Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 141549 [patent_doc_number] => 07691548 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-06 [patent_title] => 'Method of manufacturing mask' [patent_app_type] => utility [patent_app_number] => 12/222987 [patent_app_country] => US [patent_app_date] => 2008-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 3638 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/691/07691548.pdf [firstpage_image] =>[orig_patent_app_number] => 12222987 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/222987
Method of manufacturing mask Aug 20, 2008 Issued
Array ( [id] => 184827 [patent_doc_number] => 07648807 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-19 [patent_title] => 'Mask blank substrate manufacturing method, mask blank manufacturing method, mask manufacturing method, and mask blank substrate' [patent_app_type] => utility [patent_app_number] => 12/187052 [patent_app_country] => US [patent_app_date] => 2008-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 7008 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/648/07648807.pdf [firstpage_image] =>[orig_patent_app_number] => 12187052 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/187052
Mask blank substrate manufacturing method, mask blank manufacturing method, mask manufacturing method, and mask blank substrate Aug 5, 2008 Issued
Array ( [id] => 4839731 [patent_doc_number] => 20080280217 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-13 [patent_title] => 'Patterning A Single Integrated Circuit Layer Using Multiple Masks And Multiple Masking Layers' [patent_app_type] => utility [patent_app_number] => 12/178472 [patent_app_country] => US [patent_app_date] => 2008-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6207 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0280/20080280217.pdf [firstpage_image] =>[orig_patent_app_number] => 12178472 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/178472
Patterning a single integrated circuit layer using multiple masks and multiple masking layers Jul 22, 2008 Issued
Array ( [id] => 5360877 [patent_doc_number] => 20090035671 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-05 [patent_title] => 'ADJUSTMENT METHOD, EXPOSURE METHOD, DEVICE MANUFACTURING METHOD, AND EXPOSURE APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/177557 [patent_app_country] => US [patent_app_date] => 2008-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9432 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0035/20090035671.pdf [firstpage_image] =>[orig_patent_app_number] => 12177557 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/177557
Adjustment method, exposure method, device manufacturing method, and exposure apparatus Jul 21, 2008 Issued
Array ( [id] => 111328 [patent_doc_number] => 07718327 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-18 [patent_title] => 'Overlay management method and apparatus, processing apparatus, measurement apparatus and exposure apparatus, device manufacturing system and device manufacturing method, and program and information recording medium' [patent_app_type] => utility [patent_app_number] => 12/176902 [patent_app_country] => US [patent_app_date] => 2008-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 12851 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/718/07718327.pdf [firstpage_image] =>[orig_patent_app_number] => 12176902 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/176902
Overlay management method and apparatus, processing apparatus, measurement apparatus and exposure apparatus, device manufacturing system and device manufacturing method, and program and information recording medium Jul 20, 2008 Issued
Array ( [id] => 5330583 [patent_doc_number] => 20090111060 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-30 [patent_title] => 'EXPOSURE METHOD' [patent_app_type] => utility [patent_app_number] => 12/125074 [patent_app_country] => US [patent_app_date] => 2008-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3465 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0111/20090111060.pdf [firstpage_image] =>[orig_patent_app_number] => 12125074 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/125074
Exposure method May 21, 2008 Issued
Array ( [id] => 4859503 [patent_doc_number] => 20080268353 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-30 [patent_title] => 'STENCIL MASK HAVING MAIN AND AUXILIARY STRUT AND METHOD OF FORMING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/114946 [patent_app_country] => US [patent_app_date] => 2008-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 5797 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0268/20080268353.pdf [firstpage_image] =>[orig_patent_app_number] => 12114946 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/114946
Stencil mask having main and auxiliary strut and method of forming the same May 4, 2008 Issued
Array ( [id] => 4531738 [patent_doc_number] => 07887978 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-15 [patent_title] => 'Method of detecting repeating defects in lithography masks on the basis of test substrates exposed under varying conditions' [patent_app_type] => utility [patent_app_number] => 12/113559 [patent_app_country] => US [patent_app_date] => 2008-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 7855 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/887/07887978.pdf [firstpage_image] =>[orig_patent_app_number] => 12113559 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/113559
Method of detecting repeating defects in lithography masks on the basis of test substrates exposed under varying conditions Apr 30, 2008 Issued
Array ( [id] => 4874952 [patent_doc_number] => 20080201686 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-21 [patent_title] => 'METHOD AND APPARATUS FOR PERFORMING TARGET-IMAGE-BASED OPTICAL PROXIMITY CORRECTION' [patent_app_type] => utility [patent_app_number] => 12/112908 [patent_app_country] => US [patent_app_date] => 2008-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4150 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20080201686.pdf [firstpage_image] =>[orig_patent_app_number] => 12112908 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/112908
Method and apparatus for performing target-image-based optical proximity correction Apr 29, 2008 Issued
Array ( [id] => 5428446 [patent_doc_number] => 20090087756 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-02 [patent_title] => 'STRUCTURE AND METHOD FOR DETERMINING AN OVERLAY ACCURACY' [patent_app_type] => utility [patent_app_number] => 12/101439 [patent_app_country] => US [patent_app_date] => 2008-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8819 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0087/20090087756.pdf [firstpage_image] =>[orig_patent_app_number] => 12101439 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/101439
Structure and method for determining an overlay accuracy Apr 10, 2008 Issued
Array ( [id] => 204448 [patent_doc_number] => 07633712 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-15 [patent_title] => 'Method to print photoresist lines with negative sidewalls' [patent_app_type] => utility [patent_app_number] => 12/082256 [patent_app_country] => US [patent_app_date] => 2008-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 16 [patent_no_of_words] => 1731 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/633/07633712.pdf [firstpage_image] =>[orig_patent_app_number] => 12082256 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/082256
Method to print photoresist lines with negative sidewalls Apr 9, 2008 Issued
Array ( [id] => 6629670 [patent_doc_number] => 20100035179 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-11 [patent_title] => 'METHOD OF SYNTHESIZING ITO ELECTRON-BEAM RESIST AND METHOD OF FORMING ITO PATTERN USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/532149 [patent_app_country] => US [patent_app_date] => 2008-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4303 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0035/20100035179.pdf [firstpage_image] =>[orig_patent_app_number] => 12532149 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/532149
Method of synthesizing ITO electron-beam resist and method of forming ITO pattern using the same Mar 18, 2008 Issued
Array ( [id] => 5533456 [patent_doc_number] => 20090233244 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-17 [patent_title] => 'METHOD AND SYSTEM FOR OVERLAY CORRECTION DURING PHOTOLITHOGRAPHY' [patent_app_type] => utility [patent_app_number] => 12/047780 [patent_app_country] => US [patent_app_date] => 2008-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4296 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0233/20090233244.pdf [firstpage_image] =>[orig_patent_app_number] => 12047780 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/047780
Method and system for overlay correction during photolithography Mar 12, 2008 Issued
Array ( [id] => 232582 [patent_doc_number] => 07598007 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-06 [patent_title] => 'Pattern transfer mask, focus variation measuring method and apparatus, and semiconductor device manufacturing method' [patent_app_type] => utility [patent_app_number] => 12/043197 [patent_app_country] => US [patent_app_date] => 2008-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 29 [patent_no_of_words] => 6771 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/598/07598007.pdf [firstpage_image] =>[orig_patent_app_number] => 12043197 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/043197
Pattern transfer mask, focus variation measuring method and apparatus, and semiconductor device manufacturing method Mar 5, 2008 Issued
Array ( [id] => 4482562 [patent_doc_number] => 07901852 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-08 [patent_title] => 'Metrology of bilayer photoresist processes' [patent_app_type] => utility [patent_app_number] => 12/074148 [patent_app_country] => US [patent_app_date] => 2008-02-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 8 [patent_no_of_words] => 6879 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/901/07901852.pdf [firstpage_image] =>[orig_patent_app_number] => 12074148 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/074148
Metrology of bilayer photoresist processes Feb 28, 2008 Issued
Array ( [id] => 4727112 [patent_doc_number] => 20080206654 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES, AND METHOD FOR FORMING A PATTERN ONTO AN EXPOSURE MASK' [patent_app_type] => utility [patent_app_number] => 12/035212 [patent_app_country] => US [patent_app_date] => 2008-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 35 [patent_figures_cnt] => 35 [patent_no_of_words] => 29641 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0206/20080206654.pdf [firstpage_image] =>[orig_patent_app_number] => 12035212 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/035212
Method for manufacturing semiconductor devices, and method for forming a pattern onto an exposure mask Feb 20, 2008 Issued
Array ( [id] => 4727114 [patent_doc_number] => 20080206656 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'Scattering bar OPC application method for sub-half wavelength lithography patterning' [patent_app_type] => utility [patent_app_number] => 12/071439 [patent_app_country] => US [patent_app_date] => 2008-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 6773 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0206/20080206656.pdf [firstpage_image] =>[orig_patent_app_number] => 12071439 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/071439
Scattering bar OPC application method for sub-half wavelength lithography patterning Feb 20, 2008 Issued
Array ( [id] => 4549861 [patent_doc_number] => 07820362 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-10-26 [patent_title] => 'Method of pattern delineation' [patent_app_type] => utility [patent_app_number] => 12/030625 [patent_app_country] => US [patent_app_date] => 2008-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3678 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/820/07820362.pdf [firstpage_image] =>[orig_patent_app_number] => 12030625 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/030625
Method of pattern delineation Feb 12, 2008 Issued
Array ( [id] => 4879629 [patent_doc_number] => 20080153012 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-26 [patent_title] => 'Method of measuring the overlay accuracy of a multi-exposure process' [patent_app_type] => utility [patent_app_number] => 12/068900 [patent_app_country] => US [patent_app_date] => 2008-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3561 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20080153012.pdf [firstpage_image] =>[orig_patent_app_number] => 12068900 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/068900
Method of measuring the overlay accuracy of a multi-exposure process Feb 12, 2008 Abandoned
Array ( [id] => 8027771 [patent_doc_number] => 08142965 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-27 [patent_title] => 'Method and system for measuring in patterned structures' [patent_app_type] => utility [patent_app_number] => 12/526084 [patent_app_country] => US [patent_app_date] => 2008-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 9311 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/142/08142965.pdf [firstpage_image] =>[orig_patent_app_number] => 12526084 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/526084
Method and system for measuring in patterned structures Feb 6, 2008 Issued
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