
Christopher G. Young
Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )
| Most Active Art Unit | 1756 |
| Art Unit(s) | 1721, 1737, 1752, 1113, 1506, 1756, 1795 |
| Total Applications | 2931 |
| Issued Applications | 2607 |
| Pending Applications | 32 |
| Abandoned Applications | 298 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4143729
[patent_doc_number] => 06063548
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-16
[patent_title] => 'Method for making DRAM using a single photoresist masking step for making capacitors with node contacts'
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[patent_app_number] => 9/148565
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Array
(
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[patent_issue_date] => 2000-12-12
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Array
(
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[patent_title] => 'Exposure and alignment method'
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Array
(
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[patent_kind] => NA
[patent_issue_date] => 2000-07-18
[patent_title] => 'Lithographic printing plates comprising a photothermal conversion material'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/145163 | Lithographic printing plates comprising a photothermal conversion material | Sep 1, 1998 | Issued |
Array
(
[id] => 4069352
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[patent_title] => 'Semiconductor wafer alignment methods'
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Array
(
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[patent_title] => 'Methods of forming semiconductor devices and methods of forming field emission displays'
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Array
(
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Array
(
[id] => 4128702
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[patent_title] => 'Electron beam antistatic method using conductive pins for charge disipation'
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Array
(
[id] => 4243112
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[patent_title] => 'Mask pattern correction method and exposure mask to be used for such a method'
[patent_app_type] => 1
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Array
(
[id] => 4104611
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[patent_issue_date] => 2000-02-08
[patent_title] => 'Color image recording system and method to prevent color displacement through red light beam detection'
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Array
(
[id] => 4189413
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Array
(
[id] => 4128807
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Array
(
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[patent_title] => 'Method to accurately correlate defect coordinates between photomask inspection and repair systems'
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| 09/121594 | PROJECTION EXPOSURE METHOD UTILIZING CORRECTION FOR CHANGE IN OPTICAL CHARACTERISTIC | Jul 23, 1998 | Issued |
Array
(
[id] => 4026679
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[patent_title] => 'Mask containing alignment mark protection pattern'
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Array
(
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Array
(
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Array
(
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Array
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Array
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