Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 9161332 [patent_doc_number] => 20130309609 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-11-21 [patent_title] => 'METHOD AND SYSTEM FOR FORMING A PATTERN USING CHARGED PARTICLE BEAM LITHOGRAPHY WITH MULTIPLE EXPOSURE PASSES WHICH EXPOSE DIFFERENT SURFACE AREA' [patent_app_type] => utility [patent_app_number] => 13/947242 [patent_app_country] => US [patent_app_date] => 2013-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 11059 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13947242 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/947242
Method and system for forming a pattern using charged particle beam lithography with multiple exposure passes which expose different surface area Jul 21, 2013 Issued
Array ( [id] => 9161333 [patent_doc_number] => 20130309610 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-11-21 [patent_title] => 'METHOD AND SYSTEM FOR FORMING A PATTERN USING CHARGED PARTICLE BEAM LITHOGRAPHY WITH MULTIPLE EXPOSURE PASSES' [patent_app_type] => utility [patent_app_number] => 13/947245 [patent_app_country] => US [patent_app_date] => 2013-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 11059 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13947245 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/947245
Method and system for forming a pattern using charged particle beam lithography with multiple exposure passes Jul 21, 2013 Issued
Array ( [id] => 10870020 [patent_doc_number] => 08895212 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-11-25 [patent_title] => 'Method and system for forming a pattern using charged particle beam lithography with multiple exposure passes with different dosages' [patent_app_type] => utility [patent_app_number] => 13/946960 [patent_app_country] => US [patent_app_date] => 2013-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 27 [patent_no_of_words] => 11215 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13946960 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/946960
Method and system for forming a pattern using charged particle beam lithography with multiple exposure passes with different dosages Jul 18, 2013 Issued
Array ( [id] => 9148202 [patent_doc_number] => 20130302725 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-11-14 [patent_title] => 'SYSTEM AND METHOD FOR TEST PATTTERN FOR LITHOGRAPHY PROCESS' [patent_app_type] => utility [patent_app_number] => 13/940260 [patent_app_country] => US [patent_app_date] => 2013-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4461 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13940260 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/940260
System and method for test pattern for lithography process Jul 11, 2013 Issued
Array ( [id] => 10320191 [patent_doc_number] => 20150205195 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-07-23 [patent_title] => 'METHOD FOR MANUFACTURING SUPPORT FRAME FOR PELLICLE, SUPPORT FRAME FOR PELLICLE, AND PELLICLE' [patent_app_type] => utility [patent_app_number] => 14/415416 [patent_app_country] => US [patent_app_date] => 2013-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12216 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14415416 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/415416
Method for manufacturing support frame for pellicle, support frame for pellicle, and pellicle Jul 10, 2013 Issued
Array ( [id] => 9798906 [patent_doc_number] => 20150010851 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-01-08 [patent_title] => 'METHODS INVOLVING COLOR-AWARE RETARGETING OF INDIVIDUAL DECOMPOSED PATTERNS WHEN DESIGNING MASKS TO BE USED IN MULTIPLE PATTERNING PROCESSES' [patent_app_type] => utility [patent_app_number] => 13/936680 [patent_app_country] => US [patent_app_date] => 2013-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5405 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13936680 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/936680
Methods involving color-aware retargeting of individual decomposed patterns when designing masks to be used in multiple patterning processes Jul 7, 2013 Issued
Array ( [id] => 9133965 [patent_doc_number] => 20130294679 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-11-07 [patent_title] => 'METHOD FOR INSPECTING MEASUREMENT OBJECT' [patent_app_type] => utility [patent_app_number] => 13/936065 [patent_app_country] => US [patent_app_date] => 2013-07-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 11035 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13936065 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/936065
Method for inspecting measurement object Jul 4, 2013 Issued
Array ( [id] => 9350132 [patent_doc_number] => 08669023 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-03-11 [patent_title] => 'Method for optical proximity correction of a reticle to be manufactured using shaped beam lithography' [patent_app_type] => utility [patent_app_number] => 13/923368 [patent_app_country] => US [patent_app_date] => 2013-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 22 [patent_no_of_words] => 10200 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 49 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13923368 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/923368
Method for optical proximity correction of a reticle to be manufactured using shaped beam lithography Jun 20, 2013 Issued
Array ( [id] => 9983342 [patent_doc_number] => 09029050 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-05-12 [patent_title] => 'Method for repairing a mask' [patent_app_type] => utility [patent_app_number] => 13/895011 [patent_app_country] => US [patent_app_date] => 2013-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 21 [patent_no_of_words] => 5270 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13895011 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/895011
Method for repairing a mask May 14, 2013 Issued
Array ( [id] => 9602935 [patent_doc_number] => 20140199618 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-07-17 [patent_title] => 'METHODS OF MEASURING OVERLAY ERRORS IN AREA-IMAGING E-BEAM LITHOGRAPHY' [patent_app_type] => utility [patent_app_number] => 13/874266 [patent_app_country] => US [patent_app_date] => 2013-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 4714 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13874266 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/874266
Methods of measuring overlay errors in area-imaging e-beam lithography Apr 29, 2013 Issued
Array ( [id] => 9034181 [patent_doc_number] => 20130236819 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-09-12 [patent_title] => 'THIN FILM EVALUATION METHOD, MASK BLANK, AND TRANSFER MASK' [patent_app_type] => utility [patent_app_number] => 13/871582 [patent_app_country] => US [patent_app_date] => 2013-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 9640 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13871582 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/871582
Thin film evaluation method, mask blank, and transfer mask Apr 25, 2013 Issued
Array ( [id] => 9099330 [patent_doc_number] => 08563202 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-22 [patent_title] => 'Single field zero mask for increased alignment accuracy in field stitching' [patent_app_type] => utility [patent_app_number] => 13/864895 [patent_app_country] => US [patent_app_date] => 2013-04-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 3456 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13864895 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/864895
Single field zero mask for increased alignment accuracy in field stitching Apr 16, 2013 Issued
Array ( [id] => 10123838 [patent_doc_number] => 09158193 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-10-13 [patent_title] => 'Mask' [patent_app_type] => utility [patent_app_number] => 14/357650 [patent_app_country] => US [patent_app_date] => 2013-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 2421 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14357650 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/357650
Mask Apr 11, 2013 Issued
Array ( [id] => 9121242 [patent_doc_number] => 20130288164 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-10-31 [patent_title] => 'PATTERN CORRECTION METHOD, STORAGE MEDIUM, INFORMATION PROCESSING APPARATUS, METHOD OF MANUFACTURING MASK, EXPOSURE APPARATUS, AND METHOD OF MANUFACTURING DEVICE' [patent_app_type] => utility [patent_app_number] => 13/855025 [patent_app_country] => US [patent_app_date] => 2013-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 6240 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13855025 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/855025
Pattern correction method, storage medium, information processing apparatus, method of manufacturing mask, exposure apparatus, and method of manufacturing device Apr 1, 2013 Issued
Array ( [id] => 9509807 [patent_doc_number] => 20140146298 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-05-29 [patent_title] => 'DEVICE FOR MANUFACTURING A SURFACE USING CHARACTER PROJECTION LITHOGRAPHY WITH VARIABLE MAGNIFICATION' [patent_app_type] => utility [patent_app_number] => 13/849219 [patent_app_country] => US [patent_app_date] => 2013-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6333 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13849219 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/849219
Device for manufacturing a surface using character projection lithography with variable magnification Mar 21, 2013 Issued
Array ( [id] => 10500918 [patent_doc_number] => 09229316 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-01-05 [patent_title] => 'Method for producing substrate with multilayer reflective film, method for producing reflective mask blank and method for producing reflective mask' [patent_app_type] => utility [patent_app_number] => 14/369414 [patent_app_country] => US [patent_app_date] => 2013-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 12 [patent_no_of_words] => 14910 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14369414 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/369414
Method for producing substrate with multilayer reflective film, method for producing reflective mask blank and method for producing reflective mask Mar 20, 2013 Issued
Array ( [id] => 9041504 [patent_doc_number] => 20130244142 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-09-19 [patent_title] => 'Method and Apparatus for Inspecting a Mask Substrate for Defects, Method of Manufacturing a Photomask, and Method of Manufacturing a Semiconductor Device' [patent_app_type] => utility [patent_app_number] => 13/840489 [patent_app_country] => US [patent_app_date] => 2013-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3369 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13840489 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/840489
Method and apparatus for inspecting a mask substrate for defects, method of manufacturing a photomask, and method of manufacturing a semiconductor device Mar 14, 2013 Issued
Array ( [id] => 9957672 [patent_doc_number] => 09005875 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-04-14 [patent_title] => 'Pre-patterned hard mask for ultrafast lithographic imaging' [patent_app_type] => utility [patent_app_number] => 13/834059 [patent_app_country] => US [patent_app_date] => 2013-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 34 [patent_no_of_words] => 8738 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13834059 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/834059
Pre-patterned hard mask for ultrafast lithographic imaging Mar 14, 2013 Issued
Array ( [id] => 9937107 [patent_doc_number] => 08986912 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-03-24 [patent_title] => 'Method for generating mask pattern' [patent_app_type] => utility [patent_app_number] => 13/835165 [patent_app_country] => US [patent_app_date] => 2013-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 6701 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13835165 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/835165
Method for generating mask pattern Mar 14, 2013 Issued
Array ( [id] => 10837705 [patent_doc_number] => 08865377 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-10-21 [patent_title] => 'Method and system for forming a diagonal pattern using charged particle beam lithography' [patent_app_type] => utility [patent_app_number] => 13/802257 [patent_app_country] => US [patent_app_date] => 2013-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 26 [patent_no_of_words] => 10842 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13802257 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/802257
Method and system for forming a diagonal pattern using charged particle beam lithography Mar 12, 2013 Issued
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