
Christine Trinh Le Tu
Examiner (ID: 15624, Phone: (571)272-3831 , Office: P/2117 )
| Most Active Art Unit | 2117 |
| Art Unit(s) | 2313, 2117, 2133, 2785, 2138, 2111, 2413, 2784 |
| Total Applications | 1748 |
| Issued Applications | 1571 |
| Pending Applications | 27 |
| Abandoned Applications | 152 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7689877
[patent_doc_number] => 20070234156
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[patent_kind] => A1
[patent_issue_date] => 2007-10-04
[patent_title] => 'ELECTRONIC CIRCUIT COMPRISING A TEST MODE SECURED BY THE BREAKING OF A TEST CHAIN, AND ASSOCIATED ELECTRONIC CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 11/673911
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[pdf_file] => publications/A1/0234/20070234156.pdf
[firstpage_image] =>[orig_patent_app_number] => 11673911
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/673911 | Electronic circuit comprising a test mode secured by the breaking of a test chain, and associated electronic circuit | Feb 11, 2007 | Issued |
Array
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[id] => 5178685
[patent_doc_number] => 20070179745
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[patent_title] => 'Failure Analysis and Testing of Semi-conductor Devices using Intelligent Software on Automated Test Equipment (ATE)'
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Array
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[patent_issue_date] => 2010-12-14
[patent_title] => 'Method and system for testing chips'
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Array
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[patent_issue_date] => 2007-09-20
[patent_title] => 'METHOD FOR PERFORMING A DEFECTIVE-AREA MANAGEMENT IN AN OPTICAL MEDIA'
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[patent_app_number] => 11/612075
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Array
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[patent_title] => 'METHOD AND APPARATUS FOR TESTING A FULLY BUFFERED MEMORY MODULE'
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Array
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[patent_title] => 'Clock jitter detector'
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/608460 | Quantized data-dependent jitter injection using discrete samples | Dec 7, 2006 | Issued |
Array
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[patent_title] => 'Semiconductor device and data storage apparatus'
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Array
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[id] => 5221485
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[patent_title] => 'Test device and method for testing electronic devices'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/603633 | Test device and method for testing electronic devices | Nov 21, 2006 | Abandoned |
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[patent_title] => 'Film-type semiconductor package and method using test pads shared by output channels, and test device, semiconductor device and method using patterns shared by test channels'
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Array
(
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Array
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