Search

Christopher G. Young

Examiner (ID: 3572, Phone: (571)272-1394 , Office: P/1721 )

Most Active Art Unit
1756
Art Unit(s)
1721, 1737, 1752, 1113, 1506, 1756, 1795
Total Applications
2931
Issued Applications
2607
Pending Applications
32
Abandoned Applications
298

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6365226 [patent_doc_number] => 20020117620 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-29 [patent_title] => 'Method and apparatus for determining photoresist pattern linearity' [patent_app_type] => new [patent_app_number] => 09/792205 [patent_app_country] => US [patent_app_date] => 2001-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3028 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0117/20020117620.pdf [firstpage_image] =>[orig_patent_app_number] => 09792205 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/792205
Method and apparatus for determining photoresist pattern linearity Feb 22, 2001 Issued
Array ( [id] => 1534131 [patent_doc_number] => 06489068 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-03 [patent_title] => 'Process for observing overlay errors on lithographic masks' [patent_app_type] => B1 [patent_app_number] => 09/790135 [patent_app_country] => US [patent_app_date] => 2001-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 4487 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/489/06489068.pdf [firstpage_image] =>[orig_patent_app_number] => 09790135 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/790135
Process for observing overlay errors on lithographic masks Feb 20, 2001 Issued
Array ( [id] => 1399196 [patent_doc_number] => 06534242 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-03-18 [patent_title] => 'Multiple exposure device formation' [patent_app_type] => B2 [patent_app_number] => 09/783600 [patent_app_country] => US [patent_app_date] => 2001-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 96 [patent_figures_cnt] => 186 [patent_no_of_words] => 39011 [patent_no_of_claims] => 104 [patent_no_of_ind_claims] => 38 [patent_words_short_claim] => 19 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/534/06534242.pdf [firstpage_image] =>[orig_patent_app_number] => 09783600 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/783600
Multiple exposure device formation Feb 14, 2001 Issued
Array ( [id] => 6901462 [patent_doc_number] => 20010023045 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-09-20 [patent_title] => 'Methods of reducing proximity effects in lithographic processes' [patent_app_type] => new [patent_app_number] => 09/780407 [patent_app_country] => US [patent_app_date] => 2001-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2325 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0023/20010023045.pdf [firstpage_image] =>[orig_patent_app_number] => 09780407 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/780407
Methods of reducing proximity effects in lithographic processes Feb 11, 2001 Issued
Array ( [id] => 6615861 [patent_doc_number] => 20020016015 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-02-07 [patent_title] => 'Microelectronic-device fabrication method' [patent_app_type] => new [patent_app_number] => 09/782590 [patent_app_country] => US [patent_app_date] => 2001-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 7641 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0016/20020016015.pdf [firstpage_image] =>[orig_patent_app_number] => 09782590 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/782590
Microelectronic-device fabrication method Feb 11, 2001 Abandoned
Array ( [id] => 1588182 [patent_doc_number] => 06482558 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-19 [patent_title] => 'Conducting electron beam resist thin film layer for patterning of mask plates' [patent_app_type] => B1 [patent_app_number] => 09/782382 [patent_app_country] => US [patent_app_date] => 2001-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2727 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/482/06482558.pdf [firstpage_image] =>[orig_patent_app_number] => 09782382 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/782382
Conducting electron beam resist thin film layer for patterning of mask plates Feb 11, 2001 Issued
Array ( [id] => 1559148 [patent_doc_number] => 06436595 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-20 [patent_title] => 'Method of aligning lithographically printed product layers using non-zero overlay targets' [patent_app_type] => B1 [patent_app_number] => 09/779421 [patent_app_country] => US [patent_app_date] => 2001-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 25 [patent_no_of_words] => 6795 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/436/06436595.pdf [firstpage_image] =>[orig_patent_app_number] => 09779421 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/779421
Method of aligning lithographically printed product layers using non-zero overlay targets Feb 7, 2001 Issued
Array ( [id] => 1387084 [patent_doc_number] => 06544699 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-08 [patent_title] => 'Method to improve accuracy of model-based optical proximity correction' [patent_app_type] => B1 [patent_app_number] => 09/778583 [patent_app_country] => US [patent_app_date] => 2001-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2919 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/544/06544699.pdf [firstpage_image] =>[orig_patent_app_number] => 09778583 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/778583
Method to improve accuracy of model-based optical proximity correction Feb 6, 2001 Issued
Array ( [id] => 1352491 [patent_doc_number] => 06576385 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-06-10 [patent_title] => 'Method of varying stepper exposure dose to compensate for across-wafer variations in photoresist thickness' [patent_app_type] => B2 [patent_app_number] => 09/776206 [patent_app_country] => US [patent_app_date] => 2001-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4990 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/576/06576385.pdf [firstpage_image] =>[orig_patent_app_number] => 09776206 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/776206
Method of varying stepper exposure dose to compensate for across-wafer variations in photoresist thickness Feb 1, 2001 Issued
09/701083 Silver based photomasks Jan 28, 2001 Abandoned
Array ( [id] => 6878149 [patent_doc_number] => 20010002304 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-05-31 [patent_title] => 'Methods of reducing proximity effects in lithographic processes' [patent_app_type] => new-utility [patent_app_number] => 09/769603 [patent_app_country] => US [patent_app_date] => 2001-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2325 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0002/20010002304.pdf [firstpage_image] =>[orig_patent_app_number] => 09769603 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/769603
Methods of reducing proximity effects in lithographic processes Jan 23, 2001 Issued
Array ( [id] => 5985573 [patent_doc_number] => 20020098427 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-07-25 [patent_title] => 'CONTACT HOLE MODEL-BASED OPTICAL PROXIMITY CORRECTION METHOD' [patent_app_type] => new [patent_app_number] => 09/767304 [patent_app_country] => US [patent_app_date] => 2001-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2801 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0098/20020098427.pdf [firstpage_image] =>[orig_patent_app_number] => 09767304 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/767304
Contact hole model-based optical proximity correction method Jan 22, 2001 Issued
Array ( [id] => 7028245 [patent_doc_number] => 20010014531 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-08-16 [patent_title] => 'Multilayer alignment keys and alignment method using the same' [patent_app_type] => new [patent_app_number] => 09/761618 [patent_app_country] => US [patent_app_date] => 2001-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3809 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0014/20010014531.pdf [firstpage_image] =>[orig_patent_app_number] => 09761618 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/761618
Multilayer alignment keys and alignment method using the same Jan 15, 2001 Issued
Array ( [id] => 1398899 [patent_doc_number] => 06534227 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-03-18 [patent_title] => 'Photoreceptor, method of evaluating the photoreceptor, method of producing the photoreceptor, and image formation apparatus using the photoreceptor' [patent_app_type] => B2 [patent_app_number] => 09/758193 [patent_app_country] => US [patent_app_date] => 2001-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 30 [patent_no_of_words] => 34183 [patent_no_of_claims] => 90 [patent_no_of_ind_claims] => 18 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/534/06534227.pdf [firstpage_image] =>[orig_patent_app_number] => 09758193 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/758193
Photoreceptor, method of evaluating the photoreceptor, method of producing the photoreceptor, and image formation apparatus using the photoreceptor Jan 11, 2001 Issued
Array ( [id] => 6876613 [patent_doc_number] => 20010006766 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-07-05 [patent_title] => 'Method for patterning thin films' [patent_app_type] => new-utility [patent_app_number] => 09/759794 [patent_app_country] => US [patent_app_date] => 2001-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6840 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20010006766.pdf [firstpage_image] =>[orig_patent_app_number] => 09759794 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/759794
Method for patterning thin films Jan 11, 2001 Issued
Array ( [id] => 6893929 [patent_doc_number] => 20010016295 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-08-23 [patent_title] => 'Method of compensating for pattern dimension variation caused by re-scattered electron beam in electron beam lithography' [patent_app_type] => new [patent_app_number] => 09/758708 [patent_app_country] => US [patent_app_date] => 2001-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4335 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0016/20010016295.pdf [firstpage_image] =>[orig_patent_app_number] => 09758708 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/758708
Method of compensating for pattern dimension variation caused by re-scattered electron beam in electron beam lithography and recording medium in which the method is recorded Jan 10, 2001 Issued
Array ( [id] => 7640474 [patent_doc_number] => 06395438 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-28 [patent_title] => 'Method of etch bias proximity correction' [patent_app_type] => B1 [patent_app_number] => 09/756540 [patent_app_country] => US [patent_app_date] => 2001-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 4018 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 4 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/395/06395438.pdf [firstpage_image] =>[orig_patent_app_number] => 09756540 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/756540
Method of etch bias proximity correction Jan 7, 2001 Issued
Array ( [id] => 5951141 [patent_doc_number] => 20020006562 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-17 [patent_title] => 'Plate pattern forming method and its inspecting method' [patent_app_type] => new [patent_app_number] => 09/750694 [patent_app_country] => US [patent_app_date] => 2001-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 8151 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 42 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20020006562.pdf [firstpage_image] =>[orig_patent_app_number] => 09750694 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/750694
Plate pattern forming method and its inspecting method Jan 1, 2001 Issued
Array ( [id] => 6877542 [patent_doc_number] => 20010003028 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-06-07 [patent_title] => ' Scanning Exposure Method' [patent_app_type] => new-utility [patent_app_number] => 09/749561 [patent_app_country] => US [patent_app_date] => 2000-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 11980 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0003/20010003028.pdf [firstpage_image] =>[orig_patent_app_number] => 09749561 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/749561
Scanning Exposure Method Dec 27, 2000 Abandoned
Array ( [id] => 1412686 [patent_doc_number] => 06521392 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-02-18 [patent_title] => 'Methods for measuring and adjusting illumination uniformity obtained from a charged-particle illumination-optical system' [patent_app_type] => B2 [patent_app_number] => 09/750010 [patent_app_country] => US [patent_app_date] => 2000-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4220 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/521/06521392.pdf [firstpage_image] =>[orig_patent_app_number] => 09750010 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/750010
Methods for measuring and adjusting illumination uniformity obtained from a charged-particle illumination-optical system Dec 26, 2000 Issued
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