Courtney G. Mcdonnough

Array ( [id] => 18045947 [patent_doc_number] => 11519896 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-12-06 [patent_title] => Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus [patent_app_type] => utility [patent_app_number] => 17/210396 [patent_app_country] => US [patent_app_date] => 2021-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 14 [patent_no_of_words] => 12644 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17210396 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18278649 [patent_doc_number] => 20230094121 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-30 [patent_title] => SOIL MOISTURE DETECTION SENSOR HAVING METAL-ORGANIC FRAMEWORK AND METHOD [patent_app_type] => utility [patent_app_number] => 17/910138 [patent_app_country] => US [patent_app_date] => 2021-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3976 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17910138 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17564477 [patent_doc_number] => 20220128626 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-28 [patent_title] => CHIP TRAY KIT AND CHIP TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 17/195557 [patent_app_country] => US [patent_app_date] => 2021-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10014 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 455 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17195557 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18359961 [patent_doc_number] => 20230141552 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-11 [patent_title] => SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 17/912880 [patent_app_country] => US [patent_app_date] => 2021-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11998 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17912880 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18342482 [patent_doc_number] => 11639959 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-02 [patent_title] => Defect localization in embedded memory [patent_app_type] => utility [patent_app_number] => 17/179133 [patent_app_country] => US [patent_app_date] => 2021-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4329 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17179133 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17860940 [patent_doc_number] => 11442096 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-09-13 [patent_title] => Testing apparatus [patent_app_type] => utility [patent_app_number] => 17/168422 [patent_app_country] => US [patent_app_date] => 2021-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7822 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 290 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17168422 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17628455 [patent_doc_number] => 20220163470 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-26 [patent_title] => METHOD FOR CALCULATING LIQUID-SOLID INTERFACE MORPHOLOGY DURING GROWTH OF INGOT [patent_app_type] => utility [patent_app_number] => 17/167417 [patent_app_country] => US [patent_app_date] => 2021-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4909 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17167417 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18213115 [patent_doc_number] => 20230059379 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-02-23 [patent_title] => METHOD OF COMPUTER SIMULATION [patent_app_type] => utility [patent_app_number] => 17/797263 [patent_app_country] => US [patent_app_date] => 2021-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16381 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17797263 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16993309 [patent_doc_number] => 20210231729 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-29 [patent_title] => HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY [patent_app_type] => utility [patent_app_number] => 17/158994 [patent_app_country] => US [patent_app_date] => 2021-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6750 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17158994 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17618695 [patent_doc_number] => 11337718 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-24 [patent_title] => System and method for controlling an ultrasonic tool [patent_app_type] => utility [patent_app_number] => 17/154324 [patent_app_country] => US [patent_app_date] => 2021-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 8869 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17154324 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19718443 [patent_doc_number] => 12203974 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-01-21 [patent_title] => Semiconductor fault analysis device and semiconductor fault analysis method [patent_app_type] => utility [patent_app_number] => 17/799009 [patent_app_country] => US [patent_app_date] => 2021-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 24875 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17799009 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18046009 [patent_doc_number] => 11519958 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-12-06 [patent_title] => Semiconductor module inspection device with robot [patent_app_type] => utility [patent_app_number] => 17/142438 [patent_app_country] => US [patent_app_date] => 2021-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 6529 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17142438 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18255380 [patent_doc_number] => 20230082419 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-16 [patent_title] => SEMICONDUCTOR DEVICE AND TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 17/904723 [patent_app_country] => US [patent_app_date] => 2021-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13183 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17904723 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19933042 [patent_doc_number] => 12306245 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-20 [patent_title] => On-chip current sensor [patent_app_type] => utility [patent_app_number] => 17/139246 [patent_app_country] => US [patent_app_date] => 2020-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 1158 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17139246 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16933825 [patent_doc_number] => 20210199714 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-01 [patent_title] => Correlation between Emission Spots Utilizing CAD Data in Combination with Emission Microscope Images [patent_app_type] => utility [patent_app_number] => 17/135240 [patent_app_country] => US [patent_app_date] => 2020-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10083 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17135240 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17801330 [patent_doc_number] => 11415626 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-16 [patent_title] => Method and apparatus comprising a semiconductor device and test apparatus [patent_app_type] => utility [patent_app_number] => 17/118828 [patent_app_country] => US [patent_app_date] => 2020-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 7687 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17118828 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18330229 [patent_doc_number] => 11635461 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-25 [patent_title] => Test apparatus and method for testing a semiconductor device [patent_app_type] => utility [patent_app_number] => 17/115236 [patent_app_country] => US [patent_app_date] => 2020-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 7932 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17115236 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19565842 [patent_doc_number] => 12140608 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-11-12 [patent_title] => Systems and methods for starting a sensorless motor [patent_app_type] => utility [patent_app_number] => 17/783486 [patent_app_country] => US [patent_app_date] => 2020-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5809 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17783486 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18598442 [patent_doc_number] => 20230273241 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-31 [patent_title] => SEMICONDUCTOR LASER INSPECTION APPARATUS [patent_app_type] => utility [patent_app_number] => 18/004228 [patent_app_country] => US [patent_app_date] => 2020-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4246 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -1 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18004228 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17588849 [patent_doc_number] => 11327111 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-10 [patent_title] => Environment control apparatus and chip testing system [patent_app_type] => utility [patent_app_number] => 17/106186 [patent_app_country] => US [patent_app_date] => 2020-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 12576 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 452 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17106186 [rel_patent_id] =>[rel_patent_doc_number] =>)