Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6110866 [patent_doc_number] => 20020172896 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-21 [patent_title] => 'Antireflective coating compositions' [patent_app_type] => new [patent_app_number] => 10/126636 [patent_app_country] => US [patent_app_date] => 2002-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10316 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 25 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0172/20020172896.pdf [firstpage_image] =>[orig_patent_app_number] => 10126636 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/126636
Antireflective coating compositions and exposure methods under 200 nm Apr 19, 2002 Issued
Array ( [id] => 532604 [patent_doc_number] => 07175951 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-02-13 [patent_title] => 'Two mask in-situ overlay checking method' [patent_app_type] => utility [patent_app_number] => 10/126388 [patent_app_country] => US [patent_app_date] => 2002-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 17 [patent_no_of_words] => 3650 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/175/07175951.pdf [firstpage_image] =>[orig_patent_app_number] => 10126388 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/126388
Two mask in-situ overlay checking method Apr 18, 2002 Issued
Array ( [id] => 6469447 [patent_doc_number] => 20020151140 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-17 [patent_title] => 'Exposure parameter obtaining method, exposure parameter evaluating method, semiconductor device manufacturing method, charged beam exposure apparatus, and method of the same' [patent_app_type] => new [patent_app_number] => 10/122393 [patent_app_country] => US [patent_app_date] => 2002-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9042 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0151/20020151140.pdf [firstpage_image] =>[orig_patent_app_number] => 10122393 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/122393
Exposure parameter obtaining method, exposure parameter evaluating method, semiconductor device manufacturing method, charged beam exposure apparatus, and method of the same Apr 15, 2002 Issued
Array ( [id] => 1245454 [patent_doc_number] => 06677089 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-01-13 [patent_title] => 'Rectangle/lattice data conversion method for charged particle beam exposure mask pattern and charged particle beam exposure method' [patent_app_type] => B2 [patent_app_number] => 10/120171 [patent_app_country] => US [patent_app_date] => 2002-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 53 [patent_figures_cnt] => 81 [patent_no_of_words] => 20885 [patent_no_of_claims] => 47 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/677/06677089.pdf [firstpage_image] =>[orig_patent_app_number] => 10120171 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/120171
Rectangle/lattice data conversion method for charged particle beam exposure mask pattern and charged particle beam exposure method Apr 10, 2002 Issued
Array ( [id] => 1263917 [patent_doc_number] => 06660439 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-12-09 [patent_title] => 'Method to reduce data size and data preparation time for optical proximity correction of photo masks' [patent_app_type] => B1 [patent_app_number] => 10/117949 [patent_app_country] => US [patent_app_date] => 2002-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 1909 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/660/06660439.pdf [firstpage_image] =>[orig_patent_app_number] => 10117949 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/117949
Method to reduce data size and data preparation time for optical proximity correction of photo masks Apr 7, 2002 Issued
Array ( [id] => 6813459 [patent_doc_number] => 20030073009 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-17 [patent_title] => 'Photomask for focus monitoring, method of focus monitoring, unit for focus monitoring and manufacturing method for a unit' [patent_app_type] => new [patent_app_number] => 10/115246 [patent_app_country] => US [patent_app_date] => 2002-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 42 [patent_figures_cnt] => 42 [patent_no_of_words] => 22634 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0073/20030073009.pdf [firstpage_image] =>[orig_patent_app_number] => 10115246 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/115246
Photomask for focus monitoring Apr 3, 2002 Issued
Array ( [id] => 5905532 [patent_doc_number] => 20020142238 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-03 [patent_title] => 'Manufacturing method of semiconductor device, exposure data preparing method, preparing method of aperture mask data, and charge beam exposure apparatus' [patent_app_type] => new [patent_app_number] => 10/107042 [patent_app_country] => US [patent_app_date] => 2002-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3087 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0142/20020142238.pdf [firstpage_image] =>[orig_patent_app_number] => 10107042 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/107042
Method of preparing exposure data and method of preparing aperture mask data Mar 27, 2002 Issued
Array ( [id] => 1255812 [patent_doc_number] => 06667139 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-12-23 [patent_title] => 'Method of manufacturing semiconductor device' [patent_app_type] => B2 [patent_app_number] => 10/107246 [patent_app_country] => US [patent_app_date] => 2002-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 46 [patent_no_of_words] => 12873 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 505 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/667/06667139.pdf [firstpage_image] =>[orig_patent_app_number] => 10107246 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/107246
Method of manufacturing semiconductor device Mar 27, 2002 Issued
Array ( [id] => 1148220 [patent_doc_number] => 06770407 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-08-03 [patent_title] => 'Methods for monitoring photoresists' [patent_app_type] => B2 [patent_app_number] => 10/108194 [patent_app_country] => US [patent_app_date] => 2002-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4219 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/770/06770407.pdf [firstpage_image] =>[orig_patent_app_number] => 10108194 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/108194
Methods for monitoring photoresists Mar 25, 2002 Issued
Array ( [id] => 6533608 [patent_doc_number] => 20020136971 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-26 [patent_title] => 'Manufacturing system in electronic devices' [patent_app_type] => new [patent_app_number] => 10/092486 [patent_app_country] => US [patent_app_date] => 2002-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 13158 [patent_no_of_claims] => 60 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0136/20020136971.pdf [firstpage_image] =>[orig_patent_app_number] => 10092486 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/092486
Manufacturing system in electronic devices Mar 7, 2002 Issued
Array ( [id] => 6696624 [patent_doc_number] => 20030108818 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-06-12 [patent_title] => 'Method and apparatus for modification of chemically amplified photoresist by electron beam exposure' [patent_app_type] => new [patent_app_number] => 10/090465 [patent_app_country] => US [patent_app_date] => 2002-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 10327 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0108/20030108818.pdf [firstpage_image] =>[orig_patent_app_number] => 10090465 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/090465
Method and apparatus for modification of chemically amplified photoresist by electron beam exposure Mar 3, 2002 Issued
Array ( [id] => 1235177 [patent_doc_number] => 06689520 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-02-10 [patent_title] => 'Exposure method for correcting dimension variation in electron beam lithography' [patent_app_type] => B2 [patent_app_number] => 10/080032 [patent_app_country] => US [patent_app_date] => 2002-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2670 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/689/06689520.pdf [firstpage_image] =>[orig_patent_app_number] => 10080032 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/080032
Exposure method for correcting dimension variation in electron beam lithography Feb 20, 2002 Issued
Array ( [id] => 1266247 [patent_doc_number] => 06656663 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-12-02 [patent_title] => 'Microlithographic exposure methods using a segmented reticle defining pattern elements exhibiting reduced incidence of stitching anomalies when imaged on a substrate' [patent_app_type] => B2 [patent_app_number] => 10/077337 [patent_app_country] => US [patent_app_date] => 2002-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 64 [patent_no_of_words] => 8318 [patent_no_of_claims] => 58 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/656/06656663.pdf [firstpage_image] =>[orig_patent_app_number] => 10077337 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/077337
Microlithographic exposure methods using a segmented reticle defining pattern elements exhibiting reduced incidence of stitching anomalies when imaged on a substrate Feb 14, 2002 Issued
Array ( [id] => 6842850 [patent_doc_number] => 20030148197 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-08-07 [patent_title] => 'METHOD FOR PATTERNING SEMICONDUCTORS THROUGH ADJUSTMENT OF IMAGE PEAK SIDE LOBES' [patent_app_type] => new [patent_app_number] => 10/060769 [patent_app_country] => US [patent_app_date] => 2002-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 2479 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20030148197.pdf [firstpage_image] =>[orig_patent_app_number] => 10060769 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/060769
Method for patterning semiconductors through adjustment of image peak side lobes Jan 31, 2002 Issued
Array ( [id] => 6206732 [patent_doc_number] => 20020071107 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-13 [patent_title] => 'Layout designing method of a dispaly device' [patent_app_type] => new [patent_app_number] => 10/058990 [patent_app_country] => US [patent_app_date] => 2002-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 4533 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0071/20020071107.pdf [firstpage_image] =>[orig_patent_app_number] => 10058990 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/058990
Layout designing method of a display device Jan 29, 2002 Issued
Array ( [id] => 6850082 [patent_doc_number] => 20030142284 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-31 [patent_title] => 'Multiple mask step and scan aligner' [patent_app_type] => new [patent_app_number] => 10/056650 [patent_app_country] => US [patent_app_date] => 2002-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 4592 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0142/20030142284.pdf [firstpage_image] =>[orig_patent_app_number] => 10056650 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/056650
Multiple mask step and scan aligner Jan 27, 2002 Issued
Array ( [id] => 1453040 [patent_doc_number] => 06461776 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-08 [patent_title] => 'Resist pattern forming method using anti-reflective layer, with variable extinction coefficient' [patent_app_type] => B1 [patent_app_number] => 10/054932 [patent_app_country] => US [patent_app_date] => 2002-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 92 [patent_no_of_words] => 18902 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/461/06461776.pdf [firstpage_image] =>[orig_patent_app_number] => 10054932 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/054932
Resist pattern forming method using anti-reflective layer, with variable extinction coefficient Jan 24, 2002 Issued
Array ( [id] => 6738155 [patent_doc_number] => 20030155523 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-08-21 [patent_title] => 'Apparatus and a method for forming a pattern using a crystal structure of material' [patent_app_type] => new [patent_app_number] => 10/220364 [patent_app_country] => US [patent_app_date] => 2002-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 5341 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0155/20030155523.pdf [firstpage_image] =>[orig_patent_app_number] => 10220364 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/220364
Apparatus and a method for forming a pattern using a crystal structure of material Jan 23, 2002 Issued
Array ( [id] => 5985568 [patent_doc_number] => 20020098423 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-07-25 [patent_title] => 'Electron beam projection mask' [patent_app_type] => new [patent_app_number] => 10/055689 [patent_app_country] => US [patent_app_date] => 2002-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2550 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 26 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0098/20020098423.pdf [firstpage_image] =>[orig_patent_app_number] => 10055689 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/055689
Electron beam projection mask Jan 22, 2002 Issued
Array ( [id] => 6548570 [patent_doc_number] => 20020111038 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-15 [patent_title] => 'Method and system for processing a semi-conductor device' [patent_app_type] => new [patent_app_number] => 10/052513 [patent_app_country] => US [patent_app_date] => 2002-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8812 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0111/20020111038.pdf [firstpage_image] =>[orig_patent_app_number] => 10052513 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/052513
Method and system for processing a semi-conductor device Jan 22, 2002 Issued
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