/689489 | Test apparatus and electronic device for generating test signal by using repeated interval in a test instruction stream | Mar 20, 2007 | Issued |
Array
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[id] => 4741845
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/689503 | Test apparatus for updating a value of the bit position in result register by executing a result register update instruction with predetermined value to generate test pattern | Mar 20, 2007 | Issued |
Array
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Array
(
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Array
(
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[patent_title] => 'Test and diagnosis of semiconductors'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/708824 | Test and diagnosis of semiconductors | Feb 19, 2007 | Issued |
Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/673630 | Method, apparatus and program product to concurrently detect, repair, verify and isolate memory failures | Feb 11, 2007 | Issued |