
Christopher G. Young
Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )
| Most Active Art Unit | 1756 |
| Art Unit(s) | 1721, 1737, 1752, 1113, 1506, 1756, 1795 |
| Total Applications | 2931 |
| Issued Applications | 2607 |
| Pending Applications | 32 |
| Abandoned Applications | 298 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6582202
[patent_doc_number] => 20020041369
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[patent_title] => 'Method and device for improved lithographic critical dimension control'
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Array
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[patent_issue_date] => 2003-12-02
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Array
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Array
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Array
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Array
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Array
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Array
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[patent_title] => 'Straight line defect detection tool'
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Array
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Array
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Array
(
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Array
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Array
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Array
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