Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7342882 [patent_doc_number] => 20040191640 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-30 [patent_title] => 'Nanopastes for use as patterning compositions' [patent_app_type] => new [patent_app_number] => 10/400715 [patent_app_country] => US [patent_app_date] => 2003-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6904 [patent_no_of_claims] => 91 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 13 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0191/20040191640.pdf [firstpage_image] =>[orig_patent_app_number] => 10400715 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/400715
Nanopastes for use as patterning compositions Mar 26, 2003 Issued
Array ( [id] => 6769784 [patent_doc_number] => 20030215724 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-11-20 [patent_title] => 'Monitoring method, exposure method, a manufacturing method for a semiconductor device, including an etching method and exposure processing unit' [patent_app_type] => new [patent_app_number] => 10/394047 [patent_app_country] => US [patent_app_date] => 2003-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 30 [patent_no_of_words] => 14219 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0215/20030215724.pdf [firstpage_image] =>[orig_patent_app_number] => 10394047 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/394047
Monitoring method, exposure method, a manufacturing method for a semiconductor device, including an etching method and exposure processing unit Mar 23, 2003 Issued
Array ( [id] => 749093 [patent_doc_number] => 07022438 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-04-04 [patent_title] => 'Photomask for forming small contact hole array and methods of fabricating and using the same' [patent_app_type] => utility [patent_app_number] => 10/392590 [patent_app_country] => US [patent_app_date] => 2003-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 21 [patent_no_of_words] => 4844 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/022/07022438.pdf [firstpage_image] =>[orig_patent_app_number] => 10392590 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/392590
Photomask for forming small contact hole array and methods of fabricating and using the same Mar 19, 2003 Issued
Array ( [id] => 6829575 [patent_doc_number] => 20030180633 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-25 [patent_title] => 'Mask pattern forming method and patterning method using the mask pattern' [patent_app_type] => new [patent_app_number] => 10/391799 [patent_app_country] => US [patent_app_date] => 2003-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 17811 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0180/20030180633.pdf [firstpage_image] =>[orig_patent_app_number] => 10391799 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/391799
Mask pattern forming method and patterning method using the mask pattern Mar 19, 2003 Issued
Array ( [id] => 1202412 [patent_doc_number] => 06720117 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-04-13 [patent_title] => 'Exposure mask with appended mask error data' [patent_app_type] => B2 [patent_app_number] => 10/390670 [patent_app_country] => US [patent_app_date] => 2003-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 6020 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/720/06720117.pdf [firstpage_image] =>[orig_patent_app_number] => 10390670 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/390670
Exposure mask with appended mask error data Mar 18, 2003 Issued
Array ( [id] => 612577 [patent_doc_number] => 07147973 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-12-12 [patent_title] => 'Method to recover the exposure sensitivity of chemically amplified resins from post coat delay effect' [patent_app_type] => utility [patent_app_number] => 10/391708 [patent_app_country] => US [patent_app_date] => 2003-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 4161 [patent_no_of_claims] => 47 [patent_no_of_ind_claims] => 30 [patent_words_short_claim] => 34 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/147/07147973.pdf [firstpage_image] =>[orig_patent_app_number] => 10391708 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/391708
Method to recover the exposure sensitivity of chemically amplified resins from post coat delay effect Mar 18, 2003 Issued
Array ( [id] => 6938918 [patent_doc_number] => 20050112481 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-26 [patent_title] => 'Exposure method and apparatus' [patent_app_type] => utility [patent_app_number] => 10/390766 [patent_app_country] => US [patent_app_date] => 2003-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4781 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0112/20050112481.pdf [firstpage_image] =>[orig_patent_app_number] => 10390766 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/390766
Exposure method and apparatus Mar 18, 2003 Abandoned
Array ( [id] => 7072626 [patent_doc_number] => 20050145892 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-07 [patent_title] => 'Mask, semiconductor device manufacturing method, and semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/506147 [patent_app_country] => US [patent_app_date] => 2003-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 6662 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0145/20050145892.pdf [firstpage_image] =>[orig_patent_app_number] => 10506147 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/506147
Mask, semiconductor device manufacturing method, and semiconductor device Mar 12, 2003 Abandoned
Array ( [id] => 913854 [patent_doc_number] => 07326501 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-05 [patent_title] => 'Method for correcting focus-dependent line shifts in printing with sidewall chrome alternating aperture masks (SCAAM)' [patent_app_type] => utility [patent_app_number] => 10/386141 [patent_app_country] => US [patent_app_date] => 2003-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 1439 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/326/07326501.pdf [firstpage_image] =>[orig_patent_app_number] => 10386141 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/386141
Method for correcting focus-dependent line shifts in printing with sidewall chrome alternating aperture masks (SCAAM) Mar 9, 2003 Issued
Array ( [id] => 6796726 [patent_doc_number] => 20030175600 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-18 [patent_title] => 'Photomask, method for manufacturing the same, and method for measuring optical characteristics of wafer exposure system using the photomask during operation' [patent_app_type] => new [patent_app_number] => 10/383192 [patent_app_country] => US [patent_app_date] => 2003-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4781 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0175/20030175600.pdf [firstpage_image] =>[orig_patent_app_number] => 10383192 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/383192
Photomask, method for manufacturing the same, and method for measuring optical characteristics of wafer exposure system using the photomask during operation Mar 5, 2003 Issued
Array ( [id] => 390133 [patent_doc_number] => 07300728 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-27 [patent_title] => 'Processor unit with provision for automated control of processing parameters' [patent_app_type] => utility [patent_app_number] => 10/376500 [patent_app_country] => US [patent_app_date] => 2003-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3648 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/300/07300728.pdf [firstpage_image] =>[orig_patent_app_number] => 10376500 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/376500
Processor unit with provision for automated control of processing parameters Mar 2, 2003 Issued
Array ( [id] => 1192690 [patent_doc_number] => 06730458 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-05-04 [patent_title] => 'Method for forming fine patterns through effective glass transition temperature reduction' [patent_app_type] => B1 [patent_app_number] => 10/376604 [patent_app_country] => US [patent_app_date] => 2003-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 4981 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/730/06730458.pdf [firstpage_image] =>[orig_patent_app_number] => 10376604 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/376604
Method for forming fine patterns through effective glass transition temperature reduction Mar 2, 2003 Issued
Array ( [id] => 6740047 [patent_doc_number] => 20030157416 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-08-21 [patent_title] => 'MICRO DEVICES MANUFACTURING METHOD UTILIZING CONCAVE AND CONVEX ALIGNMENT MARK PATTERNS' [patent_app_type] => new [patent_app_number] => 10/375012 [patent_app_country] => US [patent_app_date] => 2003-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 10075 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20030157416.pdf [firstpage_image] =>[orig_patent_app_number] => 10375012 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/375012
Micro devices manufacturing method utilizing concave and convex alignment mark patterns Feb 27, 2003 Issued
Array ( [id] => 946500 [patent_doc_number] => 06964832 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-15 [patent_title] => 'Semiconductor device and manufacturing method thereof' [patent_app_type] => utility [patent_app_number] => 10/374096 [patent_app_country] => US [patent_app_date] => 2003-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 66 [patent_no_of_words] => 9144 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/964/06964832.pdf [firstpage_image] =>[orig_patent_app_number] => 10374096 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/374096
Semiconductor device and manufacturing method thereof Feb 26, 2003 Issued
Array ( [id] => 6701382 [patent_doc_number] => 20030224262 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-12-04 [patent_title] => 'Calibration methods, calibration substrates, lithographic apparatus and device manufacturing methods' [patent_app_type] => new [patent_app_number] => 10/374510 [patent_app_country] => US [patent_app_date] => 2003-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9664 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 13 [patent_words_short_claim] => 34 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0224/20030224262.pdf [firstpage_image] =>[orig_patent_app_number] => 10374510 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/374510
Calibration methods, calibration substrates, lithographic apparatus and device manufacturing methods Feb 26, 2003 Issued
Array ( [id] => 7210155 [patent_doc_number] => 20050053844 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-10 [patent_title] => 'Gray scale all-glass photomasks' [patent_app_type] => utility [patent_app_number] => 10/374669 [patent_app_country] => US [patent_app_date] => 2003-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 29 [patent_no_of_words] => 41775 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0053/20050053844.pdf [firstpage_image] =>[orig_patent_app_number] => 10374669 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/374669
Gray scale all-glass photomasks Feb 24, 2003 Abandoned
Array ( [id] => 1140580 [patent_doc_number] => 06777146 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-08-17 [patent_title] => 'Method of optical proximity correction with sub-resolution assists' [patent_app_type] => B1 [patent_app_number] => 10/248815 [patent_app_country] => US [patent_app_date] => 2003-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 16 [patent_no_of_words] => 5744 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/777/06777146.pdf [firstpage_image] =>[orig_patent_app_number] => 10248815 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/248815
Method of optical proximity correction with sub-resolution assists Feb 20, 2003 Issued
Array ( [id] => 690156 [patent_doc_number] => 07074524 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-07-11 [patent_title] => 'Photomask, method for detecting pattern defect of the same, and method for making pattern using the same' [patent_app_type] => utility [patent_app_number] => 10/367859 [patent_app_country] => US [patent_app_date] => 2003-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 22 [patent_no_of_words] => 5531 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/074/07074524.pdf [firstpage_image] =>[orig_patent_app_number] => 10367859 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/367859
Photomask, method for detecting pattern defect of the same, and method for making pattern using the same Feb 18, 2003 Issued
Array ( [id] => 6842873 [patent_doc_number] => 20030148220 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-08-07 [patent_title] => 'Technique of exposing a resist using electron beams having different accelerating voltages, and method of manufacturing a photomask using the technique' [patent_app_type] => new [patent_app_number] => 10/367705 [patent_app_country] => US [patent_app_date] => 2003-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3943 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 204 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20030148220.pdf [firstpage_image] =>[orig_patent_app_number] => 10367705 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/367705
Technique of exposing a resist using electron beams having different accelerating voltages Feb 18, 2003 Issued
Array ( [id] => 996422 [patent_doc_number] => 06913861 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-07-05 [patent_title] => 'Method of observing exposure condition for exposing semiconductor device and its apparatus and method of manufacturing semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/370369 [patent_app_country] => US [patent_app_date] => 2003-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 62 [patent_no_of_words] => 15048 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/913/06913861.pdf [firstpage_image] =>[orig_patent_app_number] => 10370369 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/370369
Method of observing exposure condition for exposing semiconductor device and its apparatus and method of manufacturing semiconductor device Feb 17, 2003 Issued
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