
Christine Trinh Le Tu
Examiner (ID: 15624, Phone: (571)272-3831 , Office: P/2117 )
| Most Active Art Unit | 2117 |
| Art Unit(s) | 2313, 2117, 2133, 2785, 2138, 2111, 2413, 2784 |
| Total Applications | 1748 |
| Issued Applications | 1571 |
| Pending Applications | 27 |
| Abandoned Applications | 152 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 451325
[patent_doc_number] => 07254758
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[patent_title] => 'Method and apparatus for testing circuit units to be tested with different test mode data sets'
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Array
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[patent_title] => 'System and method to control data capture'
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Array
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Array
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[patent_title] => 'Semiconductor device for detecting memory failure and method thereof'
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Array
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Array
(
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[patent_title] => 'Jtag Test Architecture For Multi-Chip Pack'
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Array
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[patent_title] => 'Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE)'
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Array
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[patent_title] => 'Apparatus for testing USB memory and method thereof'
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Array
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[id] => 374995
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[patent_title] => 'HyperJTAG system including debug probe, on-chip instrumentation, and protocol'
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[patent_app_number] => 11/026324
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Array
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[patent_title] => 'Apparatus and method for testing motherboard having PCI express devices'
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Array
(
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Array
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Array
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Array
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Array
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