
Christine Trinh Le Tu
Examiner (ID: 15624, Phone: (571)272-3831 , Office: P/2117 )
| Most Active Art Unit | 2117 |
| Art Unit(s) | 2313, 2117, 2133, 2785, 2138, 2111, 2413, 2784 |
| Total Applications | 1748 |
| Issued Applications | 1571 |
| Pending Applications | 27 |
| Abandoned Applications | 152 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5809466
[patent_doc_number] => 20060095822
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[patent_title] => 'Generation of test vectors for testing electronic circuits taking into account of defect probability'
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Array
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[patent_issue_date] => 2008-05-20
[patent_title] => 'Testing embedded memory in integrated circuits such as programmable logic devices'
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Array
(
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[patent_title] => 'System debugging device and system debugging method'
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[patent_title] => 'Scan test method, integrated circuit, and scan test circuit'
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Array
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Array
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[patent_title] => 'Signature field in a latency measurement frame'
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Array
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[patent_title] => 'Apparatus and method for self testing programmable logic arrays'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/947811 | Apparatus and method for self testing programmable logic arrays | Sep 21, 2004 | Abandoned |
Array
(
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Array
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Array
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Array
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Array
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