
Christopher G. Young
Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )
| Most Active Art Unit | 1756 |
| Art Unit(s) | 1721, 1737, 1752, 1113, 1506, 1756, 1795 |
| Total Applications | 2931 |
| Issued Applications | 2607 |
| Pending Applications | 32 |
| Abandoned Applications | 298 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4234542
[patent_doc_number] => 06090510
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[patent_kind] => NA
[patent_issue_date] => 2000-07-18
[patent_title] => 'Method for scanning exposure'
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[patent_app_number] => 9/047476
[patent_app_country] => US
[patent_app_date] => 1998-03-25
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/047476 | Method for scanning exposure | Mar 24, 1998 | Issued |
| 09/046539 | EXPOSURE APPARATUS EXPOSURE METHOD AND CIRCUIT MAKING METHOD | Mar 23, 1998 | Abandoned |
Array
(
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[patent_title] => 'Process utilizing relationship between reflectivity and resist thickness for inhibition of side effect caused by halftone phase shift masks'
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Array
(
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[patent_title] => 'Charged-particle-beam exposure method with temperature-compensated exposure to offset expansion and contraction of substrate'
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Array
(
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[patent_issue_date] => 1999-11-23
[patent_title] => 'Method of processing a substrate utilizing specific chuck'
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Array
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[patent_title] => 'Mask containing subresolution line to minimize proximity effect of contact hole'
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Array
(
[id] => 4151933
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[patent_title] => 'Photomask utilizing auxiliary pattern that is not transferred with the resist pattern'
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Array
(
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[patent_title] => 'Manufacturing method for membrane lithography mask with mask fields'
[patent_app_type] => 1
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Array
(
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[patent_title] => 'Membrane mask for electron beam lithography'
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Array
(
[id] => 3933938
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[patent_title] => 'Method for charged particle beam exposure with fixed barycenter through balancing stage scan'
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Array
(
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[patent_title] => 'Exposure method using reticle remount for temperature influence correction'
[patent_app_type] => 1
[patent_app_number] => 9/039316
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Array
(
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[patent_title] => 'Integrated circuit pattern lithography method capable of reducing the number of shots in partial batch exposure'
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Array
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Array
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Array
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Array
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Array
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Array
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Array
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