Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1334524 [patent_doc_number] => 06593045 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-07-15 [patent_title] => 'Substrate processing apparatus and method' [patent_app_type] => B2 [patent_app_number] => 09/902159 [patent_app_country] => US [patent_app_date] => 2001-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 40 [patent_figures_cnt] => 48 [patent_no_of_words] => 20538 [patent_no_of_claims] => 53 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/593/06593045.pdf [firstpage_image] =>[orig_patent_app_number] => 09902159 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/902159
Substrate processing apparatus and method Jul 10, 2001 Issued
Array ( [id] => 1296487 [patent_doc_number] => 06627360 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-30 [patent_title] => 'Carbonization process for an etch mask' [patent_app_type] => B1 [patent_app_number] => 09/900985 [patent_app_country] => US [patent_app_date] => 2001-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 2744 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/627/06627360.pdf [firstpage_image] =>[orig_patent_app_number] => 09900985 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/900985
Carbonization process for an etch mask Jul 8, 2001 Issued
Array ( [id] => 1296659 [patent_doc_number] => 06627388 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-09-30 [patent_title] => 'Method for reducing roughness of photoresist through cross-linking reaction of deposit and photoresist' [patent_app_type] => B2 [patent_app_number] => 09/900579 [patent_app_country] => US [patent_app_date] => 2001-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 1811 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/627/06627388.pdf [firstpage_image] =>[orig_patent_app_number] => 09900579 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/900579
Method for reducing roughness of photoresist through cross-linking reaction of deposit and photoresist Jul 5, 2001 Issued
Array ( [id] => 5888265 [patent_doc_number] => 20020012852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-31 [patent_title] => 'Stencil mask for electron beam projection lithography and fabrication method' [patent_app_type] => new [patent_app_number] => 09/896102 [patent_app_country] => US [patent_app_date] => 2001-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1928 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20020012852.pdf [firstpage_image] =>[orig_patent_app_number] => 09896102 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/896102
Stencil mask for electron beam projection lithography and fabrication method Jul 1, 2001 Issued
Array ( [id] => 1290463 [patent_doc_number] => 06630287 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-10-07 [patent_title] => 'Method for forming thick film pattern and photosensitive paste used therefor' [patent_app_type] => B2 [patent_app_number] => 09/897305 [patent_app_country] => US [patent_app_date] => 2001-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 8491 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/630/06630287.pdf [firstpage_image] =>[orig_patent_app_number] => 09897305 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/897305
Method for forming thick film pattern and photosensitive paste used therefor Jul 1, 2001 Issued
Array ( [id] => 6884798 [patent_doc_number] => 20010038959 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-11-08 [patent_title] => ' Scanning exposure methods' [patent_app_type] => new [patent_app_number] => 09/885404 [patent_app_country] => US [patent_app_date] => 2001-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 11980 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0038/20010038959.pdf [firstpage_image] =>[orig_patent_app_number] => 09885404 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/885404
Scanning exposure methods Jun 20, 2001 Issued
Array ( [id] => 1369342 [patent_doc_number] => 06562528 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-05-13 [patent_title] => 'Method for determining and calibrating image plane tilt and substrate plane tilt in photolithography' [patent_app_type] => B2 [patent_app_number] => 09/884140 [patent_app_country] => US [patent_app_date] => 2001-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 26 [patent_no_of_words] => 7570 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/562/06562528.pdf [firstpage_image] =>[orig_patent_app_number] => 09884140 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/884140
Method for determining and calibrating image plane tilt and substrate plane tilt in photolithography Jun 19, 2001 Issued
Array ( [id] => 1390556 [patent_doc_number] => 06541170 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-04-01 [patent_title] => 'Resist processing method controlled through reflectivity data' [patent_app_type] => B2 [patent_app_number] => 09/883404 [patent_app_country] => US [patent_app_date] => 2001-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 7382 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/541/06541170.pdf [firstpage_image] =>[orig_patent_app_number] => 09883404 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/883404
Resist processing method controlled through reflectivity data Jun 18, 2001 Issued
Array ( [id] => 6524579 [patent_doc_number] => 20020192577 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-19 [patent_title] => 'Automated overlay metrology system' [patent_app_type] => new [patent_app_number] => 09/881026 [patent_app_country] => US [patent_app_date] => 2001-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4235 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0192/20020192577.pdf [firstpage_image] =>[orig_patent_app_number] => 09881026 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/881026
Automated overlay metrology system Jun 14, 2001 Abandoned
Array ( [id] => 7000280 [patent_doc_number] => 20010053489 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-12-20 [patent_title] => 'Method of detecting aberrations of an optical imaging system' [patent_app_type] => new [patent_app_number] => 09/878981 [patent_app_country] => US [patent_app_date] => 2001-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 14193 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0053/20010053489.pdf [firstpage_image] =>[orig_patent_app_number] => 09878981 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/878981
Method of detecting aberrations of an optical imaging system Jun 11, 2001 Issued
Array ( [id] => 1344442 [patent_doc_number] => 06582863 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-24 [patent_title] => 'Method of controlling photolithography processes based upon scatterometric measurements of sub-nominal grating structures' [patent_app_type] => B1 [patent_app_number] => 09/879751 [patent_app_country] => US [patent_app_date] => 2001-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 7352 [patent_no_of_claims] => 84 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/582/06582863.pdf [firstpage_image] =>[orig_patent_app_number] => 09879751 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/879751
Method of controlling photolithography processes based upon scatterometric measurements of sub-nominal grating structures Jun 10, 2001 Issued
Array ( [id] => 1311128 [patent_doc_number] => 06610448 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-08-26 [patent_title] => 'Alignment method, overlay deviation inspection method and photomask' [patent_app_type] => B2 [patent_app_number] => 09/874958 [patent_app_country] => US [patent_app_date] => 2001-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 22 [patent_no_of_words] => 8333 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/610/06610448.pdf [firstpage_image] =>[orig_patent_app_number] => 09874958 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/874958
Alignment method, overlay deviation inspection method and photomask Jun 6, 2001 Issued
Array ( [id] => 1071725 [patent_doc_number] => 06841307 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-01-11 [patent_title] => 'Photomask making method and alignment method' [patent_app_type] => utility [patent_app_number] => 09/874367 [patent_app_country] => US [patent_app_date] => 2001-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 38 [patent_no_of_words] => 8847 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/841/06841307.pdf [firstpage_image] =>[orig_patent_app_number] => 09874367 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/874367
Photomask making method and alignment method Jun 5, 2001 Issued
Array ( [id] => 6889305 [patent_doc_number] => 20010024760 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-09-27 [patent_title] => 'Method of optical proximity correction' [patent_app_type] => new [patent_app_number] => 09/872411 [patent_app_country] => US [patent_app_date] => 2001-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1898 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20010024760.pdf [firstpage_image] =>[orig_patent_app_number] => 09872411 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/872411
Method of optical proximity correction May 31, 2001 Abandoned
Array ( [id] => 1527755 [patent_doc_number] => 06479201 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-11-12 [patent_title] => 'Optical exposure apparatus of scanning exposure system and its exposing method' [patent_app_type] => B2 [patent_app_number] => 09/866737 [patent_app_country] => US [patent_app_date] => 2001-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 5553 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/479/06479201.pdf [firstpage_image] =>[orig_patent_app_number] => 09866737 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/866737
Optical exposure apparatus of scanning exposure system and its exposing method May 29, 2001 Issued
Array ( [id] => 1326023 [patent_doc_number] => 06599670 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-07-29 [patent_title] => 'Method for compensating exposure value for exposure process in semiconductor manufacturing system' [patent_app_type] => B2 [patent_app_number] => 09/866617 [patent_app_country] => US [patent_app_date] => 2001-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4729 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/599/06599670.pdf [firstpage_image] =>[orig_patent_app_number] => 09866617 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/866617
Method for compensating exposure value for exposure process in semiconductor manufacturing system May 29, 2001 Issued
Array ( [id] => 1317351 [patent_doc_number] => 06605397 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-08-12 [patent_title] => 'Method of preparing pattern data to be used for different exposure methods' [patent_app_type] => B2 [patent_app_number] => 09/863317 [patent_app_country] => US [patent_app_date] => 2001-05-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 31 [patent_no_of_words] => 11736 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/605/06605397.pdf [firstpage_image] =>[orig_patent_app_number] => 09863317 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/863317
Method of preparing pattern data to be used for different exposure methods May 23, 2001 Issued
Array ( [id] => 5951147 [patent_doc_number] => 20020006563 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-17 [patent_title] => 'Proximity effect correction methods' [patent_app_type] => new [patent_app_number] => 09/861210 [patent_app_country] => US [patent_app_date] => 2001-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7475 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20020006563.pdf [firstpage_image] =>[orig_patent_app_number] => 09861210 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/861210
Proximity effect correction methods May 16, 2001 Issued
Array ( [id] => 6880117 [patent_doc_number] => 20010031404 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-10-18 [patent_title] => 'Process for fabricating a projection electron lithography mask and a removable, reusable cover for use therein' [patent_app_type] => new [patent_app_number] => 09/854753 [patent_app_country] => US [patent_app_date] => 2001-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2867 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0031/20010031404.pdf [firstpage_image] =>[orig_patent_app_number] => 09854753 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/854753
Process for fabricating a projection electron lithography mask and a removable, reusable cover for use therein May 14, 2001 Issued
Array ( [id] => 7064772 [patent_doc_number] => 20010044058 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-11-22 [patent_title] => 'Method of checking pattern measurement and image recognition assisting pattern' [patent_app_type] => new [patent_app_number] => 09/851096 [patent_app_country] => US [patent_app_date] => 2001-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2934 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0044/20010044058.pdf [firstpage_image] =>[orig_patent_app_number] => 09851096 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/851096
Method of checking pattern measurement and image recognition assisting pattern May 8, 2001 Issued
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