Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 757095 [patent_doc_number] => 07014960 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-21 [patent_title] => 'Chelation cleaning process for repairing photomasks' [patent_app_type] => utility [patent_app_number] => 10/635982 [patent_app_country] => US [patent_app_date] => 2003-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1349 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/014/07014960.pdf [firstpage_image] =>[orig_patent_app_number] => 10635982 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/635982
Chelation cleaning process for repairing photomasks Aug 6, 2003 Issued
Array ( [id] => 931018 [patent_doc_number] => 06979522 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-12-27 [patent_title] => 'Method for exposing at least one or at least two semiconductor wafers' [patent_app_type] => utility [patent_app_number] => 10/635583 [patent_app_country] => US [patent_app_date] => 2003-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3884 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/979/06979522.pdf [firstpage_image] =>[orig_patent_app_number] => 10635583 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/635583
Method for exposing at least one or at least two semiconductor wafers Aug 5, 2003 Issued
Array ( [id] => 5692577 [patent_doc_number] => 20060152723 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-13 [patent_title] => 'Complementary division mask having alignment mark, method for forming alignment mark of the complementary division mask, semiconductor device manufactured by using the complementary division mask, and its manufacturing method' [patent_app_type] => utility [patent_app_number] => 10/523563 [patent_app_country] => US [patent_app_date] => 2003-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4522 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20060152723.pdf [firstpage_image] =>[orig_patent_app_number] => 10523563 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/523563
Complementary division mask having alignment mark, method for forming alignment mark of the complementary division mask, semiconductor device manufactured by using the complementary division mask, and its manufacturing method Aug 4, 2003 Abandoned
Array ( [id] => 7381011 [patent_doc_number] => 20040029028 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-02-12 [patent_title] => 'Method for measuring gap between mask and substrate of display panel' [patent_app_type] => new [patent_app_number] => 10/633716 [patent_app_country] => US [patent_app_date] => 2003-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5123 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0029/20040029028.pdf [firstpage_image] =>[orig_patent_app_number] => 10633716 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/633716
Method for measuring gap between mask and substrate of display panel Aug 4, 2003 Issued
Array ( [id] => 7033495 [patent_doc_number] => 20050032004 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-10 [patent_title] => 'Method of controlling removal of photoresist in openings of a photoresist mask' [patent_app_type] => utility [patent_app_number] => 10/633602 [patent_app_country] => US [patent_app_date] => 2003-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3200 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0032/20050032004.pdf [firstpage_image] =>[orig_patent_app_number] => 10633602 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/633602
Method of controlling removal of photoresist in openings of a photoresist mask Aug 3, 2003 Issued
Array ( [id] => 520249 [patent_doc_number] => 07186486 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-06 [patent_title] => 'Method to pattern a substrate' [patent_app_type] => utility [patent_app_number] => 10/634152 [patent_app_country] => US [patent_app_date] => 2003-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2786 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/186/07186486.pdf [firstpage_image] =>[orig_patent_app_number] => 10634152 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/634152
Method to pattern a substrate Aug 3, 2003 Issued
Array ( [id] => 7443697 [patent_doc_number] => 20040066963 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-08 [patent_title] => 'Method of inspecting a mask' [patent_app_type] => new [patent_app_number] => 10/631082 [patent_app_country] => US [patent_app_date] => 2003-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1345 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20040066963.pdf [firstpage_image] =>[orig_patent_app_number] => 10631082 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/631082
Method of inspecting a mask Jul 30, 2003 Issued
Array ( [id] => 7397842 [patent_doc_number] => 20040023133 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-02-05 [patent_title] => 'Photoresist pattern and forming method thereof' [patent_app_type] => new [patent_app_number] => 10/628919 [patent_app_country] => US [patent_app_date] => 2003-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5020 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0023/20040023133.pdf [firstpage_image] =>[orig_patent_app_number] => 10628919 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/628919
Photoresist pattern and forming method thereof Jul 28, 2003 Abandoned
Array ( [id] => 7373802 [patent_doc_number] => 20040219442 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-11-04 [patent_title] => 'Exposure system and method with group compensation' [patent_app_type] => new [patent_app_number] => 10/629030 [patent_app_country] => US [patent_app_date] => 2003-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1558 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20040219442.pdf [firstpage_image] =>[orig_patent_app_number] => 10629030 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/629030
Exposure system and method with group compensation Jul 27, 2003 Issued
Array ( [id] => 7313767 [patent_doc_number] => 20040222187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-11-11 [patent_title] => 'METHOD OF FABRICATING POLYSILICON FILM BY EXCIMER LASER CRYSTALLIZATION PROCESS' [patent_app_type] => new [patent_app_number] => 10/604485 [patent_app_country] => US [patent_app_date] => 2003-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 2785 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0222/20040222187.pdf [firstpage_image] =>[orig_patent_app_number] => 10604485 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/604485
Method of fabricating polysilicon film by excimer laser crystallization process Jul 24, 2003 Issued
Array ( [id] => 7025303 [patent_doc_number] => 20050019697 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-27 [patent_title] => 'Method of treating wafers with photoresist to perform metrology analysis using large current e-beam systems' [patent_app_type] => utility [patent_app_number] => 10/626355 [patent_app_country] => US [patent_app_date] => 2003-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3169 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20050019697.pdf [firstpage_image] =>[orig_patent_app_number] => 10626355 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/626355
Method of treating wafers with photoresist to perform metrology analysis using large current e-beam systems Jul 23, 2003 Abandoned
Array ( [id] => 7270018 [patent_doc_number] => 20040058536 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-03-25 [patent_title] => 'Electron beam lithography method' [patent_app_type] => new [patent_app_number] => 10/623612 [patent_app_country] => US [patent_app_date] => 2003-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3500 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0058/20040058536.pdf [firstpage_image] =>[orig_patent_app_number] => 10623612 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/623612
Electron beam lithography method Jul 21, 2003 Issued
Array ( [id] => 7219174 [patent_doc_number] => 20040072104 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-15 [patent_title] => 'Method for forming ultra fine contact holes in semiconductor devices' [patent_app_type] => new [patent_app_number] => 10/623419 [patent_app_country] => US [patent_app_date] => 2003-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1393 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20040072104.pdf [firstpage_image] =>[orig_patent_app_number] => 10623419 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/623419
Method for forming ultra fine contact holes in semiconductor devices Jul 17, 2003 Issued
Array ( [id] => 7677837 [patent_doc_number] => 20040151989 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-05 [patent_title] => 'Photo mask, method of manufacturing electronic device, and method of manufacturing photo mask' [patent_app_type] => new [patent_app_number] => 10/620367 [patent_app_country] => US [patent_app_date] => 2003-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4231 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0151/20040151989.pdf [firstpage_image] =>[orig_patent_app_number] => 10620367 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/620367
Photo mask, method of manufacturing electronic device, and method of manufacturing photo mask Jul 16, 2003 Abandoned
Array ( [id] => 1150963 [patent_doc_number] => 06767691 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-07-27 [patent_title] => 'Scattering-reticle assemblies for electron-beam microlithography including a scattering-stencil reticle portion and a scattering-membrane reticle portion' [patent_app_type] => B2 [patent_app_number] => 10/622529 [patent_app_country] => US [patent_app_date] => 2003-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 4106 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/767/06767691.pdf [firstpage_image] =>[orig_patent_app_number] => 10622529 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/622529
Scattering-reticle assemblies for electron-beam microlithography including a scattering-stencil reticle portion and a scattering-membrane reticle portion Jul 16, 2003 Issued
Array ( [id] => 7396920 [patent_doc_number] => 20040018449 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-01-29 [patent_title] => 'Method of manufacturing member pattern, method of manufacturing wiring structure, method of manufacturing electron source, and method of manufacturing image display device' [patent_app_type] => new [patent_app_number] => 10/619575 [patent_app_country] => US [patent_app_date] => 2003-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 11014 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20040018449.pdf [firstpage_image] =>[orig_patent_app_number] => 10619575 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/619575
Method of manufacturing member pattern, method of manufacturing wiring structure, method of manufacturing electron source, and method of manufacturing image display device Jul 15, 2003 Issued
Array ( [id] => 7088832 [patent_doc_number] => 20050008944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-13 [patent_title] => 'Defect inspection of extreme ultraviolet lithography masks and the like' [patent_app_type] => utility [patent_app_number] => 10/616863 [patent_app_country] => US [patent_app_date] => 2003-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4669 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20050008944.pdf [firstpage_image] =>[orig_patent_app_number] => 10616863 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/616863
Defect inspection of extreme ultraviolet lithography masks and the like Jul 9, 2003 Issued
Array ( [id] => 520242 [patent_doc_number] => 07186485 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-06 [patent_title] => 'Inspection method and a photomask' [patent_app_type] => utility [patent_app_number] => 10/615228 [patent_app_country] => US [patent_app_date] => 2003-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 30 [patent_no_of_words] => 9991 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/186/07186485.pdf [firstpage_image] =>[orig_patent_app_number] => 10615228 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/615228
Inspection method and a photomask Jul 8, 2003 Issued
Array ( [id] => 7607767 [patent_doc_number] => 07097946 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-29 [patent_title] => 'Photomask, method of manufacturing a photomask, and method of manufacturing an electronic product' [patent_app_type] => utility [patent_app_number] => 10/615194 [patent_app_country] => US [patent_app_date] => 2003-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 13 [patent_no_of_words] => 7952 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/097/07097946.pdf [firstpage_image] =>[orig_patent_app_number] => 10615194 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/615194
Photomask, method of manufacturing a photomask, and method of manufacturing an electronic product Jul 8, 2003 Issued
Array ( [id] => 7269738 [patent_doc_number] => 20040058256 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-03-25 [patent_title] => 'Dose monitoring method and manufacturing method of semiconductor device' [patent_app_type] => new [patent_app_number] => 10/611247 [patent_app_country] => US [patent_app_date] => 2003-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7658 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0058/20040058256.pdf [firstpage_image] =>[orig_patent_app_number] => 10611247 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/611247
Dose monitoring method and manufacturing method of semiconductor device Jul 1, 2003 Issued
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