Search

Clemence S. Han

Examiner (ID: 8682, Phone: (571)272-3158 , Office: P/2414 )

Most Active Art Unit
2414
Art Unit(s)
2616, 2414, 2416, 2464, 2665, 2668
Total Applications
1529
Issued Applications
1315
Pending Applications
106
Abandoned Applications
135

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20051077 [patent_doc_number] => 20250189299 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-06-12 [patent_title] => Device and Method for Measuring Wafers [patent_app_type] => utility [patent_app_number] => 18/840843 [patent_app_country] => US [patent_app_date] => 2023-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18840843 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/840843
Device and Method for Measuring Wafers Jan 24, 2023 Pending
Array ( [id] => 18809877 [patent_doc_number] => 20230384212 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-30 [patent_title] => INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY DEVICE USING THE SAME [patent_app_type] => utility [patent_app_number] => 18/097924 [patent_app_country] => US [patent_app_date] => 2023-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7837 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18097924 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/097924
INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY DEVICE USING THE SAME Jan 16, 2023 Pending
Array ( [id] => 19710310 [patent_doc_number] => 20250020452 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => DISPLACEMENT MEASUREMENT APPARATUS, NON-CONTACT INPUT APPARATUS, AND BIOLOGICAL MICROMOTION MEASUREMENT APPARATUS [patent_app_type] => utility [patent_app_number] => 18/710644 [patent_app_country] => US [patent_app_date] => 2022-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9262 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18710644 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/710644
DISPLACEMENT MEASUREMENT APPARATUS, NON-CONTACT INPUT APPARATUS, AND BIOLOGICAL MICROMOTION MEASUREMENT APPARATUS Dec 19, 2022 Pending
Array ( [id] => 20751100 [patent_doc_number] => 20260153324 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-06-04 [patent_title] => PARALLEL OPTICAL COHERENCE TOMOGRAPHY SYSTEM USING AN INTEGRATED PHOTONIC DEVICE [patent_app_type] => utility [patent_app_number] => 18/719105 [patent_app_country] => US [patent_app_date] => 2022-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3484 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18719105 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/719105
PARALLEL OPTICAL COHERENCE TOMOGRAPHY SYSTEM USING AN INTEGRATED PHOTONIC DEVICE Dec 12, 2022 Pending
Array ( [id] => 18453064 [patent_doc_number] => 20230194344 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-22 [patent_title] => METHOD OF ANALYZING A SPECTRAL PEAK [patent_app_type] => utility [patent_app_number] => 18/064651 [patent_app_country] => US [patent_app_date] => 2022-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8083 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18064651 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/064651
Method of analyzing a spectral peak Dec 11, 2022 Issued
Array ( [id] => 18408285 [patent_doc_number] => 20230169638 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-01 [patent_title] => AUTOMATIC QUALITY CATEGORIZATION METHOD AND SYSTEM FOR PHARMACEUTICAL GLASS CONTAINERS [patent_app_type] => utility [patent_app_number] => 17/994900 [patent_app_country] => US [patent_app_date] => 2022-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8897 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17994900 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/994900
AUTOMATIC QUALITY CATEGORIZATION METHOD AND SYSTEM FOR PHARMACEUTICAL GLASS CONTAINERS Nov 27, 2022 Pending
Array ( [id] => 20519626 [patent_doc_number] => 20260043730 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-02-12 [patent_title] => METROLOGY APPARATUS AND METHOD [patent_app_type] => utility [patent_app_number] => 18/707413 [patent_app_country] => US [patent_app_date] => 2022-11-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5591 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18707413 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/707413
METROLOGY APPARATUS AND METHOD Nov 13, 2022 Pending
Array ( [id] => 19644080 [patent_doc_number] => 20240418600 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-19 [patent_title] => METHOD FOR THE GEOMETRIC CHARACTERISATION OF OPTICAL LENSES [patent_app_type] => utility [patent_app_number] => 18/706079 [patent_app_country] => US [patent_app_date] => 2022-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11606 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18706079 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/706079
METHOD FOR THE GEOMETRIC CHARACTERISATION OF OPTICAL LENSES Nov 6, 2022 Pending
Array ( [id] => 19685190 [patent_doc_number] => 20250003735 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-02 [patent_title] => HIGH TEMPERATURE MOLD GAP MEASUREMENT USING OPTICAL FIBER INTERFEROMETRY [patent_app_type] => utility [patent_app_number] => 18/706149 [patent_app_country] => US [patent_app_date] => 2022-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3428 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18706149 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/706149
High temperature mold gap measurement using optical fiber interferometry Oct 31, 2022 Issued
Array ( [id] => 18613727 [patent_doc_number] => 20230280463 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-07 [patent_title] => CHIRPED COHERENT LASER RADAR SYSTEM AND METHOD [patent_app_type] => utility [patent_app_number] => 17/962468 [patent_app_country] => US [patent_app_date] => 2022-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8041 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17962468 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/962468
CHIRPED COHERENT LASER RADAR SYSTEM AND METHOD Oct 7, 2022 Pending
Array ( [id] => 20186206 [patent_doc_number] => 12397308 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-26 [patent_title] => Method for analysing a spray generated by a device for dispensing fluid pharmaceutical product [patent_app_type] => utility [patent_app_number] => 17/960345 [patent_app_country] => US [patent_app_date] => 2022-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 0 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17960345 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/960345
Method for analysing a spray generated by a device for dispensing fluid pharmaceutical product Oct 4, 2022 Issued
Array ( [id] => 18392469 [patent_doc_number] => 20230160688 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-25 [patent_title] => SUBSTRATE PROCESSING APPARATUS AND METHOD OF MEASURING FILM THICKNESS [patent_app_type] => utility [patent_app_number] => 17/955660 [patent_app_country] => US [patent_app_date] => 2022-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7435 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17955660 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/955660
SUBSTRATE PROCESSING APPARATUS AND METHOD OF MEASURING FILM THICKNESS Sep 28, 2022 Pending
Array ( [id] => 20453869 [patent_doc_number] => 12516921 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-06 [patent_title] => Laser interferometer [patent_app_type] => utility [patent_app_number] => 17/953978 [patent_app_country] => US [patent_app_date] => 2022-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 16 [patent_no_of_words] => 12037 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17953978 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/953978
Laser interferometer Sep 26, 2022 Issued
Array ( [id] => 18282967 [patent_doc_number] => 20230098439 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-30 [patent_title] => SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC AND ELLIPSOMETRIC SIGNALS OF MULTI-LAYER THIN FILMS [patent_app_type] => utility [patent_app_number] => 17/934859 [patent_app_country] => US [patent_app_date] => 2022-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16064 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17934859 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/934859
Systems and methods for concurrent measurements of interferometric and ellipsometric signals of multi-layer thin films Sep 22, 2022 Issued
Array ( [id] => 18142837 [patent_doc_number] => 20230016681 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-19 [patent_title] => FABRY-PEROT CAVITY PHASE MODULATOR, AN OPTICAL MODULATING DEVICE INCLUDING THE SAME, AND A LIDAR APPARATUS INCLUDING THE OPTICAL MODULATING DEVICE [patent_app_type] => utility [patent_app_number] => 17/948026 [patent_app_country] => US [patent_app_date] => 2022-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5987 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17948026 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/948026
Fabry-Perot cavity phase modulator including a tunable core, an optical modulating device including the same, and a lidar apparatus including the optical modulating device Sep 18, 2022 Issued
Array ( [id] => 20358276 [patent_doc_number] => 12474266 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-18 [patent_title] => Method and system for moire profilimetry using simultaneous dual fringe projection [patent_app_type] => utility [patent_app_number] => 17/932551 [patent_app_country] => US [patent_app_date] => 2022-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 2791 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17932551 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/932551
Method and system for moire profilimetry using simultaneous dual fringe projection Sep 14, 2022 Issued
Array ( [id] => 18487644 [patent_doc_number] => 20230214990 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-06 [patent_title] => ELECTRONIC DEVICE INCLUDING PROCESSOR EXECUTING DEFECT DETECTION MODULE, OPERATING METHOD OF ELECTRONIC DEVICE, AND METHOD FOR FABRICATING SEMICONDUCTOR INTEGRATED CIRCUIT [patent_app_type] => utility [patent_app_number] => 17/900334 [patent_app_country] => US [patent_app_date] => 2022-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7652 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17900334 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/900334
Electronic device including processor executing defect detection module, operating method of electronic device, and method for fabricating semiconductor integrated circuit Aug 30, 2022 Issued
Array ( [id] => 18439305 [patent_doc_number] => 20230186600 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-15 [patent_title] => METHOD OF CLUSTERING USING ENCODER-DECODER MODEL BASED ON ATTENTION MECHANISM AND STORAGE MEDIUM FOR IMAGE RECOGNITION [patent_app_type] => utility [patent_app_number] => 17/894988 [patent_app_country] => US [patent_app_date] => 2022-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4527 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 438 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17894988 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/894988
METHOD OF CLUSTERING USING ENCODER-DECODER MODEL BASED ON ATTENTION MECHANISM AND STORAGE MEDIUM FOR IMAGE RECOGNITION Aug 23, 2022 Abandoned
Array ( [id] => 18990386 [patent_doc_number] => 20240062355 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-22 [patent_title] => OVERLAY MEASUREMENT FOR A SEMICONDUCTOR SPECIMEN [patent_app_type] => utility [patent_app_number] => 17/893082 [patent_app_country] => US [patent_app_date] => 2022-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11808 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17893082 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/893082
Overlay measurement between layers of a semiconductor specimen based on center of symmetry (COS) localization Aug 21, 2022 Issued
Array ( [id] => 18456203 [patent_doc_number] => 20230197485 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-22 [patent_title] => SEMICONDUCTOR INSPECTION APPARATUS, SEMICONDUCTOR INSPECTION SYSTEM INCLUDING THE SAME, AND SEMICONDUCTOR INSPECTION METHOD USING THE SAME [patent_app_type] => utility [patent_app_number] => 17/890648 [patent_app_country] => US [patent_app_date] => 2022-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8086 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17890648 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/890648
Semiconductor inspection method including heating a top surface of a semiconductor package Aug 17, 2022 Issued
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