Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4139360 [patent_doc_number] => 06030732 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-29 [patent_title] => 'In-situ etch process control monitor' [patent_app_type] => 1 [patent_app_number] => 9/226276 [patent_app_country] => US [patent_app_date] => 1999-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 1991 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/030/06030732.pdf [firstpage_image] =>[orig_patent_app_number] => 226276 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/226276
In-situ etch process control monitor Jan 6, 1999 Issued
Array ( [id] => 4092186 [patent_doc_number] => 06096461 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-01 [patent_title] => 'Laser exposure utilizing secondary mask capable of concentrating exposure light onto primary mask' [patent_app_type] => 1 [patent_app_number] => 9/228078 [patent_app_country] => US [patent_app_date] => 1999-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 5974 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 229 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/096/06096461.pdf [firstpage_image] =>[orig_patent_app_number] => 228078 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/228078
Laser exposure utilizing secondary mask capable of concentrating exposure light onto primary mask Jan 5, 1999 Issued
Array ( [id] => 4184091 [patent_doc_number] => 06093508 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-25 [patent_title] => 'Dual damascene structure formed in a single photoresist film' [patent_app_type] => 1 [patent_app_number] => 9/226765 [patent_app_country] => US [patent_app_date] => 1999-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 3581 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/093/06093508.pdf [firstpage_image] =>[orig_patent_app_number] => 226765 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/226765
Dual damascene structure formed in a single photoresist film Jan 5, 1999 Issued
Array ( [id] => 4152017 [patent_doc_number] => 06103434 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-15 [patent_title] => 'Electron beam direct drawing method, system and recording medium' [patent_app_type] => 1 [patent_app_number] => 9/222526 [patent_app_country] => US [patent_app_date] => 1998-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 34 [patent_no_of_words] => 4289 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/103/06103434.pdf [firstpage_image] =>[orig_patent_app_number] => 222526 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/222526
Electron beam direct drawing method, system and recording medium Dec 27, 1998 Issued
Array ( [id] => 4009545 [patent_doc_number] => 05986765 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-16 [patent_title] => 'Apparatus including compensation mask to correct particle beam proximity-effect' [patent_app_type] => 1 [patent_app_number] => 9/218003 [patent_app_country] => US [patent_app_date] => 1998-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 5276 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/986/05986765.pdf [firstpage_image] =>[orig_patent_app_number] => 218003 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/218003
Apparatus including compensation mask to correct particle beam proximity-effect Dec 21, 1998 Issued
Array ( [id] => 4166431 [patent_doc_number] => 06140024 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-31 [patent_title] => 'Remote plasma nitridation for contact etch stop' [patent_app_type] => 1 [patent_app_number] => 9/216145 [patent_app_country] => US [patent_app_date] => 1998-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 16 [patent_no_of_words] => 3687 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/140/06140024.pdf [firstpage_image] =>[orig_patent_app_number] => 216145 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/216145
Remote plasma nitridation for contact etch stop Dec 17, 1998 Issued
Array ( [id] => 4026583 [patent_doc_number] => 05994007 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-30 [patent_title] => 'Pattern forming method utilizing first insulative and then conductive overlayer and underlayer' [patent_app_type] => 1 [patent_app_number] => 9/213373 [patent_app_country] => US [patent_app_date] => 1998-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 39 [patent_no_of_words] => 25066 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/994/05994007.pdf [firstpage_image] =>[orig_patent_app_number] => 213373 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/213373
Pattern forming method utilizing first insulative and then conductive overlayer and underlayer Dec 16, 1998 Issued
Array ( [id] => 4096157 [patent_doc_number] => 06048662 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-04-11 [patent_title] => 'Antireflective coatings comprising poly(oxyalkylene) colorants' [patent_app_type] => 1 [patent_app_number] => 9/211355 [patent_app_country] => US [patent_app_date] => 1998-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4300 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/048/06048662.pdf [firstpage_image] =>[orig_patent_app_number] => 211355 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/211355
Antireflective coatings comprising poly(oxyalkylene) colorants Dec 14, 1998 Issued
Array ( [id] => 4204432 [patent_doc_number] => 06027841 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-22 [patent_title] => 'Charged-particle-beam projection-exposure method exhibiting aberration reduction through multiple deflector use' [patent_app_type] => 1 [patent_app_number] => 9/209643 [patent_app_country] => US [patent_app_date] => 1998-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 6664 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/027/06027841.pdf [firstpage_image] =>[orig_patent_app_number] => 209643 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/209643
Charged-particle-beam projection-exposure method exhibiting aberration reduction through multiple deflector use Dec 9, 1998 Issued
Array ( [id] => 4287643 [patent_doc_number] => 06235456 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-22 [patent_title] => 'Graded anti-reflective barrier films for ultra-fine lithography' [patent_app_type] => 1 [patent_app_number] => 9/208350 [patent_app_country] => US [patent_app_date] => 1998-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 14 [patent_no_of_words] => 8652 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/235/06235456.pdf [firstpage_image] =>[orig_patent_app_number] => 208350 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/208350
Graded anti-reflective barrier films for ultra-fine lithography Dec 8, 1998 Issued
Array ( [id] => 4105381 [patent_doc_number] => 06057068 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-02 [patent_title] => 'Method for determining the efficiency of a planarization process' [patent_app_type] => 1 [patent_app_number] => 9/205483 [patent_app_country] => US [patent_app_date] => 1998-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 4280 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/057/06057068.pdf [firstpage_image] =>[orig_patent_app_number] => 205483 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/205483
Method for determining the efficiency of a planarization process Dec 3, 1998 Issued
Array ( [id] => 4128744 [patent_doc_number] => 06146797 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-14 [patent_title] => 'Focused ion beam lithography method with sample inspection through oblique angle tilt' [patent_app_type] => 1 [patent_app_number] => 9/204894 [patent_app_country] => US [patent_app_date] => 1998-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2143 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/146/06146797.pdf [firstpage_image] =>[orig_patent_app_number] => 204894 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/204894
Focused ion beam lithography method with sample inspection through oblique angle tilt Dec 2, 1998 Issued
Array ( [id] => 4084012 [patent_doc_number] => 06132910 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-17 [patent_title] => 'Method of implementing electron beam lithography using uniquely positioned alignment marks and a wafer with such alignment marks' [patent_app_type] => 1 [patent_app_number] => 9/204940 [patent_app_country] => US [patent_app_date] => 1998-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 3644 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/132/06132910.pdf [firstpage_image] =>[orig_patent_app_number] => 204940 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/204940
Method of implementing electron beam lithography using uniquely positioned alignment marks and a wafer with such alignment marks Dec 2, 1998 Issued
Array ( [id] => 4082237 [patent_doc_number] => 06162581 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-19 [patent_title] => 'Charged particle beam pattern-transfer method utilizing non-uniform dose distribution in stitching region' [patent_app_type] => 1 [patent_app_number] => 9/204620 [patent_app_country] => US [patent_app_date] => 1998-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 6191 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/162/06162581.pdf [firstpage_image] =>[orig_patent_app_number] => 204620 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/204620
Charged particle beam pattern-transfer method utilizing non-uniform dose distribution in stitching region Nov 30, 1998 Issued
Array ( [id] => 4230678 [patent_doc_number] => 06117598 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-12 [patent_title] => 'Scanning exposure method with alignment during synchronous movement' [patent_app_type] => 1 [patent_app_number] => 9/196157 [patent_app_country] => US [patent_app_date] => 1998-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 17 [patent_no_of_words] => 20267 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/117/06117598.pdf [firstpage_image] =>[orig_patent_app_number] => 196157 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/196157
Scanning exposure method with alignment during synchronous movement Nov 19, 1998 Issued
Array ( [id] => 4044908 [patent_doc_number] => 05968687 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-19 [patent_title] => 'Mask for recovering alignment marks after chemical mechanical polishing' [patent_app_type] => 1 [patent_app_number] => 9/196601 [patent_app_country] => US [patent_app_date] => 1998-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 28 [patent_no_of_words] => 3232 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/968/05968687.pdf [firstpage_image] =>[orig_patent_app_number] => 196601 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/196601
Mask for recovering alignment marks after chemical mechanical polishing Nov 19, 1998 Issued
Array ( [id] => 4204405 [patent_doc_number] => 06027839 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-22 [patent_title] => 'Method for transferring pattern images through mix-and-match exposure at improved overlay accuracy' [patent_app_type] => 1 [patent_app_number] => 9/192940 [patent_app_country] => US [patent_app_date] => 1998-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 14 [patent_no_of_words] => 3748 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 259 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/027/06027839.pdf [firstpage_image] =>[orig_patent_app_number] => 192940 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/192940
Method for transferring pattern images through mix-and-match exposure at improved overlay accuracy Nov 15, 1998 Issued
Array ( [id] => 4069499 [patent_doc_number] => 06068964 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-30 [patent_title] => 'Method for patterning an insulator film and installing a grounding pin through electron beam irradiation' [patent_app_type] => 1 [patent_app_number] => 9/191582 [patent_app_country] => US [patent_app_date] => 1998-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 1710 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/068/06068964.pdf [firstpage_image] =>[orig_patent_app_number] => 191582 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/191582
Method for patterning an insulator film and installing a grounding pin through electron beam irradiation Nov 12, 1998 Issued
Array ( [id] => 4135023 [patent_doc_number] => 06015644 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-01-18 [patent_title] => 'Process for device fabrication using a variable transmission aperture' [patent_app_type] => 1 [patent_app_number] => 9/190351 [patent_app_country] => US [patent_app_date] => 1998-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 4848 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/015/06015644.pdf [firstpage_image] =>[orig_patent_app_number] => 190351 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/190351
Process for device fabrication using a variable transmission aperture Nov 11, 1998 Issued
Array ( [id] => 4184149 [patent_doc_number] => 06093512 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-25 [patent_title] => 'Method and apparatus for dimension measurement and inspection of structures utilizing corpuscular beam' [patent_app_type] => 1 [patent_app_number] => 9/189832 [patent_app_country] => US [patent_app_date] => 1998-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 2552 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/093/06093512.pdf [firstpage_image] =>[orig_patent_app_number] => 189832 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/189832
Method and apparatus for dimension measurement and inspection of structures utilizing corpuscular beam Nov 9, 1998 Issued
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