Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 555171 [patent_doc_number] => 07157194 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-02 [patent_title] => 'Method for exposing a substrate with a structure pattern which compensates for the optical proximity effect' [patent_app_type] => utility [patent_app_number] => 10/771302 [patent_app_country] => US [patent_app_date] => 2004-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3032 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 286 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/157/07157194.pdf [firstpage_image] =>[orig_patent_app_number] => 10771302 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/771302
Method for exposing a substrate with a structure pattern which compensates for the optical proximity effect Feb 4, 2004 Issued
Array ( [id] => 520251 [patent_doc_number] => 07186487 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-03-06 [patent_title] => 'Method of controlling exposure processes by monitoring photon levels, and system for accomplishing same' [patent_app_type] => utility [patent_app_number] => 10/771109 [patent_app_country] => US [patent_app_date] => 2004-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 7058 [patent_no_of_claims] => 66 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/186/07186487.pdf [firstpage_image] =>[orig_patent_app_number] => 10771109 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/771109
Method of controlling exposure processes by monitoring photon levels, and system for accomplishing same Feb 2, 2004 Issued
Array ( [id] => 7232931 [patent_doc_number] => 20040157142 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-12 [patent_title] => 'Reference wafer and process for manufacturing same' [patent_app_type] => new [patent_app_number] => 10/765223 [patent_app_country] => US [patent_app_date] => 2004-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 12913 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 49 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20040157142.pdf [firstpage_image] =>[orig_patent_app_number] => 10765223 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/765223
Reference wafer and process for manufacturing same Jan 25, 2004 Issued
Array ( [id] => 520200 [patent_doc_number] => 07186481 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-06 [patent_title] => 'Flare measuring mask and flare measuring method of semiconductor aligner' [patent_app_type] => utility [patent_app_number] => 10/761215 [patent_app_country] => US [patent_app_date] => 2004-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 23 [patent_no_of_words] => 8488 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/186/07186481.pdf [firstpage_image] =>[orig_patent_app_number] => 10761215 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/761215
Flare measuring mask and flare measuring method of semiconductor aligner Jan 21, 2004 Issued
Array ( [id] => 654427 [patent_doc_number] => 07108946 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-09-19 [patent_title] => 'Method of lithographic image alignment for use with a dual mask exposure technique' [patent_app_type] => utility [patent_app_number] => 10/755664 [patent_app_country] => US [patent_app_date] => 2004-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 5577 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/108/07108946.pdf [firstpage_image] =>[orig_patent_app_number] => 10755664 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/755664
Method of lithographic image alignment for use with a dual mask exposure technique Jan 11, 2004 Issued
Array ( [id] => 1014459 [patent_doc_number] => 06893801 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-05-17 [patent_title] => 'Fabrication method of semiconductor integrated circuit device' [patent_app_type] => utility [patent_app_number] => 10/753354 [patent_app_country] => US [patent_app_date] => 2004-01-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 41 [patent_no_of_words] => 12496 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/893/06893801.pdf [firstpage_image] =>[orig_patent_app_number] => 10753354 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/753354
Fabrication method of semiconductor integrated circuit device Jan 8, 2004 Issued
Array ( [id] => 7373810 [patent_doc_number] => 20040219444 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-11-04 [patent_title] => 'Method for fabricating semiconductor device and equipment for fabricating the same' [patent_app_type] => new [patent_app_number] => 10/743290 [patent_app_country] => US [patent_app_date] => 2003-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 8160 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20040219444.pdf [firstpage_image] =>[orig_patent_app_number] => 10743290 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/743290
Method for fabricating semiconductor device and equipment for fabricating the same Dec 22, 2003 Issued
Array ( [id] => 448237 [patent_doc_number] => 07250237 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-31 [patent_title] => 'Optimized correction of wafer thermal deformations in a lithographic process' [patent_app_type] => utility [patent_app_number] => 10/743272 [patent_app_country] => US [patent_app_date] => 2003-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 8730 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/250/07250237.pdf [firstpage_image] =>[orig_patent_app_number] => 10743272 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/743272
Optimized correction of wafer thermal deformations in a lithographic process Dec 22, 2003 Issued
Array ( [id] => 428478 [patent_doc_number] => 07267911 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-11 [patent_title] => 'Stencil mask and its manufacturing method' [patent_app_type] => utility [patent_app_number] => 10/743007 [patent_app_country] => US [patent_app_date] => 2003-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 41 [patent_no_of_words] => 8575 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/267/07267911.pdf [firstpage_image] =>[orig_patent_app_number] => 10743007 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/743007
Stencil mask and its manufacturing method Dec 22, 2003 Issued
Array ( [id] => 5215948 [patent_doc_number] => 20070105029 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-10 [patent_title] => 'Differential critical dimension and overlay metrology apparatus and measurement method' [patent_app_type] => utility [patent_app_number] => 10/596614 [patent_app_country] => US [patent_app_date] => 2003-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 57 [patent_figures_cnt] => 57 [patent_no_of_words] => 27080 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0105/20070105029.pdf [firstpage_image] =>[orig_patent_app_number] => 10596614 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/596614
Differential critical dimension and overlay metrology apparatus and measurement method Dec 18, 2003 Issued
Array ( [id] => 686421 [patent_doc_number] => 07078136 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-07-18 [patent_title] => 'Thermally-generated mask pattern' [patent_app_type] => utility [patent_app_number] => 10/737551 [patent_app_country] => US [patent_app_date] => 2003-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 1715 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/078/07078136.pdf [firstpage_image] =>[orig_patent_app_number] => 10737551 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/737551
Thermally-generated mask pattern Dec 14, 2003 Issued
Array ( [id] => 744043 [patent_doc_number] => 07026082 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-04-11 [patent_title] => 'Method for determining parameters for lithographic projection, a computer system and computer program therefor, a method of manufacturing a device and a device manufactured thereby' [patent_app_type] => utility [patent_app_number] => 10/727034 [patent_app_country] => US [patent_app_date] => 2003-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 6396 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/026/07026082.pdf [firstpage_image] =>[orig_patent_app_number] => 10727034 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/727034
Method for determining parameters for lithographic projection, a computer system and computer program therefor, a method of manufacturing a device and a device manufactured thereby Dec 3, 2003 Issued
Array ( [id] => 7143511 [patent_doc_number] => 20050118514 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-02 [patent_title] => 'Method of the adjustable matching map system in lithography' [patent_app_type] => utility [patent_app_number] => 10/725810 [patent_app_country] => US [patent_app_date] => 2003-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9141 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0118/20050118514.pdf [firstpage_image] =>[orig_patent_app_number] => 10725810 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/725810
Method of the adjustable matching map system in lithography Dec 1, 2003 Issued
Array ( [id] => 507648 [patent_doc_number] => 07198873 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-04-03 [patent_title] => 'Lithographic processing optimization based on hypersampled correlations' [patent_app_type] => utility [patent_app_number] => 10/715109 [patent_app_country] => US [patent_app_date] => 2003-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 5810 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/198/07198873.pdf [firstpage_image] =>[orig_patent_app_number] => 10715109 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/715109
Lithographic processing optimization based on hypersampled correlations Nov 17, 2003 Issued
Array ( [id] => 7287540 [patent_doc_number] => 20040109165 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-06-10 [patent_title] => 'Automated overlay metrology system' [patent_app_type] => new [patent_app_number] => 10/704979 [patent_app_country] => US [patent_app_date] => 2003-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4235 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20040109165.pdf [firstpage_image] =>[orig_patent_app_number] => 10704979 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/704979
Automated overlay metrology system Nov 11, 2003 Issued
Array ( [id] => 7421236 [patent_doc_number] => 20040229169 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-11-18 [patent_title] => 'Dual layer workpiece masking and manufacturing process' [patent_app_type] => new [patent_app_number] => 10/704957 [patent_app_country] => US [patent_app_date] => 2003-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 9557 [patent_no_of_claims] => 72 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0229/20040229169.pdf [firstpage_image] =>[orig_patent_app_number] => 10704957 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/704957
Dual layer workpiece masking and manufacturing process Nov 9, 2003 Issued
Array ( [id] => 7459664 [patent_doc_number] => 20040094847 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-05-20 [patent_title] => 'Multi-layered semiconductor structure' [patent_app_type] => new [patent_app_number] => 10/704449 [patent_app_country] => US [patent_app_date] => 2003-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2933 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0094/20040094847.pdf [firstpage_image] =>[orig_patent_app_number] => 10704449 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/704449
Multi-layered semiconductor structure Nov 6, 2003 Issued
Array ( [id] => 744102 [patent_doc_number] => 07026098 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-04-11 [patent_title] => 'Electron beam lithography method' [patent_app_type] => utility [patent_app_number] => 10/700626 [patent_app_country] => US [patent_app_date] => 2003-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4382 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/026/07026098.pdf [firstpage_image] =>[orig_patent_app_number] => 10700626 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/700626
Electron beam lithography method Nov 4, 2003 Issued
Array ( [id] => 563450 [patent_doc_number] => 07465523 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-12-16 [patent_title] => 'Method for manufacturing transfer mask substrate, transfer mask substrate, and transfer mask' [patent_app_type] => utility [patent_app_number] => 10/506116 [patent_app_country] => US [patent_app_date] => 2003-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4280 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/465/07465523.pdf [firstpage_image] =>[orig_patent_app_number] => 10506116 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/506116
Method for manufacturing transfer mask substrate, transfer mask substrate, and transfer mask Nov 4, 2003 Issued
Array ( [id] => 757093 [patent_doc_number] => 07014959 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-21 [patent_title] => 'CD uniformity of chrome etch to photomask process' [patent_app_type] => utility [patent_app_number] => 10/605801 [patent_app_country] => US [patent_app_date] => 2003-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 17 [patent_no_of_words] => 4357 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/014/07014959.pdf [firstpage_image] =>[orig_patent_app_number] => 10605801 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/605801
CD uniformity of chrome etch to photomask process Oct 27, 2003 Issued
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