Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3756203 [patent_doc_number] => 05843600 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-12-01 [patent_title] => 'Use of sub divided pattern for alignment mark recovery after inter-level dielectric planarization' [patent_app_type] => 1 [patent_app_number] => 8/901168 [patent_app_country] => US [patent_app_date] => 1997-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 17 [patent_no_of_words] => 3007 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 347 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/843/05843600.pdf [firstpage_image] =>[orig_patent_app_number] => 901168 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/901168
Use of sub divided pattern for alignment mark recovery after inter-level dielectric planarization Jul 27, 1997 Issued
Array ( [id] => 4082448 [patent_doc_number] => 06025099 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-15 [patent_title] => 'Field curvature correction utilizing smoothly curved chuck for substrate exposure in electronics manufacturing' [patent_app_type] => 1 [patent_app_number] => 8/893260 [patent_app_country] => US [patent_app_date] => 1997-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 4334 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/025/06025099.pdf [firstpage_image] =>[orig_patent_app_number] => 893260 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/893260
Field curvature correction utilizing smoothly curved chuck for substrate exposure in electronics manufacturing Jul 16, 1997 Issued
Array ( [id] => 4233046 [patent_doc_number] => 06143451 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-07 [patent_title] => 'Imaged laserable assemblages and associated processes with high speed and durable image-transfer characteristics for laser-induced thermal transfer' [patent_app_type] => 1 [patent_app_number] => 8/891775 [patent_app_country] => US [patent_app_date] => 1997-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 18670 [patent_no_of_claims] => 58 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/143/06143451.pdf [firstpage_image] =>[orig_patent_app_number] => 891775 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/891775
Imaged laserable assemblages and associated processes with high speed and durable image-transfer characteristics for laser-induced thermal transfer Jul 13, 1997 Issued
Array ( [id] => 3783687 [patent_doc_number] => 05840463 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-11-24 [patent_title] => 'Photosensitive donor element assemblages and associated process for laser-induced thermal transfer' [patent_app_type] => 1 [patent_app_number] => 8/891776 [patent_app_country] => US [patent_app_date] => 1997-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 12930 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/840/05840463.pdf [firstpage_image] =>[orig_patent_app_number] => 891776 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/891776
Photosensitive donor element assemblages and associated process for laser-induced thermal transfer Jul 13, 1997 Issued
Array ( [id] => 3777154 [patent_doc_number] => 05756850 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-05-26 [patent_title] => 'Sulfonium salts having bridged cyclic alkyl group useful as resist for deep UV lithography' [patent_app_type] => 1 [patent_app_number] => 8/891086 [patent_app_country] => US [patent_app_date] => 1997-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 6861 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/756/05756850.pdf [firstpage_image] =>[orig_patent_app_number] => 891086 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/891086
Sulfonium salts having bridged cyclic alkyl group useful as resist for deep UV lithography Jul 9, 1997 Issued
Array ( [id] => 3765690 [patent_doc_number] => 05773174 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-06-30 [patent_title] => 'Method of forming a resist pattern utilizing correlation between latent image height, resist pattern linewidth and surface modification layer width' [patent_app_type] => 1 [patent_app_number] => 8/890685 [patent_app_country] => US [patent_app_date] => 1997-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 19 [patent_no_of_words] => 7254 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/773/05773174.pdf [firstpage_image] =>[orig_patent_app_number] => 890685 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/890685
Method of forming a resist pattern utilizing correlation between latent image height, resist pattern linewidth and surface modification layer width Jul 8, 1997 Issued
Array ( [id] => 3867000 [patent_doc_number] => 05763124 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-06-09 [patent_title] => 'Method of forming a resist pattern utilizing correlation between latent image height, resist pattern linewidth and thermal annealing parameter' [patent_app_type] => 1 [patent_app_number] => 8/890680 [patent_app_country] => US [patent_app_date] => 1997-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 19 [patent_no_of_words] => 7233 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 292 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/763/05763124.pdf [firstpage_image] =>[orig_patent_app_number] => 890680 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/890680
Method of forming a resist pattern utilizing correlation between latent image height, resist pattern linewidth and thermal annealing parameter Jul 8, 1997 Issued
Array ( [id] => 3890702 [patent_doc_number] => 05894057 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-04-13 [patent_title] => 'Charged beam drawing method' [patent_app_type] => 1 [patent_app_number] => 8/887842 [patent_app_country] => US [patent_app_date] => 1997-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5488 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/894/05894057.pdf [firstpage_image] =>[orig_patent_app_number] => 887842 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/887842
Charged beam drawing method Jul 2, 1997 Issued
Array ( [id] => 4026636 [patent_doc_number] => 05902704 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-05-11 [patent_title] => 'Process for forming photoresist mask over integrated circuit structures with critical dimension control' [patent_app_type] => 1 [patent_app_number] => 8/887910 [patent_app_country] => US [patent_app_date] => 1997-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3343 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/902/05902704.pdf [firstpage_image] =>[orig_patent_app_number] => 887910 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/887910
Process for forming photoresist mask over integrated circuit structures with critical dimension control Jul 1, 1997 Issued
Array ( [id] => 3743289 [patent_doc_number] => 05716758 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-02-10 [patent_title] => 'Process for forming fine pattern for semiconductor device utilizing multiple interlaced exposure masks' [patent_app_type] => 1 [patent_app_number] => 8/883289 [patent_app_country] => US [patent_app_date] => 1997-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 26 [patent_no_of_words] => 5683 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 229 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/716/05716758.pdf [firstpage_image] =>[orig_patent_app_number] => 883289 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/883289
Process for forming fine pattern for semiconductor device utilizing multiple interlaced exposure masks Jun 25, 1997 Issued
Array ( [id] => 4143451 [patent_doc_number] => 06063530 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-16 [patent_title] => 'Control of critical dimensions through measurement of absorbed radiation' [patent_app_type] => 1 [patent_app_number] => 8/999926 [patent_app_country] => US [patent_app_date] => 1997-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3478 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/063/06063530.pdf [firstpage_image] =>[orig_patent_app_number] => 999926 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/999926
Control of critical dimensions through measurement of absorbed radiation Jun 22, 1997 Issued
Array ( [id] => 3953240 [patent_doc_number] => 05935768 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-10 [patent_title] => 'Method of processing a substrate in a photolithography system utilizing a thermal process module' [patent_app_type] => 1 [patent_app_number] => 8/872345 [patent_app_country] => US [patent_app_date] => 1997-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 15 [patent_no_of_words] => 10174 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/935/05935768.pdf [firstpage_image] =>[orig_patent_app_number] => 872345 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/872345
Method of processing a substrate in a photolithography system utilizing a thermal process module Jun 9, 1997 Issued
08/871881 PROJECTION EXPOSURE ALIGNMENT METHOD THROUGH MOVEMENT OF PROJECTION OPTICAL SYSTEM WITH SUBSEQUENT IMAGE DISPLACEMENT CORRECTION Jun 8, 1997 Abandoned
Array ( [id] => 4026564 [patent_doc_number] => 05994006 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-30 [patent_title] => 'Projection exposure methods' [patent_app_type] => 1 [patent_app_number] => 8/867901 [patent_app_country] => US [patent_app_date] => 1997-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 36 [patent_no_of_words] => 25880 [patent_no_of_claims] => 71 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/994/05994006.pdf [firstpage_image] =>[orig_patent_app_number] => 867901 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/867901
Projection exposure methods Jun 2, 1997 Issued
Array ( [id] => 4031833 [patent_doc_number] => 05942357 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-24 [patent_title] => 'Method of measuring baseline amount in a projection exposure apparatus' [patent_app_type] => 1 [patent_app_number] => 8/863064 [patent_app_country] => US [patent_app_date] => 1997-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7766 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/942/05942357.pdf [firstpage_image] =>[orig_patent_app_number] => 863064 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/863064
Method of measuring baseline amount in a projection exposure apparatus May 22, 1997 Issued
Array ( [id] => 3774719 [patent_doc_number] => 05756689 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-05-26 [patent_title] => 'Diazo compounds for laser-induced mass transfer imaging materials' [patent_app_type] => 1 [patent_app_number] => 8/858307 [patent_app_country] => US [patent_app_date] => 1997-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14498 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/756/05756689.pdf [firstpage_image] =>[orig_patent_app_number] => 858307 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/858307
Diazo compounds for laser-induced mass transfer imaging materials May 18, 1997 Issued
Array ( [id] => 3880246 [patent_doc_number] => 05798193 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-08-25 [patent_title] => 'Method and apparatus to accurately correlate defect coordinates between photomask inspection and repair systems' [patent_app_type] => 1 [patent_app_number] => 8/857620 [patent_app_country] => US [patent_app_date] => 1997-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 3036 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/798/05798193.pdf [firstpage_image] =>[orig_patent_app_number] => 857620 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/857620
Method and apparatus to accurately correlate defect coordinates between photomask inspection and repair systems May 15, 1997 Issued
Array ( [id] => 3996832 [patent_doc_number] => 05858588 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-01-12 [patent_title] => 'Method for recovering alignment marks after chemical mechanical polishing' [patent_app_type] => 1 [patent_app_number] => 8/850133 [patent_app_country] => US [patent_app_date] => 1997-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 28 [patent_no_of_words] => 3234 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 484 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/858/05858588.pdf [firstpage_image] =>[orig_patent_app_number] => 850133 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/850133
Method for recovering alignment marks after chemical mechanical polishing Apr 30, 1997 Issued
Array ( [id] => 3740898 [patent_doc_number] => 05800962 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-09-01 [patent_title] => 'Temporary support film for transferring white pigment layer' [patent_app_type] => 1 [patent_app_number] => 8/850115 [patent_app_country] => US [patent_app_date] => 1997-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6387 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/800/05800962.pdf [firstpage_image] =>[orig_patent_app_number] => 850115 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/850115
Temporary support film for transferring white pigment layer Apr 30, 1997 Issued
Array ( [id] => 4060140 [patent_doc_number] => 05866294 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-02-02 [patent_title] => 'Water-less quinonediazide lithographic raw plate' [patent_app_type] => 1 [patent_app_number] => 8/847938 [patent_app_country] => US [patent_app_date] => 1997-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 24942 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/866/05866294.pdf [firstpage_image] =>[orig_patent_app_number] => 847938 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/847938
Water-less quinonediazide lithographic raw plate Apr 27, 1997 Issued
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