
Christopher S. Bobish
Examiner (ID: 12524)
| Most Active Art Unit | 3746 |
| Art Unit(s) | 3746 |
| Total Applications | 1057 |
| Issued Applications | 612 |
| Pending Applications | 76 |
| Abandoned Applications | 386 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 828857
[patent_doc_number] => 07403869
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-07-22
[patent_title] => 'System state monitoring using recurrent local learning machine'
[patent_app_type] => utility
[patent_app_number] => 11/119322
[patent_app_country] => US
[patent_app_date] => 2005-04-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 6523
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 198
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/403/07403869.pdf
[firstpage_image] =>[orig_patent_app_number] => 11119322
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/119322 | System state monitoring using recurrent local learning machine | Apr 28, 2005 | Issued |
Array
(
[id] => 859791
[patent_doc_number] => 07376529
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-05-20
[patent_title] => 'Valve tester control enhancements'
[patent_app_type] => utility
[patent_app_number] => 11/058506
[patent_app_country] => US
[patent_app_date] => 2005-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 6655
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/376/07376529.pdf
[firstpage_image] =>[orig_patent_app_number] => 11058506
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/058506 | Valve tester control enhancements | Feb 14, 2005 | Issued |
Array
(
[id] => 5678976
[patent_doc_number] => 20060184332
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-17
[patent_title] => 'Test apparatus and test method'
[patent_app_type] => utility
[patent_app_number] => 11/056330
[patent_app_country] => US
[patent_app_date] => 2005-02-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 7283
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0184/20060184332.pdf
[firstpage_image] =>[orig_patent_app_number] => 11056330
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/056330 | Test apparatus and test method for testing a device under test | Feb 10, 2005 | Issued |
Array
(
[id] => 6967782
[patent_doc_number] => 20050234679
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-20
[patent_title] => 'Sequential selective integration of sensor data'
[patent_app_type] => utility
[patent_app_number] => 11/055307
[patent_app_country] => US
[patent_app_date] => 2005-02-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 24
[patent_no_of_words] => 40609
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0234/20050234679.pdf
[firstpage_image] =>[orig_patent_app_number] => 11055307
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/055307 | Sequential selective integration of sensor data | Feb 9, 2005 | Abandoned |
Array
(
[id] => 5673491
[patent_doc_number] => 20060178846
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-10
[patent_title] => 'Differential termination and attenuator network for a measurement probe'
[patent_app_type] => utility
[patent_app_number] => 11/051596
[patent_app_country] => US
[patent_app_date] => 2005-02-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5547
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0178/20060178846.pdf
[firstpage_image] =>[orig_patent_app_number] => 11051596
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/051596 | Differential termination and attenuator network for a measurement probe | Feb 3, 2005 | Issued |
Array
(
[id] => 5670720
[patent_doc_number] => 20060176074
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-10
[patent_title] => 'Differential termination and attenuator network for a measurement probe having an automated common mode termination voltage generator'
[patent_app_type] => utility
[patent_app_number] => 11/051653
[patent_app_country] => US
[patent_app_date] => 2005-02-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 9253
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0176/20060176074.pdf
[firstpage_image] =>[orig_patent_app_number] => 11051653
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/051653 | Differential termination and attenuator network for a measurement probe having an automated common mode termination voltage generator | Feb 3, 2005 | Issued |
Array
(
[id] => 5670676
[patent_doc_number] => 20060176030
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-10
[patent_title] => 'Differential termination attenuator network for a measurement probe having an internal termination voltage generator'
[patent_app_type] => utility
[patent_app_number] => 11/051425
[patent_app_country] => US
[patent_app_date] => 2005-02-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 6418
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0176/20060176030.pdf
[firstpage_image] =>[orig_patent_app_number] => 11051425
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/051425 | Differential termination attenuator network for a measurement probe having an internal termination voltage generator | Feb 3, 2005 | Issued |
Array
(
[id] => 7112876
[patent_doc_number] => 20050210332
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-09-22
[patent_title] => 'Module with trigger bus for SOC tester and a method of timing calibration in the module'
[patent_app_type] => utility
[patent_app_number] => 11/050581
[patent_app_country] => US
[patent_app_date] => 2005-02-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2925
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0210/20050210332.pdf
[firstpage_image] =>[orig_patent_app_number] => 11050581
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/050581 | Module with trigger bus for SOC tester and a method of timing calibration in the module | Feb 2, 2005 | Abandoned |
Array
(
[id] => 851503
[patent_doc_number] => 07383140
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-06-03
[patent_title] => 'Capacitance, inductance and impedance measurements using multi-tone stimulation and DSP algorithms'
[patent_app_type] => utility
[patent_app_number] => 11/049028
[patent_app_country] => US
[patent_app_date] => 2005-02-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 32
[patent_no_of_words] => 10830
[patent_no_of_claims] => 58
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 176
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/383/07383140.pdf
[firstpage_image] =>[orig_patent_app_number] => 11049028
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/049028 | Capacitance, inductance and impedance measurements using multi-tone stimulation and DSP algorithms | Feb 1, 2005 | Issued |
Array
(
[id] => 5668299
[patent_doc_number] => 20060173649
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-03
[patent_title] => 'Active speed detecting device for vehicle'
[patent_app_type] => utility
[patent_app_number] => 11/045258
[patent_app_country] => US
[patent_app_date] => 2005-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 1986
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0173/20060173649.pdf
[firstpage_image] =>[orig_patent_app_number] => 11045258
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/045258 | Active speed detecting device for vehicle | Jan 30, 2005 | Abandoned |
Array
(
[id] => 452855
[patent_doc_number] => 07251569
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-07-31
[patent_title] => 'Method and apparatus for determining material breakdown and product compliance'
[patent_app_type] => utility
[patent_app_number] => 11/043821
[patent_app_country] => US
[patent_app_date] => 2005-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 25
[patent_no_of_words] => 6426
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 183
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/251/07251569.pdf
[firstpage_image] =>[orig_patent_app_number] => 11043821
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/043821 | Method and apparatus for determining material breakdown and product compliance | Jan 25, 2005 | Issued |
Array
(
[id] => 378561
[patent_doc_number] => 07313500
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-12-25
[patent_title] => 'Method to increase the maximum allowable ambient temperature rating of an electronic device'
[patent_app_type] => utility
[patent_app_number] => 10/982366
[patent_app_country] => US
[patent_app_date] => 2004-11-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 5224
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 152
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/313/07313500.pdf
[firstpage_image] =>[orig_patent_app_number] => 10982366
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/982366 | Method to increase the maximum allowable ambient temperature rating of an electronic device | Nov 4, 2004 | Issued |
Array
(
[id] => 884735
[patent_doc_number] => 07356420
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-04-08
[patent_title] => 'Analyzing system for the detection of reducing and oxidizing gases in a carrier gas with a metal-oxide-semiconductor sensor arrangement'
[patent_app_type] => utility
[patent_app_number] => 10/538585
[patent_app_country] => US
[patent_app_date] => 2003-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3580
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 258
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/356/07356420.pdf
[firstpage_image] =>[orig_patent_app_number] => 10538585
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/538585 | Analyzing system for the detection of reducing and oxidizing gases in a carrier gas with a metal-oxide-semiconductor sensor arrangement | Dec 22, 2003 | Issued |
Array
(
[id] => 7475977
[patent_doc_number] => 20040122620
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-06-24
[patent_title] => 'Apparatus and method for testing semiconductor device'
[patent_app_type] => new
[patent_app_number] => 10/732763
[patent_app_country] => US
[patent_app_date] => 2003-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 29
[patent_figures_cnt] => 29
[patent_no_of_words] => 18483
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 165
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0122/20040122620.pdf
[firstpage_image] =>[orig_patent_app_number] => 10732763
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/732763 | Apparatus and method for testing semiconductor device | Dec 9, 2003 | Issued |
Array
(
[id] => 550282
[patent_doc_number] => 07181347
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-02-20
[patent_title] => 'Method for the 3-D prediction of free-surface multiples'
[patent_app_type] => utility
[patent_app_number] => 10/668927
[patent_app_country] => US
[patent_app_date] => 2003-09-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5485
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 176
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/181/07181347.pdf
[firstpage_image] =>[orig_patent_app_number] => 10668927
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/668927 | Method for the 3-D prediction of free-surface multiples | Sep 22, 2003 | Issued |
Array
(
[id] => 7139246
[patent_doc_number] => 20050115781
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-02
[patent_title] => 'Electromechanical actuator device incorporating a torque transducer'
[patent_app_type] => utility
[patent_app_number] => 10/435040
[patent_app_country] => US
[patent_app_date] => 2003-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2421
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0115/20050115781.pdf
[firstpage_image] =>[orig_patent_app_number] => 10435040
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/435040 | Electromechanical actuator device incorporating a torque transducer | May 11, 2003 | Abandoned |
Array
(
[id] => 7672427
[patent_doc_number] => 20040181352
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-09-16
[patent_title] => 'Inspection window guard banding'
[patent_app_type] => new
[patent_app_number] => 10/385079
[patent_app_country] => US
[patent_app_date] => 2003-03-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3509
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0181/20040181352.pdf
[firstpage_image] =>[orig_patent_app_number] => 10385079
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/385079 | Inspection window guard banding | Mar 9, 2003 | Issued |
Array
(
[id] => 438040
[patent_doc_number] => 07263447
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-08-28
[patent_title] => 'Method and apparatus for electron density measurement and verifying process status'
[patent_app_type] => utility
[patent_app_number] => 10/495864
[patent_app_country] => US
[patent_app_date] => 2003-01-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 7036
[patent_no_of_claims] => 36
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/263/07263447.pdf
[firstpage_image] =>[orig_patent_app_number] => 10495864
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/495864 | Method and apparatus for electron density measurement and verifying process status | Jan 29, 2003 | Issued |