
Christopher G. Young
Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )
| Most Active Art Unit | 1756 |
| Art Unit(s) | 1721, 1737, 1752, 1113, 1506, 1756, 1795 |
| Total Applications | 2931 |
| Issued Applications | 2607 |
| Pending Applications | 32 |
| Abandoned Applications | 298 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 820407
[patent_doc_number] => 07407736
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-08-05
[patent_title] => 'Methods of improving single layer resist patterning scheme'
[patent_app_type] => utility
[patent_app_number] => 11/307289
[patent_app_country] => US
[patent_app_date] => 2006-01-31
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[patent_no_of_words] => 2260
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[pdf_file] => patents/07/407/07407736.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/307289 | Methods of improving single layer resist patterning scheme | Jan 30, 2006 | Issued |
Array
(
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[patent_doc_number] => 07652284
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[patent_kind] => B2
[patent_issue_date] => 2010-01-26
[patent_title] => 'Process monitor mark and the method for using the same'
[patent_app_type] => utility
[patent_app_number] => 11/340910
[patent_app_country] => US
[patent_app_date] => 2006-01-27
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/340910 | Process monitor mark and the method for using the same | Jan 26, 2006 | Issued |
Array
(
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[patent_doc_number] => 07494753
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[patent_kind] => B2
[patent_issue_date] => 2009-02-24
[patent_title] => 'Method, program product and apparatus for improving calibration of resist models used in critical dimension calculation'
[patent_app_type] => utility
[patent_app_number] => 11/339827
[patent_app_country] => US
[patent_app_date] => 2006-01-26
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/339827 | Method, program product and apparatus for improving calibration of resist models used in critical dimension calculation | Jan 25, 2006 | Issued |
Array
(
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[patent_doc_number] => 20060121374
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[patent_kind] => A1
[patent_issue_date] => 2006-06-08
[patent_title] => 'Method for determining pattern misalignment over a substrate'
[patent_app_type] => utility
[patent_app_number] => 11/336492
[patent_app_country] => US
[patent_app_date] => 2006-01-20
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[firstpage_image] =>[orig_patent_app_number] => 11336492
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Array
(
[id] => 390151
[patent_doc_number] => 07300746
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[patent_kind] => B2
[patent_issue_date] => 2007-11-27
[patent_title] => 'Photomask for forming small contact hole array and methods of fabricating and using the same'
[patent_app_type] => utility
[patent_app_number] => 11/328788
[patent_app_country] => US
[patent_app_date] => 2006-01-10
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[firstpage_image] =>[orig_patent_app_number] => 11328788
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/328788 | Photomask for forming small contact hole array and methods of fabricating and using the same | Jan 9, 2006 | Issued |
Array
(
[id] => 851012
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[patent_issue_date] => 2008-06-03
[patent_title] => 'Method and apparatus for performing target-image-based optical proximity correction'
[patent_app_type] => utility
[patent_app_number] => 11/325211
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/325211 | Method and apparatus for performing target-image-based optical proximity correction | Jan 2, 2006 | Issued |
Array
(
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[patent_title] => 'Baking apparatus used in photolithography process, and method for controlling critical dimension of photoresist patterns using the same'
[patent_app_type] => utility
[patent_app_number] => 11/318508
[patent_app_country] => US
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Array
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[patent_doc_number] => 07632616
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[patent_issue_date] => 2009-12-15
[patent_title] => 'Controlling system and method for operating the same'
[patent_app_type] => utility
[patent_app_number] => 11/306417
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/306417 | Controlling system and method for operating the same | Dec 27, 2005 | Issued |
Array
(
[id] => 5625201
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[patent_title] => 'Overlay vernier and method for manufacturing semiconductor device using the same'
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[patent_app_number] => 11/321131
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Array
(
[id] => 5613823
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[patent_title] => 'Automated overlay metrology system'
[patent_app_type] => utility
[patent_app_number] => 11/316913
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/316913 | Automated overlay metrology system | Dec 26, 2005 | Issued |
Array
(
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[patent_title] => 'METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE'
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Array
(
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/312588 | Exposure system, exposure method and semiconductor device manufacturing method | Dec 20, 2005 | Issued |
Array
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Array
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/298129 | Method and apparatus for embedded encoding of overlay data ordering in an in-situ interferometer | Dec 7, 2005 | Issued |