Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4566591 [patent_doc_number] => 07858276 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-28 [patent_title] => 'Method for determining suitability of a resist in semiconductor wafer fabrication' [patent_app_type] => utility [patent_app_number] => 11/825448 [patent_app_country] => US [patent_app_date] => 2007-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 3236 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/858/07858276.pdf [firstpage_image] =>[orig_patent_app_number] => 11825448 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/825448
Method for determining suitability of a resist in semiconductor wafer fabrication Jul 5, 2007 Issued
Array ( [id] => 5224953 [patent_doc_number] => 20070254219 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-01 [patent_title] => 'Photomask, method for producing the same, and method for forming pattern using the photomask' [patent_app_type] => utility [patent_app_number] => 11/819367 [patent_app_country] => US [patent_app_date] => 2007-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 28 [patent_figures_cnt] => 28 [patent_no_of_words] => 29529 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0254/20070254219.pdf [firstpage_image] =>[orig_patent_app_number] => 11819367 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/819367
Photomask, method for producing the same, and method for forming pattern using the photomask Jun 26, 2007 Issued
Array ( [id] => 5349211 [patent_doc_number] => 20090004572 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-01 [patent_title] => 'METHOD OF MONITORING FOCUS IN LITHOGRAPHIC PROCESSES' [patent_app_type] => utility [patent_app_number] => 11/769436 [patent_app_country] => US [patent_app_date] => 2007-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5372 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0004/20090004572.pdf [firstpage_image] =>[orig_patent_app_number] => 11769436 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/769436
Method of monitoring focus in lithographic processes Jun 26, 2007 Issued
Array ( [id] => 5313182 [patent_doc_number] => 20090277780 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-12 [patent_title] => 'SPUTTERING DEVICE' [patent_app_type] => utility [patent_app_number] => 12/306671 [patent_app_country] => US [patent_app_date] => 2007-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5066 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0277/20090277780.pdf [firstpage_image] =>[orig_patent_app_number] => 12306671 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/306671
SPUTTERING DEVICE Jun 25, 2007 Abandoned
Array ( [id] => 141430 [patent_doc_number] => 07687210 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-30 [patent_title] => 'Space tolerance with stitching' [patent_app_type] => utility [patent_app_number] => 11/767633 [patent_app_country] => US [patent_app_date] => 2007-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 3066 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/687/07687210.pdf [firstpage_image] =>[orig_patent_app_number] => 11767633 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/767633
Space tolerance with stitching Jun 24, 2007 Issued
Array ( [id] => 141551 [patent_doc_number] => 07691550 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-06 [patent_title] => 'Method for making a relief printing form' [patent_app_type] => utility [patent_app_number] => 11/820718 [patent_app_country] => US [patent_app_date] => 2007-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10377 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/691/07691550.pdf [firstpage_image] =>[orig_patent_app_number] => 11820718 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/820718
Method for making a relief printing form Jun 19, 2007 Issued
Array ( [id] => 13266 [patent_doc_number] => 07803506 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-09-28 [patent_title] => 'Methods of measuring critical dimensions and related devices' [patent_app_type] => utility [patent_app_number] => 11/811979 [patent_app_country] => US [patent_app_date] => 2007-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5565 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/803/07803506.pdf [firstpage_image] =>[orig_patent_app_number] => 11811979 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/811979
Methods of measuring critical dimensions and related devices Jun 12, 2007 Issued
Array ( [id] => 5165492 [patent_doc_number] => 20070287078 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-13 [patent_title] => 'Reticle, semiconductor die and method of manufacturing semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/808269 [patent_app_country] => US [patent_app_date] => 2007-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2585 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0287/20070287078.pdf [firstpage_image] =>[orig_patent_app_number] => 11808269 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/808269
Reticle, semiconductor die and method of manufacturing semiconductor device Jun 6, 2007 Issued
Array ( [id] => 5352643 [patent_doc_number] => 20090183987 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-23 [patent_title] => 'Sputter Target Having a Sputter Material Based on TiO2 and Production Method' [patent_app_type] => utility [patent_app_number] => 12/302302 [patent_app_country] => US [patent_app_date] => 2007-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1161 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0183/20090183987.pdf [firstpage_image] =>[orig_patent_app_number] => 12302302 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/302302
Sputter Target Having a Sputter Material Based on TiO2 and Production Method Jun 5, 2007 Abandoned
Array ( [id] => 4949282 [patent_doc_number] => 20080305408 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-11 [patent_title] => 'APERTURE MASK, MANUFACTURING METHOD THEREOF, CHARGE BEAM LITHOGRAPHY APPARATUS, AND CHARGE BEAM LITHOGRAPHY METHOD' [patent_app_type] => utility [patent_app_number] => 11/758898 [patent_app_country] => US [patent_app_date] => 2007-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4327 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0305/20080305408.pdf [firstpage_image] =>[orig_patent_app_number] => 11758898 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/758898
APERTURE MASK, MANUFACTURING METHOD THEREOF, CHARGE BEAM LITHOGRAPHY APPARATUS, AND CHARGE BEAM LITHOGRAPHY METHOD Jun 5, 2007 Abandoned
Array ( [id] => 5088654 [patent_doc_number] => 20070228293 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-04 [patent_title] => 'PATTERN WRITING AND FORMING METHOD' [patent_app_type] => utility [patent_app_number] => 11/759057 [patent_app_country] => US [patent_app_date] => 2007-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8009 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0228/20070228293.pdf [firstpage_image] =>[orig_patent_app_number] => 11759057 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/759057
Pattern writing and forming method Jun 5, 2007 Issued
Array ( [id] => 7526897 [patent_doc_number] => 08043488 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-10-25 [patent_title] => 'Rotatable sputter target' [patent_app_type] => utility [patent_app_number] => 12/302203 [patent_app_country] => US [patent_app_date] => 2007-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2805 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/043/08043488.pdf [firstpage_image] =>[orig_patent_app_number] => 12302203 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/302203
Rotatable sputter target May 30, 2007 Issued
Array ( [id] => 5010742 [patent_doc_number] => 20070281221 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-06 [patent_title] => 'STENCIL MASK' [patent_app_type] => utility [patent_app_number] => 11/755707 [patent_app_country] => US [patent_app_date] => 2007-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2000 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0281/20070281221.pdf [firstpage_image] =>[orig_patent_app_number] => 11755707 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/755707
STENCIL MASK May 29, 2007 Abandoned
Array ( [id] => 5028299 [patent_doc_number] => 20070269746 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-22 [patent_title] => 'Pattern forming method used in semiconductor device manufacturing and method of manufacturing semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/798724 [patent_app_country] => US [patent_app_date] => 2007-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8500 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0269/20070269746.pdf [firstpage_image] =>[orig_patent_app_number] => 11798724 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/798724
Pattern forming method used in semiconductor device manufacturing and method of manufacturing semiconductor device May 15, 2007 Issued
Array ( [id] => 4802947 [patent_doc_number] => 20080014535 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-17 [patent_title] => 'Method for detecting defects which originate from chemical solution and method of manufacturing semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/797529 [patent_app_country] => US [patent_app_date] => 2007-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2574 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0014/20080014535.pdf [firstpage_image] =>[orig_patent_app_number] => 11797529 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/797529
Method for detecting defects which originate from chemical solution and method of manufacturing semiconductor device May 3, 2007 Issued
Array ( [id] => 4975671 [patent_doc_number] => 20070216902 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-20 [patent_title] => 'Reference Wafer and Process for Manufacturing Same' [patent_app_type] => utility [patent_app_number] => 11/742468 [patent_app_country] => US [patent_app_date] => 2007-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 40 [patent_figures_cnt] => 40 [patent_no_of_words] => 19218 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0216/20070216902.pdf [firstpage_image] =>[orig_patent_app_number] => 11742468 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/742468
Reference wafer calibration reticle Apr 29, 2007 Issued
Array ( [id] => 5431601 [patent_doc_number] => 20090166187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-02 [patent_title] => 'Lithium-Containing Transition Metal Oxide Target, Process for Producing the same and Lithium Ion Thin Film Secondary Battery' [patent_app_type] => utility [patent_app_number] => 12/297320 [patent_app_country] => US [patent_app_date] => 2007-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6102 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0166/20090166187.pdf [firstpage_image] =>[orig_patent_app_number] => 12297320 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/297320
Lithium-containing transition metal oxide target, process for producing the same and lithium ion thin film secondary battery Apr 26, 2007 Issued
Array ( [id] => 5112831 [patent_doc_number] => 20070196746 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-23 [patent_title] => 'Methods and apparatuses for applying wafer-alignment marks' [patent_app_type] => utility [patent_app_number] => 11/786587 [patent_app_country] => US [patent_app_date] => 2007-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3323 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0196/20070196746.pdf [firstpage_image] =>[orig_patent_app_number] => 11786587 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/786587
Methods and apparatuses for applying wafer-alignment marks Apr 10, 2007 Abandoned
Array ( [id] => 7800524 [patent_doc_number] => 08128793 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-06 [patent_title] => 'Vertical substrate transfer apparatus and film-forming apparatus' [patent_app_type] => utility [patent_app_number] => 12/226364 [patent_app_country] => US [patent_app_date] => 2007-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 23 [patent_no_of_words] => 6068 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/128/08128793.pdf [firstpage_image] =>[orig_patent_app_number] => 12226364 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/226364
Vertical substrate transfer apparatus and film-forming apparatus Apr 10, 2007 Issued
Array ( [id] => 5125767 [patent_doc_number] => 20070238038 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-11 [patent_title] => 'Exposure condition setting method, semiconductor device manufacturing method, and exposure condition setting program' [patent_app_type] => utility [patent_app_number] => 11/783469 [patent_app_country] => US [patent_app_date] => 2007-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4308 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20070238038.pdf [firstpage_image] =>[orig_patent_app_number] => 11783469 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/783469
Exposure condition setting method, semiconductor device manufacturing method, and exposure condition setting program Apr 9, 2007 Issued
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