
Christine Trinh Le Tu
Examiner (ID: 15624, Phone: (571)272-3831 , Office: P/2117 )
| Most Active Art Unit | 2117 |
| Art Unit(s) | 2313, 2117, 2133, 2785, 2138, 2111, 2413, 2784 |
| Total Applications | 1748 |
| Issued Applications | 1571 |
| Pending Applications | 27 |
| Abandoned Applications | 152 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5137572
[patent_doc_number] => 20070079201
[patent_country] => US
[patent_kind] => A1
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[patent_title] => 'Power-saving apparatus according to the operating mode of an embedded memory'
[patent_app_type] => utility
[patent_app_number] => 11/507581
[patent_app_country] => US
[patent_app_date] => 2006-08-22
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[pdf_file] => publications/A1/0079/20070079201.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/507581 | Power-saving apparatus according to the operating mode of an embedded memory | Aug 21, 2006 | Abandoned |
Array
(
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[patent_doc_number] => 20080065941
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[patent_issue_date] => 2008-03-13
[patent_title] => 'Meta-data driven test-data generation with controllable combinatorial coverage'
[patent_app_type] => utility
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[patent_app_date] => 2006-08-21
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Array
(
[id] => 276099
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[patent_issue_date] => 2009-07-14
[patent_title] => 'User data driven test control software application the requires no software maintenance'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/465080 | User data driven test control software application the requires no software maintenance | Aug 15, 2006 | Issued |
Array
(
[id] => 4735594
[patent_doc_number] => 20080052576
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[patent_issue_date] => 2008-02-28
[patent_title] => 'Processor Fault Isolation'
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[patent_app_number] => 11/464393
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[patent_app_date] => 2006-08-14
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/464393 | Processor fault isolation | Aug 13, 2006 | Issued |
Array
(
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[patent_doc_number] => 07543201
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[patent_title] => 'Semiconductor devices including test circuits and related methods of testing'
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Array
(
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[patent_title] => 'System and Method for Advanced Logic Built-in Self Test with Selection of Scan Channels'
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Array
(
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[patent_title] => 'Unit test extender'
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Array
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[patent_issue_date] => 2009-08-04
[patent_title] => 'Selectable JTAG or trace access with data store and output'
[patent_app_type] => utility
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[pdf_file] => patents/07/571/07571364.pdf
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Array
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[id] => 5058726
[patent_doc_number] => 20070061648
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[patent_issue_date] => 2007-03-15
[patent_title] => 'SHIFT REGISTER, SCANNING LINE DRIVING CIRCUIT, MATRIX TYPE DEVICE, ELECTRO-OPTIC DEVICE, AND ELECTRONIC DEVICE'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/463115 | Shift register, scanning line driving circuit, matrix type device, electro-optic device, and electronic device | Aug 7, 2006 | Issued |
Array
(
[id] => 829310
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[patent_title] => 'Automated test and characterization data analysis methods and arrangement'
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Array
(
[id] => 317047
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[patent_title] => 'Integrated circuit internal test circuit and method of testing therewith'
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Array
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Array
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[id] => 302191
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Array
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Array
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Array
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Array
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Array
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