
Christopher Ray Lamb
Examiner (ID: 4194)
| Most Active Art Unit | 2627 |
| Art Unit(s) | 2688, 2627, 2622, 2694, 2695 |
| Total Applications | 891 |
| Issued Applications | 446 |
| Pending Applications | 65 |
| Abandoned Applications | 389 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7764051
[patent_doc_number] => 08115493
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-02-14
[patent_title] => 'Trainline integrity locomotive test device'
[patent_app_type] => utility
[patent_app_number] => 12/244254
[patent_app_country] => US
[patent_app_date] => 2008-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3682
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/115/08115493.pdf
[firstpage_image] =>[orig_patent_app_number] => 12244254
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/244254 | Trainline integrity locomotive test device | Oct 1, 2008 | Issued |
Array
(
[id] => 5478077
[patent_doc_number] => 20090201034
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-13
[patent_title] => 'METHODS FOR MEASUREMENT AND CHARACTERIZATION OF INTERFEROMETRIC MODULATORS'
[patent_app_type] => utility
[patent_app_number] => 12/242788
[patent_app_country] => US
[patent_app_date] => 2008-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 34
[patent_figures_cnt] => 34
[patent_no_of_words] => 18086
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0201/20090201034.pdf
[firstpage_image] =>[orig_patent_app_number] => 12242788
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/242788 | METHODS FOR MEASUREMENT AND CHARACTERIZATION OF INTERFEROMETRIC MODULATORS | Sep 29, 2008 | Abandoned |
Array
(
[id] => 5478076
[patent_doc_number] => 20090201033
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-13
[patent_title] => 'METHODS FOR MEASUREMENT AND CHARACTERIZATION OF INTERFEROMETRIC MODULATORS'
[patent_app_type] => utility
[patent_app_number] => 12/242770
[patent_app_country] => US
[patent_app_date] => 2008-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 34
[patent_figures_cnt] => 34
[patent_no_of_words] => 18068
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0201/20090201033.pdf
[firstpage_image] =>[orig_patent_app_number] => 12242770
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/242770 | Methods for measurement and characterization of interferometric modulators | Sep 29, 2008 | Issued |
Array
(
[id] => 8116029
[patent_doc_number] => 08159235
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-17
[patent_title] => 'Electrical impedance tomography of nanoengineered thin films'
[patent_app_type] => utility
[patent_app_number] => 12/209318
[patent_app_country] => US
[patent_app_date] => 2008-09-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 32
[patent_no_of_words] => 14386
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 149
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/159/08159235.pdf
[firstpage_image] =>[orig_patent_app_number] => 12209318
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/209318 | Electrical impedance tomography of nanoengineered thin films | Sep 11, 2008 | Issued |
Array
(
[id] => 5281400
[patent_doc_number] => 20090095073
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-16
[patent_title] => 'Impedance sensor'
[patent_app_type] => utility
[patent_app_number] => 12/232113
[patent_app_country] => US
[patent_app_date] => 2008-09-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3869
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0095/20090095073.pdf
[firstpage_image] =>[orig_patent_app_number] => 12232113
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/232113 | Impedance sensor | Sep 10, 2008 | Abandoned |
Array
(
[id] => 5383526
[patent_doc_number] => 20090224770
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-10
[patent_title] => 'SCREENING OF ELECTROLYTIC CAPACITORS'
[patent_app_type] => utility
[patent_app_number] => 12/207609
[patent_app_country] => US
[patent_app_date] => 2008-09-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1541
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0224/20090224770.pdf
[firstpage_image] =>[orig_patent_app_number] => 12207609
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/207609 | SCREENING OF ELECTROLYTIC CAPACITORS | Sep 9, 2008 | Abandoned |
Array
(
[id] => 6217009
[patent_doc_number] => 20100052704
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-03-04
[patent_title] => 'HYBRID RESILIENT AND FRANGIBLE LAYERED STRUCTURAL HEALTH SENSOR'
[patent_app_type] => utility
[patent_app_number] => 12/202883
[patent_app_country] => US
[patent_app_date] => 2008-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 6613
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0052/20100052704.pdf
[firstpage_image] =>[orig_patent_app_number] => 12202883
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/202883 | Hybrid resilient and frangible layered structural health sensor | Sep 1, 2008 | Issued |
Array
(
[id] => 315346
[patent_doc_number] => 07525319
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-04-28
[patent_title] => 'Method and apparatus to electrically qualify high speed PCB connectors'
[patent_app_type] => utility
[patent_app_number] => 12/200208
[patent_app_country] => US
[patent_app_date] => 2008-08-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 1418
[patent_no_of_claims] => 1
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 262
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/525/07525319.pdf
[firstpage_image] =>[orig_patent_app_number] => 12200208
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/200208 | Method and apparatus to electrically qualify high speed PCB connectors | Aug 27, 2008 | Issued |
Array
(
[id] => 4756723
[patent_doc_number] => 20080308948
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-18
[patent_title] => 'WAFER-TO-WAFER ALIGNMENTS'
[patent_app_type] => utility
[patent_app_number] => 12/198221
[patent_app_country] => US
[patent_app_date] => 2008-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 3637
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0308/20080308948.pdf
[firstpage_image] =>[orig_patent_app_number] => 12198221
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/198221 | Wafer-to-wafer alignments | Aug 25, 2008 | Issued |
Array
(
[id] => 6121606
[patent_doc_number] => 20110084716
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-04-14
[patent_title] => 'DIAGNOSTIC METHOD FOR OIL-FILLED ELECTRICAL DEVICE, DIAGNOSTIC DEVICE FOR IMPLEMENTING THE DIAGNOSTIC METHOD, AND OIL-FILLED ELECTRICAL DEVICE PROVIDED WITH THE DIAGNOSTIC DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/996215
[patent_app_country] => US
[patent_app_date] => 2008-08-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4246
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0084/20110084716.pdf
[firstpage_image] =>[orig_patent_app_number] => 12996215
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/996215 | Diagnostic method for oil-filled electrical device, diagnostic device for implementing the diagnostic method, and oil-filled electrical device provided with the diagnostic device | Aug 17, 2008 | Issued |
Array
(
[id] => 9087126
[patent_doc_number] => 08558557
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-10-15
[patent_title] => 'Inductive conductivity measurement cell'
[patent_app_type] => utility
[patent_app_number] => 12/733047
[patent_app_country] => US
[patent_app_date] => 2008-08-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 1803
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 258
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12733047
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/733047 | Inductive conductivity measurement cell | Aug 7, 2008 | Issued |
Array
(
[id] => 14954
[patent_doc_number] => 07804305
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-09-28
[patent_title] => 'Method and apparatus to select a parameter/mode using a capacitor of a feedback loop of the power supply'
[patent_app_type] => utility
[patent_app_number] => 12/183931
[patent_app_country] => US
[patent_app_date] => 2008-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 5768
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 155
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/804/07804305.pdf
[firstpage_image] =>[orig_patent_app_number] => 12183931
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/183931 | Method and apparatus to select a parameter/mode using a capacitor of a feedback loop of the power supply | Jul 30, 2008 | Issued |
Array
(
[id] => 6385960
[patent_doc_number] => 20100176824
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-15
[patent_title] => 'MEASURING APPARATUS AND MEASURING METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/664840
[patent_app_country] => US
[patent_app_date] => 2008-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3986
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0176/20100176824.pdf
[firstpage_image] =>[orig_patent_app_number] => 12664840
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/664840 | Measuring apparatus and method for measuring a surface capacitance of an insulating film | Jul 30, 2008 | Issued |
Array
(
[id] => 5506237
[patent_doc_number] => 20090079444
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-26
[patent_title] => 'APPARATUS AND METHOD OF CAPACITIVELY SENSING OPERATOR PRESENCE FOR A STUMP CUTTER'
[patent_app_type] => utility
[patent_app_number] => 12/182057
[patent_app_country] => US
[patent_app_date] => 2008-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4159
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0079/20090079444.pdf
[firstpage_image] =>[orig_patent_app_number] => 12182057
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/182057 | Apparatus and method of capacitively sensing operator presence for a stump cutter | Jul 28, 2008 | Issued |
Array
(
[id] => 5307987
[patent_doc_number] => 20090015268
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'DEVICE AND METHOD FOR COMPENSATING A CAPACITIVE SENSOR MEASUREMENT FOR VARIATIONS CAUSED BY ENVIRONMENTAL CONDITIONS IN A SEMICONDUCTOR PROCESSING ENVIRONMENT'
[patent_app_type] => utility
[patent_app_number] => 12/169737
[patent_app_country] => US
[patent_app_date] => 2008-07-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3507
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0015/20090015268.pdf
[firstpage_image] =>[orig_patent_app_number] => 12169737
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/169737 | DEVICE AND METHOD FOR COMPENSATING A CAPACITIVE SENSOR MEASUREMENT FOR VARIATIONS CAUSED BY ENVIRONMENTAL CONDITIONS IN A SEMICONDUCTOR PROCESSING ENVIRONMENT | Jul 8, 2008 | Abandoned |
Array
(
[id] => 5462150
[patent_doc_number] => 20090322350
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-12-31
[patent_title] => 'PRINTED CIRCUIT ASSEMBLY AND METHOD FOR MEASURING CHARACTERISTIC IMPEDANCE'
[patent_app_type] => utility
[patent_app_number] => 12/165327
[patent_app_country] => US
[patent_app_date] => 2008-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3251
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0322/20090322350.pdf
[firstpage_image] =>[orig_patent_app_number] => 12165327
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/165327 | PRINTED CIRCUIT ASSEMBLY AND METHOD FOR MEASURING CHARACTERISTIC IMPEDANCE | Jun 29, 2008 | Abandoned |
Array
(
[id] => 5307989
[patent_doc_number] => 20090015270
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'Electrostatic capacity-type sensor'
[patent_app_type] => utility
[patent_app_number] => 12/155387
[patent_app_country] => US
[patent_app_date] => 2008-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 8729
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0015/20090015270.pdf
[firstpage_image] =>[orig_patent_app_number] => 12155387
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/155387 | Electrostatic capacity-type sensor | Jun 2, 2008 | Issued |
Array
(
[id] => 7776026
[patent_doc_number] => 08120349
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-02-21
[patent_title] => 'Waveform measuring apparatus wherein the peak-to-peak amplitude is measured'
[patent_app_type] => utility
[patent_app_number] => 12/129035
[patent_app_country] => US
[patent_app_date] => 2008-05-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 13
[patent_no_of_words] => 3559
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 117
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/120/08120349.pdf
[firstpage_image] =>[orig_patent_app_number] => 12129035
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/129035 | Waveform measuring apparatus wherein the peak-to-peak amplitude is measured | May 28, 2008 | Issued |
Array
(
[id] => 7989249
[patent_doc_number] => 08076923
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-12-13
[patent_title] => 'Dead-line phase identification system and method thereof'
[patent_app_type] => utility
[patent_app_number] => 12/126447
[patent_app_country] => US
[patent_app_date] => 2008-05-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 6420
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 218
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/076/08076923.pdf
[firstpage_image] =>[orig_patent_app_number] => 12126447
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/126447 | Dead-line phase identification system and method thereof | May 22, 2008 | Issued |
Array
(
[id] => 4511820
[patent_doc_number] => 07915896
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-03-29
[patent_title] => 'Identification of a defective filament in a fluorescent lamp'
[patent_app_type] => utility
[patent_app_number] => 12/125897
[patent_app_country] => US
[patent_app_date] => 2008-05-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 14
[patent_no_of_words] => 9955
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 173
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/915/07915896.pdf
[firstpage_image] =>[orig_patent_app_number] => 12125897
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/125897 | Identification of a defective filament in a fluorescent lamp | May 21, 2008 | Issued |