Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 753971 [patent_doc_number] => 07018788 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-28 [patent_title] => 'Phase shifting lithographic process' [patent_app_type] => utility [patent_app_number] => 10/904795 [patent_app_country] => US [patent_app_date] => 2004-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3395 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/018/07018788.pdf [firstpage_image] =>[orig_patent_app_number] => 10904795 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/904795
Phase shifting lithographic process Nov 29, 2004 Issued
Array ( [id] => 7097590 [patent_doc_number] => 20050130049 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-16 [patent_title] => 'Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/989314 [patent_app_country] => US [patent_app_date] => 2004-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8946 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0130/20050130049.pdf [firstpage_image] =>[orig_patent_app_number] => 10989314 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/989314
Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device Nov 16, 2004 Issued
Array ( [id] => 765879 [patent_doc_number] => 07008756 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-07 [patent_title] => 'Method of fabricating an X/Y alignment vernier' [patent_app_type] => utility [patent_app_number] => 10/985219 [patent_app_country] => US [patent_app_date] => 2004-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 3427 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/008/07008756.pdf [firstpage_image] =>[orig_patent_app_number] => 10985219 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/985219
Method of fabricating an X/Y alignment vernier Nov 8, 2004 Issued
Array ( [id] => 508634 [patent_doc_number] => 07195860 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-27 [patent_title] => 'Semiconductor manufacturing apparatus and pattern formation method' [patent_app_type] => utility [patent_app_number] => 10/983655 [patent_app_country] => US [patent_app_date] => 2004-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 31 [patent_no_of_words] => 8143 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/195/07195860.pdf [firstpage_image] =>[orig_patent_app_number] => 10983655 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/983655
Semiconductor manufacturing apparatus and pattern formation method Nov 8, 2004 Issued
Array ( [id] => 7116484 [patent_doc_number] => 20050069785 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-31 [patent_title] => 'In-situ pellicle monitor' [patent_app_type] => utility [patent_app_number] => 10/904356 [patent_app_country] => US [patent_app_date] => 2004-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3625 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0069/20050069785.pdf [firstpage_image] =>[orig_patent_app_number] => 10904356 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/904356
In-situ pellicle monitor Nov 4, 2004 Issued
Array ( [id] => 5809531 [patent_doc_number] => 20060095887 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-04 [patent_title] => 'Process window-based correction for photolithography masks' [patent_app_type] => utility [patent_app_number] => 10/977421 [patent_app_country] => US [patent_app_date] => 2004-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4779 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0095/20060095887.pdf [firstpage_image] =>[orig_patent_app_number] => 10977421 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/977421
Process window-based correction for photolithography masks Oct 28, 2004 Issued
Array ( [id] => 5720911 [patent_doc_number] => 20060073686 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-06 [patent_title] => 'Method and system for reducing the impact of across-wafer variations on critical dimension measurements' [patent_app_type] => utility [patent_app_number] => 10/971350 [patent_app_country] => US [patent_app_date] => 2004-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 14138 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0073/20060073686.pdf [firstpage_image] =>[orig_patent_app_number] => 10971350 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/971350
Method and system for reducing the impact of across-wafer variations on critical dimension measurements Oct 21, 2004 Issued
Array ( [id] => 7004955 [patent_doc_number] => 20050170268 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-04 [patent_title] => 'Semiconductor device fabrication method and fabrication apparatus using a stencil mask' [patent_app_type] => utility [patent_app_number] => 10/969181 [patent_app_country] => US [patent_app_date] => 2004-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 9614 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20050170268.pdf [firstpage_image] =>[orig_patent_app_number] => 10969181 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/969181
Semiconductor device fabrication method and fabrication apparatus using a stencil mask Oct 20, 2004 Issued
Array ( [id] => 793091 [patent_doc_number] => 06982136 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-01-03 [patent_title] => 'Method and system for determining optimum optical proximity corrections within a photolithography system' [patent_app_type] => utility [patent_app_number] => 10/966854 [patent_app_country] => US [patent_app_date] => 2004-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 4303 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/982/06982136.pdf [firstpage_image] =>[orig_patent_app_number] => 10966854 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/966854
Method and system for determining optimum optical proximity corrections within a photolithography system Oct 14, 2004 Issued
Array ( [id] => 7116488 [patent_doc_number] => 20050069789 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-31 [patent_title] => 'Photomasking' [patent_app_type] => utility [patent_app_number] => 10/965072 [patent_app_country] => US [patent_app_date] => 2004-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2360 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0069/20050069789.pdf [firstpage_image] =>[orig_patent_app_number] => 10965072 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/965072
Photomasking Oct 12, 2004 Issued
Array ( [id] => 7251584 [patent_doc_number] => 20050074704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-07 [patent_title] => 'Semiconductor fabrication apparatus and pattern formation method using the same' [patent_app_type] => utility [patent_app_number] => 10/958299 [patent_app_country] => US [patent_app_date] => 2004-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6566 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20050074704.pdf [firstpage_image] =>[orig_patent_app_number] => 10958299 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/958299
Semiconductor fabrication apparatus and pattern formation method using the same Oct 5, 2004 Abandoned
Array ( [id] => 7116489 [patent_doc_number] => 20050069790 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-31 [patent_title] => 'Method for reducing an overlay error and measurement mark for carrying out the same' [patent_app_type] => utility [patent_app_number] => 10/952885 [patent_app_country] => US [patent_app_date] => 2004-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 8579 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0069/20050069790.pdf [firstpage_image] =>[orig_patent_app_number] => 10952885 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/952885
Method for reducing an overlay error and measurement mark for carrying out the same Sep 29, 2004 Issued
Array ( [id] => 6984414 [patent_doc_number] => 20050154484 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-14 [patent_title] => 'Photolithographic parameter feedback system and control method thereof' [patent_app_type] => utility [patent_app_number] => 10/949361 [patent_app_country] => US [patent_app_date] => 2004-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3352 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0154/20050154484.pdf [firstpage_image] =>[orig_patent_app_number] => 10949361 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/949361
Photolithographic parameter feedback system and control method thereof Sep 26, 2004 Abandoned
Array ( [id] => 7218855 [patent_doc_number] => 20050260510 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-24 [patent_title] => 'Method for determining the relative positional accuracy of two structure elements on a wafer' [patent_app_type] => utility [patent_app_number] => 10/950165 [patent_app_country] => US [patent_app_date] => 2004-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5444 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0260/20050260510.pdf [firstpage_image] =>[orig_patent_app_number] => 10950165 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/950165
Method for determining the relative positional accuracy of two structure elements on a wafer Sep 23, 2004 Issued
Array ( [id] => 7116485 [patent_doc_number] => 20050069786 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-31 [patent_title] => 'Stencil mask, production method thereof, exposure apparatus, exposure method and electronic device production method' [patent_app_type] => utility [patent_app_number] => 10/941364 [patent_app_country] => US [patent_app_date] => 2004-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5046 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0069/20050069786.pdf [firstpage_image] =>[orig_patent_app_number] => 10941364 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/941364
Stencil mask, production method thereof, exposure apparatus, exposure method and electronic device production method Sep 14, 2004 Abandoned
Array ( [id] => 177660 [patent_doc_number] => 07655368 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-02 [patent_title] => 'Method for exposing a substrate and lithographic projection apparatus' [patent_app_type] => utility [patent_app_number] => 10/936727 [patent_app_country] => US [patent_app_date] => 2004-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7692 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/655/07655368.pdf [firstpage_image] =>[orig_patent_app_number] => 10936727 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/936727
Method for exposing a substrate and lithographic projection apparatus Sep 8, 2004 Issued
Array ( [id] => 797871 [patent_doc_number] => 07427457 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-09-23 [patent_title] => 'Methods for designing grating structures for use in situ scatterometry to detect photoresist defects' [patent_app_type] => utility [patent_app_number] => 10/934277 [patent_app_country] => US [patent_app_date] => 2004-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 17 [patent_no_of_words] => 7587 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/427/07427457.pdf [firstpage_image] =>[orig_patent_app_number] => 10934277 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/934277
Methods for designing grating structures for use in situ scatterometry to detect photoresist defects Sep 2, 2004 Issued
Array ( [id] => 5902962 [patent_doc_number] => 20060046167 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-02 [patent_title] => 'Characterizing flare of a projection lens' [patent_app_type] => utility [patent_app_number] => 10/933090 [patent_app_country] => US [patent_app_date] => 2004-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5124 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0046/20060046167.pdf [firstpage_image] =>[orig_patent_app_number] => 10933090 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/933090
Characterizing flare of a projection lens Aug 31, 2004 Issued
Array ( [id] => 701293 [patent_doc_number] => 07063923 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-20 [patent_title] => 'Optical proximity correction method' [patent_app_type] => utility [patent_app_number] => 10/711198 [patent_app_country] => US [patent_app_date] => 2004-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2064 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/063/07063923.pdf [firstpage_image] =>[orig_patent_app_number] => 10711198 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/711198
Optical proximity correction method Aug 31, 2004 Issued
Array ( [id] => 7160817 [patent_doc_number] => 20050084782 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-21 [patent_title] => 'Exposure method and exposure management system' [patent_app_type] => utility [patent_app_number] => 10/928982 [patent_app_country] => US [patent_app_date] => 2004-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 12326 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0084/20050084782.pdf [firstpage_image] =>[orig_patent_app_number] => 10928982 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/928982
Exposure method and exposure management system Aug 26, 2004 Issued
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