Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 830007 [patent_doc_number] => 07399559 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-07-15 [patent_title] => 'Optical proximity correction method utilizing phase-edges as sub-resolution assist features' [patent_app_type] => utility [patent_app_number] => 11/188858 [patent_app_country] => US [patent_app_date] => 2005-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 24 [patent_no_of_words] => 8056 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/399/07399559.pdf [firstpage_image] =>[orig_patent_app_number] => 11188858 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/188858
Optical proximity correction method utilizing phase-edges as sub-resolution assist features Jul 25, 2005 Issued
Array ( [id] => 472080 [patent_doc_number] => 07229743 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-06-12 [patent_title] => 'Electron beam lithography method, patterned master carrier for magnetic transfer, lithography method for patterned master carrier for magnetic transfer, and method for producing performatted magnetic recording media' [patent_app_type] => utility [patent_app_number] => 11/170141 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 19 [patent_no_of_words] => 15019 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/229/07229743.pdf [firstpage_image] =>[orig_patent_app_number] => 11170141 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/170141
Electron beam lithography method, patterned master carrier for magnetic transfer, lithography method for patterned master carrier for magnetic transfer, and method for producing performatted magnetic recording media Jun 29, 2005 Issued
Array ( [id] => 5893455 [patent_doc_number] => 20060001993 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-05 [patent_title] => 'Electron beam lithography method' [patent_app_type] => utility [patent_app_number] => 11/169575 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5746 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20060001993.pdf [firstpage_image] =>[orig_patent_app_number] => 11169575 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/169575
Electron beam lithography method Jun 29, 2005 Issued
Array ( [id] => 5602118 [patent_doc_number] => 20060292463 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Device manufacturing method and a calibration substrate' [patent_app_type] => utility [patent_app_number] => 11/167578 [patent_app_country] => US [patent_app_date] => 2005-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5576 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0292/20060292463.pdf [firstpage_image] =>[orig_patent_app_number] => 11167578 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/167578
Device manufacturing method and a calibration substrate Jun 27, 2005 Issued
Array ( [id] => 459427 [patent_doc_number] => 07241542 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-10 [patent_title] => 'Process for controlling the proximity effect correction' [patent_app_type] => utility [patent_app_number] => 11/165312 [patent_app_country] => US [patent_app_date] => 2005-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 34 [patent_no_of_words] => 9265 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/241/07241542.pdf [firstpage_image] =>[orig_patent_app_number] => 11165312 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/165312
Process for controlling the proximity effect correction Jun 22, 2005 Issued
Array ( [id] => 587988 [patent_doc_number] => 07435517 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-14 [patent_title] => 'Method for reducing the fogging effect' [patent_app_type] => utility [patent_app_number] => 11/165500 [patent_app_country] => US [patent_app_date] => 2005-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 32 [patent_no_of_words] => 9094 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 258 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/435/07435517.pdf [firstpage_image] =>[orig_patent_app_number] => 11165500 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/165500
Method for reducing the fogging effect Jun 22, 2005 Issued
Array ( [id] => 5602110 [patent_doc_number] => 20060292455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'METHOD FOR CHECKING PHASE SHIFT ANGLE OF PHASE SHIFT MASK, LITHOGRAPHY PROCESS AND PHASE SHIFT MASK' [patent_app_type] => utility [patent_app_number] => 11/160420 [patent_app_country] => US [patent_app_date] => 2005-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4218 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0292/20060292455.pdf [firstpage_image] =>[orig_patent_app_number] => 11160420 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/160420
Method for checking phase shift angle of phase shift mask, lithography process and phase shift mask Jun 22, 2005 Issued
Array ( [id] => 5894701 [patent_doc_number] => 20060003240 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-05 [patent_title] => 'Methods for adjusting light intensity for photolithography and related systems' [patent_app_type] => utility [patent_app_number] => 11/153787 [patent_app_country] => US [patent_app_date] => 2005-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5394 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0003/20060003240.pdf [firstpage_image] =>[orig_patent_app_number] => 11153787 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/153787
Methods for adjusting light intensity for photolithography and related systems Jun 14, 2005 Abandoned
11/141202 Application of 2-dimensional photonic crystals in alignment devices May 31, 2005 Abandoned
Array ( [id] => 551426 [patent_doc_number] => 07160655 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-09 [patent_title] => 'Exposure method using complementary divided mask, exposure apparatus, semiconductor device, and method of producing the same' [patent_app_type] => utility [patent_app_number] => 11/129868 [patent_app_country] => US [patent_app_date] => 2005-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 20 [patent_no_of_words] => 7410 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/160/07160655.pdf [firstpage_image] =>[orig_patent_app_number] => 11129868 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/129868
Exposure method using complementary divided mask, exposure apparatus, semiconductor device, and method of producing the same May 15, 2005 Issued
Array ( [id] => 563483 [patent_doc_number] => 07465525 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-12-16 [patent_title] => 'Reticle alignment and overlay for multiple reticle process' [patent_app_type] => utility [patent_app_number] => 11/126466 [patent_app_country] => US [patent_app_date] => 2005-05-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 32 [patent_no_of_words] => 7412 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 25 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/465/07465525.pdf [firstpage_image] =>[orig_patent_app_number] => 11126466 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/126466
Reticle alignment and overlay for multiple reticle process May 9, 2005 Issued
Array ( [id] => 583631 [patent_doc_number] => 07442474 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-28 [patent_title] => 'Reticle for determining rotational error' [patent_app_type] => utility [patent_app_number] => 11/118132 [patent_app_country] => US [patent_app_date] => 2005-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 14079 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/442/07442474.pdf [firstpage_image] =>[orig_patent_app_number] => 11118132 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/118132
Reticle for determining rotational error Apr 28, 2005 Issued
Array ( [id] => 5776610 [patent_doc_number] => 20060105250 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-18 [patent_title] => 'Test photomask and compensation method using the same' [patent_app_type] => utility [patent_app_number] => 11/114448 [patent_app_country] => US [patent_app_date] => 2005-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1945 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0105/20060105250.pdf [firstpage_image] =>[orig_patent_app_number] => 11114448 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/114448
Test photomask and compensation method using the same Apr 25, 2005 Abandoned
Array ( [id] => 7751072 [patent_doc_number] => 08110322 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-02-07 [patent_title] => 'Method of mask forming and method of three-dimensional microfabrication' [patent_app_type] => utility [patent_app_number] => 11/912503 [patent_app_country] => US [patent_app_date] => 2005-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 6178 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/110/08110322.pdf [firstpage_image] =>[orig_patent_app_number] => 11912503 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/912503
Method of mask forming and method of three-dimensional microfabrication Apr 24, 2005 Issued
Array ( [id] => 299670 [patent_doc_number] => 07537869 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-05-26 [patent_title] => 'Evaluation of pattern formation process, photo masks for the evaluation, and fabrication method of a semiconductor device with the evaluation process' [patent_app_type] => utility [patent_app_number] => 11/108862 [patent_app_country] => US [patent_app_date] => 2005-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 29 [patent_no_of_words] => 8795 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/537/07537869.pdf [firstpage_image] =>[orig_patent_app_number] => 11108862 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/108862
Evaluation of pattern formation process, photo masks for the evaluation, and fabrication method of a semiconductor device with the evaluation process Apr 18, 2005 Issued
Array ( [id] => 4498514 [patent_doc_number] => 07919218 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-05 [patent_title] => 'Method for a multiple exposure beams lithography tool' [patent_app_type] => utility [patent_app_number] => 11/918576 [patent_app_country] => US [patent_app_date] => 2005-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 6448 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/919/07919218.pdf [firstpage_image] =>[orig_patent_app_number] => 11918576 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/918576
Method for a multiple exposure beams lithography tool Apr 18, 2005 Issued
Array ( [id] => 415032 [patent_doc_number] => 07279259 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-09 [patent_title] => 'Method for correcting pattern data and method for manufacturing semiconductor device using same' [patent_app_type] => utility [patent_app_number] => 11/102689 [patent_app_country] => US [patent_app_date] => 2005-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 7726 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/279/07279259.pdf [firstpage_image] =>[orig_patent_app_number] => 11102689 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/102689
Method for correcting pattern data and method for manufacturing semiconductor device using same Apr 10, 2005 Issued
Array ( [id] => 7019185 [patent_doc_number] => 20050221204 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-06 [patent_title] => 'Electron beam writing method and lithography mask manufacturing method' [patent_app_type] => utility [patent_app_number] => 11/094306 [patent_app_country] => US [patent_app_date] => 2005-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 9100 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0221/20050221204.pdf [firstpage_image] =>[orig_patent_app_number] => 11094306 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/094306
Electron beam writing method and lithography mask manufacturing method Mar 30, 2005 Issued
Array ( [id] => 7066572 [patent_doc_number] => 20050242059 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-03 [patent_title] => 'Producing a substrate having high surface-area texturing' [patent_app_type] => utility [patent_app_number] => 11/092540 [patent_app_country] => US [patent_app_date] => 2005-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 13019 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0242/20050242059.pdf [firstpage_image] =>[orig_patent_app_number] => 11092540 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/092540
Producing a substrate having high surface-area texturing Mar 28, 2005 Issued
Array ( [id] => 532529 [patent_doc_number] => 07175945 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-13 [patent_title] => 'Focus masking structures, focus patterns and measurements thereof' [patent_app_type] => utility [patent_app_number] => 11/084556 [patent_app_country] => US [patent_app_date] => 2005-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 35 [patent_no_of_words] => 16545 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/175/07175945.pdf [firstpage_image] =>[orig_patent_app_number] => 11084556 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/084556
Focus masking structures, focus patterns and measurements thereof Mar 15, 2005 Issued
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