Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4234542 [patent_doc_number] => 06090510 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-18 [patent_title] => 'Method for scanning exposure' [patent_app_type] => 1 [patent_app_number] => 9/047476 [patent_app_country] => US [patent_app_date] => 1998-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 28 [patent_no_of_words] => 17622 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/090/06090510.pdf [firstpage_image] =>[orig_patent_app_number] => 047476 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/047476
Method for scanning exposure Mar 24, 1998 Issued
09/046539 EXPOSURE APPARATUS EXPOSURE METHOD AND CIRCUIT MAKING METHOD Mar 23, 1998 Abandoned
Array ( [id] => 3972987 [patent_doc_number] => 05916717 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-29 [patent_title] => 'Process utilizing relationship between reflectivity and resist thickness for inhibition of side effect caused by halftone phase shift masks' [patent_app_type] => 1 [patent_app_number] => 9/044058 [patent_app_country] => US [patent_app_date] => 1998-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 24 [patent_no_of_words] => 3474 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/916/05916717.pdf [firstpage_image] =>[orig_patent_app_number] => 044058 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/044058
Process utilizing relationship between reflectivity and resist thickness for inhibition of side effect caused by halftone phase shift masks Mar 18, 1998 Issued
Array ( [id] => 4043086 [patent_doc_number] => 05912096 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-15 [patent_title] => 'Charged-particle-beam exposure method with temperature-compensated exposure to offset expansion and contraction of substrate' [patent_app_type] => 1 [patent_app_number] => 9/044395 [patent_app_country] => US [patent_app_date] => 1998-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 4575 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/912/05912096.pdf [firstpage_image] =>[orig_patent_app_number] => 044395 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/044395
Charged-particle-beam exposure method with temperature-compensated exposure to offset expansion and contraction of substrate Mar 17, 1998 Issued
Array ( [id] => 3938467 [patent_doc_number] => 05989760 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-23 [patent_title] => 'Method of processing a substrate utilizing specific chuck' [patent_app_type] => 1 [patent_app_number] => 9/040471 [patent_app_country] => US [patent_app_date] => 1998-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 2942 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/989/05989760.pdf [firstpage_image] =>[orig_patent_app_number] => 040471 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/040471
Method of processing a substrate utilizing specific chuck Mar 17, 1998 Issued
Array ( [id] => 4104484 [patent_doc_number] => 06022644 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-08 [patent_title] => 'Mask containing subresolution line to minimize proximity effect of contact hole' [patent_app_type] => 1 [patent_app_number] => 9/040335 [patent_app_country] => US [patent_app_date] => 1998-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 3120 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/022/06022644.pdf [firstpage_image] =>[orig_patent_app_number] => 040335 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/040335
Mask containing subresolution line to minimize proximity effect of contact hole Mar 17, 1998 Issued
Array ( [id] => 4151933 [patent_doc_number] => 06103428 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-15 [patent_title] => 'Photomask utilizing auxiliary pattern that is not transferred with the resist pattern' [patent_app_type] => 1 [patent_app_number] => 9/042711 [patent_app_country] => US [patent_app_date] => 1998-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 15 [patent_no_of_words] => 7086 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/103/06103428.pdf [firstpage_image] =>[orig_patent_app_number] => 042711 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/042711
Photomask utilizing auxiliary pattern that is not transferred with the resist pattern Mar 16, 1998 Issued
Array ( [id] => 3952802 [patent_doc_number] => 05935739 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-10 [patent_title] => 'Manufacturing method for membrane lithography mask with mask fields' [patent_app_type] => 1 [patent_app_number] => 9/040100 [patent_app_country] => US [patent_app_date] => 1998-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 10 [patent_no_of_words] => 2540 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/935/05935739.pdf [firstpage_image] =>[orig_patent_app_number] => 040100 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/040100
Manufacturing method for membrane lithography mask with mask fields Mar 16, 1998 Issued
Array ( [id] => 4000524 [patent_doc_number] => 06004700 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-21 [patent_title] => 'Membrane mask for electron beam lithography' [patent_app_type] => 1 [patent_app_number] => 9/040099 [patent_app_country] => US [patent_app_date] => 1998-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 12 [patent_no_of_words] => 3305 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 26 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/004/06004700.pdf [firstpage_image] =>[orig_patent_app_number] => 040099 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/040099
Membrane mask for electron beam lithography Mar 16, 1998 Issued
Array ( [id] => 3933938 [patent_doc_number] => 05981118 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-09 [patent_title] => 'Method for charged particle beam exposure with fixed barycenter through balancing stage scan' [patent_app_type] => 1 [patent_app_number] => 9/042747 [patent_app_country] => US [patent_app_date] => 1998-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 9723 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/981/05981118.pdf [firstpage_image] =>[orig_patent_app_number] => 042747 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/042747
Method for charged particle beam exposure with fixed barycenter through balancing stage scan Mar 16, 1998 Issued
Array ( [id] => 4152007 [patent_doc_number] => 06103433 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-15 [patent_title] => 'Exposure method using reticle remount for temperature influence correction' [patent_app_type] => 1 [patent_app_number] => 9/039316 [patent_app_country] => US [patent_app_date] => 1998-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2422 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/103/06103433.pdf [firstpage_image] =>[orig_patent_app_number] => 039316 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/039316
Exposure method using reticle remount for temperature influence correction Mar 15, 1998 Issued
Array ( [id] => 4044978 [patent_doc_number] => 05968692 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-19 [patent_title] => 'Integrated circuit pattern lithography method capable of reducing the number of shots in partial batch exposure' [patent_app_type] => 1 [patent_app_number] => 9/039003 [patent_app_country] => US [patent_app_date] => 1998-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8331 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/968/05968692.pdf [firstpage_image] =>[orig_patent_app_number] => 039003 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/039003
Integrated circuit pattern lithography method capable of reducing the number of shots in partial batch exposure Mar 12, 1998 Issued
Array ( [id] => 4289759 [patent_doc_number] => 06180319 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-30 [patent_title] => 'Process for the continuous liquid processing of photosensitive compositions having reduced levels of residues' [patent_app_type] => 1 [patent_app_number] => 9/038584 [patent_app_country] => US [patent_app_date] => 1998-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8002 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/180/06180319.pdf [firstpage_image] =>[orig_patent_app_number] => 038584 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/038584
Process for the continuous liquid processing of photosensitive compositions having reduced levels of residues Mar 10, 1998 Issued
Array ( [id] => 3931629 [patent_doc_number] => 05972541 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-26 [patent_title] => 'Reticle and method of design to correct pattern for depth of focus problems' [patent_app_type] => 1 [patent_app_number] => 9/035110 [patent_app_country] => US [patent_app_date] => 1998-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 27 [patent_no_of_words] => 11630 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/972/05972541.pdf [firstpage_image] =>[orig_patent_app_number] => 035110 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/035110
Reticle and method of design to correct pattern for depth of focus problems Mar 3, 1998 Issued
Array ( [id] => 4354806 [patent_doc_number] => 06174630 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-16 [patent_title] => 'Method of proximity correction with relative segmentation' [patent_app_type] => 1 [patent_app_number] => 9/034550 [patent_app_country] => US [patent_app_date] => 1998-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 29 [patent_no_of_words] => 5944 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/174/06174630.pdf [firstpage_image] =>[orig_patent_app_number] => 034550 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/034550
Method of proximity correction with relative segmentation Mar 2, 1998 Issued
Array ( [id] => 4244034 [patent_doc_number] => 06221538 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-24 [patent_title] => 'Method for automating manufacture of photomask' [patent_app_type] => 1 [patent_app_number] => 9/033049 [patent_app_country] => US [patent_app_date] => 1998-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3005 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/221/06221538.pdf [firstpage_image] =>[orig_patent_app_number] => 033049 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/033049
Method for automating manufacture of photomask Mar 1, 1998 Issued
Array ( [id] => 4026972 [patent_doc_number] => 05994030 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-30 [patent_title] => 'Pattern-forming method and lithographic system' [patent_app_type] => 1 [patent_app_number] => 9/030888 [patent_app_country] => US [patent_app_date] => 1998-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 5608 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/994/05994030.pdf [firstpage_image] =>[orig_patent_app_number] => 030888 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/030888
Pattern-forming method and lithographic system Feb 25, 1998 Issued
Array ( [id] => 3938453 [patent_doc_number] => 05989759 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-23 [patent_title] => 'Pattern forming method using alignment from latent image or base pattern on substrate' [patent_app_type] => 1 [patent_app_number] => 9/030886 [patent_app_country] => US [patent_app_date] => 1998-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 38 [patent_no_of_words] => 12466 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/989/05989759.pdf [firstpage_image] =>[orig_patent_app_number] => 030886 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/030886
Pattern forming method using alignment from latent image or base pattern on substrate Feb 25, 1998 Issued
Array ( [id] => 4070435 [patent_doc_number] => 05965303 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-12 [patent_title] => 'Method of fabricating a phase shift mask utilizing a defect repair machine' [patent_app_type] => 1 [patent_app_number] => 9/030810 [patent_app_country] => US [patent_app_date] => 1998-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 10 [patent_no_of_words] => 1639 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/965/05965303.pdf [firstpage_image] =>[orig_patent_app_number] => 030810 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/030810
Method of fabricating a phase shift mask utilizing a defect repair machine Feb 25, 1998 Issued
Array ( [id] => 4000509 [patent_doc_number] => 06004699 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-21 [patent_title] => 'Photomask used for projection exposure with phase shifted auxiliary pattern' [patent_app_type] => 1 [patent_app_number] => 9/031107 [patent_app_country] => US [patent_app_date] => 1998-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 46 [patent_no_of_words] => 12764 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/004/06004699.pdf [firstpage_image] =>[orig_patent_app_number] => 031107 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/031107
Photomask used for projection exposure with phase shifted auxiliary pattern Feb 25, 1998 Issued
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