Christopher G. Young

Array ( [id] => 753838 [patent_doc_number] => 07018747 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-28 [patent_title] => 'Photomask having line end phase anchors' [patent_app_type] => utility [patent_app_number] => 10/261905 [patent_app_country] => US [patent_app_date] => 2002-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 23 [patent_no_of_words] => 4075 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/018/07018747.pdf [firstpage_image] =>[orig_patent_app_number] => 10261905 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1098871 [patent_doc_number] => 06818360 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-11-16 [patent_title] => 'Quartz mask crack monitor system for reticle by acoustic and/or laser scatterometry' [patent_app_type] => B1 [patent_app_number] => 10/261571 [patent_app_country] => US [patent_app_date] => 2002-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 21 [patent_no_of_words] => 11368 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/818/06818360.pdf [firstpage_image] =>[orig_patent_app_number] => 10261571 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6715717 [patent_doc_number] => 20030027065 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-02-06 [patent_title] => 'Mask for measuring optical aberration and method of measuring optical aberration' [patent_app_type] => new [patent_app_number] => 10/255700 [patent_app_country] => US [patent_app_date] => 2002-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 29714 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 210 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0027/20030027065.pdf [firstpage_image] =>[orig_patent_app_number] => 10255700 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7376915 [patent_doc_number] => 20040028269 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-02-12 [patent_title] => 'Photomask unit, photomask device, projection exposure device, projection exposure method and semiconductor device' [patent_app_type] => new [patent_app_number] => 10/239657 [patent_app_country] => US [patent_app_date] => 2002-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4401 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 20 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20040028269.pdf [firstpage_image] =>[orig_patent_app_number] => 10239657 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 777083 [patent_doc_number] => 06998216 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-02-14 [patent_title] => 'Mechanically robust interconnect for low-k dielectric material using post treatment' [patent_app_type] => utility [patent_app_number] => 10/253723 [patent_app_country] => US [patent_app_date] => 2002-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 20 [patent_no_of_words] => 4396 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/998/06998216.pdf [firstpage_image] =>[orig_patent_app_number] => 10253723 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1188705 [patent_doc_number] => 06733936 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-05-11 [patent_title] => 'Method for generating a swing curve and photoresist feature formed using swing curve' [patent_app_type] => B1 [patent_app_number] => 10/247877 [patent_app_country] => US [patent_app_date] => 2002-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5244 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/733/06733936.pdf [firstpage_image] =>[orig_patent_app_number] => 10247877 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1049904 [patent_doc_number] => 06861181 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-03-01 [patent_title] => 'Photomask and method for evaluating an initial calibration for a scanning electron microscope' [patent_app_type] => utility [patent_app_number] => 10/247426 [patent_app_country] => US [patent_app_date] => 2002-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 11363 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/861/06861181.pdf [firstpage_image] =>[orig_patent_app_number] => 10247426 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6632172 [patent_doc_number] => 20030211411 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-11-13 [patent_title] => 'Method for monitoring focus in lithography' [patent_app_type] => new [patent_app_number] => 10/244735 [patent_app_country] => US [patent_app_date] => 2002-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1725 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0211/20030211411.pdf [firstpage_image] =>[orig_patent_app_number] => 10244735 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7462658 [patent_doc_number] => 20040053169 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-03-18 [patent_title] => 'Process and apparatus for minimizing thermal gradients across an advanced lithographic mask' [patent_app_type] => new [patent_app_number] => 10/065095 [patent_app_country] => US [patent_app_date] => 2002-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2815 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0053/20040053169.pdf [firstpage_image] =>[orig_patent_app_number] => 10065095 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6778465 [patent_doc_number] => 20030049546 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-13 [patent_title] => 'Charged-particle-beam microlithography reticles including exposure alignment marks associated with individual subfields' [patent_app_type] => new [patent_app_number] => 10/236780 [patent_app_country] => US [patent_app_date] => 2002-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3860 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0049/20030049546.pdf [firstpage_image] =>[orig_patent_app_number] => 10236780 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6790021 [patent_doc_number] => 20030085365 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-05-08 [patent_title] => 'Methods and devices for evaluating imaging characteristics of a charged-particle-beam microlithography system' [patent_app_type] => new [patent_app_number] => 10/236681 [patent_app_country] => US [patent_app_date] => 2002-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5354 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20030085365.pdf [firstpage_image] =>[orig_patent_app_number] => 10236681 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1095433 [patent_doc_number] => 06821693 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-11-23 [patent_title] => 'Method for adjusting a multilevel phase-shifting mask or reticle' [patent_app_type] => B2 [patent_app_number] => 10/233970 [patent_app_country] => US [patent_app_date] => 2002-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 5 [patent_no_of_words] => 1614 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/821/06821693.pdf [firstpage_image] =>[orig_patent_app_number] => 10233970 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6748838 [patent_doc_number] => 20030043358 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-06 [patent_title] => 'Methods for determining focus and astigmatism in charged-particle-beam microlithography' [patent_app_type] => new [patent_app_number] => 10/233083 [patent_app_country] => US [patent_app_date] => 2002-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8154 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20030043358.pdf [firstpage_image] =>[orig_patent_app_number] => 10233083 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6750177 [patent_doc_number] => 20030044697 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-06 [patent_title] => 'Methods and apparatus for correcting the proximity effect in a charged-particle-beam microlithography system and devices manufactured from the same' [patent_app_type] => new [patent_app_number] => 10/231587 [patent_app_country] => US [patent_app_date] => 2002-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7916 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0044/20030044697.pdf [firstpage_image] =>[orig_patent_app_number] => 10231587 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7350995 [patent_doc_number] => 20040048173 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-03-11 [patent_title] => 'Using fiducial marks on a substrate for laser transfer of organic material from a donor to a substrate' [patent_app_type] => new [patent_app_number] => 10/230934 [patent_app_country] => US [patent_app_date] => 2002-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8982 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20040048173.pdf [firstpage_image] =>[orig_patent_app_number] => 10230934 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6750183 [patent_doc_number] => 20030044703 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-06 [patent_title] => 'Methods for simulating resist development in microlithography' [patent_app_type] => new [patent_app_number] => 10/231822 [patent_app_country] => US [patent_app_date] => 2002-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5457 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 244 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0044/20030044703.pdf [firstpage_image] =>[orig_patent_app_number] => 10231822 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1376592 [patent_doc_number] => 06555295 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-29 [patent_title] => 'Resist pattern forming method using anti-reflective layer, resist pattern formed, and method of etching using resist pattern and product formed' [patent_app_type] => B1 [patent_app_number] => 10/229216 [patent_app_country] => US [patent_app_date] => 2002-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 92 [patent_no_of_words] => 18778 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/555/06555295.pdf [firstpage_image] =>[orig_patent_app_number] => 10229216 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1148229 [patent_doc_number] => 06770408 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-08-03 [patent_title] => 'Dust particle inspection method for X-ray mask' [patent_app_type] => B2 [patent_app_number] => 10/223301 [patent_app_country] => US [patent_app_date] => 2002-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 43 [patent_no_of_words] => 8065 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/770/06770408.pdf [firstpage_image] =>[orig_patent_app_number] => 10223301 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6838930 [patent_doc_number] => 20030036270 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-02-20 [patent_title] => 'Determining exposure time of wafer photolithography process' [patent_app_type] => new [patent_app_number] => 10/218376 [patent_app_country] => US [patent_app_date] => 2002-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5056 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 262 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0036/20030036270.pdf [firstpage_image] =>[orig_patent_app_number] => 10218376 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6259569 [patent_doc_number] => 20020187410 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-12 [patent_title] => 'METHOD FOR PROVIDING AN ALIGNMENT DIFFRACTION GRATING FOR PHOTOLITHOGRAPHIC ALIGNMENT DURING SEMICONDUCTOR FABRICATION' [patent_app_type] => new [patent_app_number] => 10/213295 [patent_app_country] => US [patent_app_date] => 2002-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5559 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0187/20020187410.pdf [firstpage_image] =>[orig_patent_app_number] => 10213295 [rel_patent_id] =>[rel_patent_doc_number] =>)