Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 941181 [patent_doc_number] => 06969571 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-29 [patent_title] => 'Exposure method using complementary divided mask, exposure apparatus, semiconductor device, and method of producing the same' [patent_app_type] => utility [patent_app_number] => 10/467385 [patent_app_country] => US [patent_app_date] => 2002-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 20 [patent_no_of_words] => 7358 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/969/06969571.pdf [firstpage_image] =>[orig_patent_app_number] => 10467385 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/467385
Exposure method using complementary divided mask, exposure apparatus, semiconductor device, and method of producing the same Nov 28, 2002 Issued
Array ( [id] => 6729951 [patent_doc_number] => 20030186141 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-10-02 [patent_title] => 'Multi-exposure lithography method and system providing increased overlay accuracy' [patent_app_type] => new [patent_app_number] => 10/305681 [patent_app_country] => US [patent_app_date] => 2002-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3970 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20030186141.pdf [firstpage_image] =>[orig_patent_app_number] => 10305681 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/305681
Multi-exposure lithography method and system providing increased overlay accuracy Nov 26, 2002 Issued
Array ( [id] => 6645485 [patent_doc_number] => 20030104287 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-06-05 [patent_title] => 'Method of manufacturing mask for electron beam lithography and mask blank for electron beam lithography' [patent_app_type] => new [patent_app_number] => 10/303847 [patent_app_country] => US [patent_app_date] => 2002-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8636 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0104/20030104287.pdf [firstpage_image] =>[orig_patent_app_number] => 10303847 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/303847
Method of manufacturing mask for electron beam lithography and mask blank for electron beam lithography Nov 25, 2002 Issued
Array ( [id] => 1046630 [patent_doc_number] => 06864024 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-03-08 [patent_title] => 'Real-time control of chemically-amplified resist processing on wafer' [patent_app_type] => utility [patent_app_number] => 10/302225 [patent_app_country] => US [patent_app_date] => 2002-11-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5240 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/864/06864024.pdf [firstpage_image] =>[orig_patent_app_number] => 10302225 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/302225
Real-time control of chemically-amplified resist processing on wafer Nov 21, 2002 Issued
Array ( [id] => 1286483 [patent_doc_number] => 06635396 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-10-21 [patent_title] => 'Method for providing an alignment diffraction grating for photolithographic alignment during semiconductor fabrication' [patent_app_type] => B2 [patent_app_number] => 10/301088 [patent_app_country] => US [patent_app_date] => 2002-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 31 [patent_no_of_words] => 5553 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/635/06635396.pdf [firstpage_image] =>[orig_patent_app_number] => 10301088 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/301088
Method for providing an alignment diffraction grating for photolithographic alignment during semiconductor fabrication Nov 20, 2002 Issued
Array ( [id] => 671940 [patent_doc_number] => 07090948 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-15 [patent_title] => 'Reflection mask and method for fabricating the reflection mask' [patent_app_type] => utility [patent_app_number] => 10/298429 [patent_app_country] => US [patent_app_date] => 2002-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 15 [patent_no_of_words] => 4172 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/090/07090948.pdf [firstpage_image] =>[orig_patent_app_number] => 10298429 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/298429
Reflection mask and method for fabricating the reflection mask Nov 17, 2002 Issued
Array ( [id] => 1098887 [patent_doc_number] => 06818365 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-11-16 [patent_title] => 'Feed forward leveling' [patent_app_type] => B2 [patent_app_number] => 10/295489 [patent_app_country] => US [patent_app_date] => 2002-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 4421 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/818/06818365.pdf [firstpage_image] =>[orig_patent_app_number] => 10295489 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/295489
Feed forward leveling Nov 14, 2002 Issued
Array ( [id] => 7381571 [patent_doc_number] => 20040081897 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-29 [patent_title] => 'Complementary mask, fabrication method thereof, exposure method, semiconductor device, and fabrication method thereof' [patent_app_type] => new [patent_app_number] => 10/466041 [patent_app_country] => US [patent_app_date] => 2003-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 6541 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0081/20040081897.pdf [firstpage_image] =>[orig_patent_app_number] => 10466041 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/466041
Complementary masks and method of fabrication of same, exposure method, and semiconductor device and method of production of same Nov 11, 2002 Issued
Array ( [id] => 1024322 [patent_doc_number] => 06884552 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-04-26 [patent_title] => 'Focus masking structures, focus patterns and measurements thereof' [patent_app_type] => utility [patent_app_number] => 10/291181 [patent_app_country] => US [patent_app_date] => 2002-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 35 [patent_no_of_words] => 16525 [patent_no_of_claims] => 53 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/884/06884552.pdf [firstpage_image] =>[orig_patent_app_number] => 10291181 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/291181
Focus masking structures, focus patterns and measurements thereof Nov 6, 2002 Issued
Array ( [id] => 488565 [patent_doc_number] => 07214452 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-05-08 [patent_title] => 'Using perfluoropoly-ethers to form pellicles' [patent_app_type] => utility [patent_app_number] => 10/289611 [patent_app_country] => US [patent_app_date] => 2002-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 902 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 14 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/214/07214452.pdf [firstpage_image] =>[orig_patent_app_number] => 10289611 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/289611
Using perfluoropoly-ethers to form pellicles Nov 6, 2002 Issued
Array ( [id] => 7323361 [patent_doc_number] => 20040137378 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-07-15 [patent_title] => 'Agent for forming coating for narrowing patterns and method for forming fine pattern using the same' [patent_app_type] => new [patent_app_number] => 10/471772 [patent_app_country] => US [patent_app_date] => 2004-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5776 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0137/20040137378.pdf [firstpage_image] =>[orig_patent_app_number] => 10471772 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/471772
Agent for forming coating for narrowing patterns and method for forming fine pattern using the same Nov 4, 2002 Issued
Array ( [id] => 6782860 [patent_doc_number] => 20030064307 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-03 [patent_title] => 'Process for forming latent image, process for detecting latent image, process and device for exposure, exposure apparatus, resist and substrate' [patent_app_type] => new [patent_app_number] => 10/287632 [patent_app_country] => US [patent_app_date] => 2002-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 10989 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 19 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0064/20030064307.pdf [firstpage_image] =>[orig_patent_app_number] => 10287632 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/287632
Process for forming latent image, process for detecting latent image, process and device for exposure, exposure apparatus, resist and substrate Nov 4, 2002 Abandoned
Array ( [id] => 1037359 [patent_doc_number] => 06872507 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-03-29 [patent_title] => 'Radiation correction method for electron beam lithography' [patent_app_type] => utility [patent_app_number] => 10/286231 [patent_app_country] => US [patent_app_date] => 2002-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 4400 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 23 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/872/06872507.pdf [firstpage_image] =>[orig_patent_app_number] => 10286231 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/286231
Radiation correction method for electron beam lithography Oct 31, 2002 Issued
Array ( [id] => 6796732 [patent_doc_number] => 20030175606 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-18 [patent_title] => 'Photoreceptor, method of evaluating a photoreceptor, and method of producing the photoreceptor' [patent_app_type] => new [patent_app_number] => 10/283283 [patent_app_country] => US [patent_app_date] => 2002-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 35161 [patent_no_of_claims] => 105 [patent_no_of_ind_claims] => 21 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0175/20030175606.pdf [firstpage_image] =>[orig_patent_app_number] => 10283283 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/283283
Photoreceptor, method of evaluating a photoreceptor, and method of producing the photoreceptor Oct 29, 2002 Issued
Array ( [id] => 999439 [patent_doc_number] => 06911287 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-06-28 [patent_title] => 'Method and apparatus for measuring process errors and method and apparatus for measuring overlay using the same' [patent_app_type] => utility [patent_app_number] => 10/278801 [patent_app_country] => US [patent_app_date] => 2002-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 5262 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/911/06911287.pdf [firstpage_image] =>[orig_patent_app_number] => 10278801 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/278801
Method and apparatus for measuring process errors and method and apparatus for measuring overlay using the same Oct 23, 2002 Issued
Array ( [id] => 1043541 [patent_doc_number] => 06866974 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-03-15 [patent_title] => 'Semiconductor process using delay-compensated exposure' [patent_app_type] => utility [patent_app_number] => 10/274081 [patent_app_country] => US [patent_app_date] => 2002-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 1806 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/866/06866974.pdf [firstpage_image] =>[orig_patent_app_number] => 10274081 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/274081
Semiconductor process using delay-compensated exposure Oct 20, 2002 Issued
Array ( [id] => 740436 [patent_doc_number] => 07029800 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-04-18 [patent_title] => 'Reticle with antistatic coating' [patent_app_type] => utility [patent_app_number] => 10/273682 [patent_app_country] => US [patent_app_date] => 2002-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 2689 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/029/07029800.pdf [firstpage_image] =>[orig_patent_app_number] => 10273682 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/273682
Reticle with antistatic coating Oct 17, 2002 Issued
Array ( [id] => 6796749 [patent_doc_number] => 20030175623 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-18 [patent_title] => 'Method for forming resist pattern' [patent_app_type] => new [patent_app_number] => 10/271555 [patent_app_country] => US [patent_app_date] => 2002-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3053 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0175/20030175623.pdf [firstpage_image] =>[orig_patent_app_number] => 10271555 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/271555
Method for forming resist pattern Oct 16, 2002 Issued
Array ( [id] => 7448351 [patent_doc_number] => 20040067448 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-08 [patent_title] => 'Methods for measuring photoresist dimensions' [patent_app_type] => new [patent_app_number] => 10/264521 [patent_app_country] => US [patent_app_date] => 2002-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2572 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20040067448.pdf [firstpage_image] =>[orig_patent_app_number] => 10264521 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/264521
Methods for measuring photoresist dimensions Oct 4, 2002 Issued
Array ( [id] => 951213 [patent_doc_number] => 06960415 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-01 [patent_title] => 'Aberration measuring method and projection exposure apparatus' [patent_app_type] => utility [patent_app_number] => 10/260278 [patent_app_country] => US [patent_app_date] => 2002-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 46 [patent_no_of_words] => 9232 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/960/06960415.pdf [firstpage_image] =>[orig_patent_app_number] => 10260278 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/260278
Aberration measuring method and projection exposure apparatus Sep 30, 2002 Issued
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