Search

Courtney G. Mcdonnough

Examiner (ID: 4260, Phone: (571)272-6552 , Office: P/2866 )

Most Active Art Unit
2866
Art Unit(s)
2866, 2858
Total Applications
694
Issued Applications
551
Pending Applications
51
Abandoned Applications
99

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18014416 [patent_doc_number] => 11506708 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-11-22 [patent_title] => On-wafer tuner system and method [patent_app_type] => utility [patent_app_number] => 17/102936 [patent_app_country] => US [patent_app_date] => 2020-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 14 [patent_no_of_words] => 4320 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17102936 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/102936
On-wafer tuner system and method Nov 23, 2020 Issued
Array ( [id] => 19506064 [patent_doc_number] => 12117480 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-15 [patent_title] => Semiconductor failure analysis device and semiconductor failure analysis method [patent_app_type] => utility [patent_app_number] => 17/798980 [patent_app_country] => US [patent_app_date] => 2020-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9661 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 308 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17798980 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/798980
Semiconductor failure analysis device and semiconductor failure analysis method Nov 16, 2020 Issued
Array ( [id] => 18110913 [patent_doc_number] => 20230003793 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-05 [patent_title] => APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TESTING DEVICE HAVING FINE PITCH, AND DEVICE ALIGNMENT METHOD [patent_app_type] => utility [patent_app_number] => 17/783942 [patent_app_country] => US [patent_app_date] => 2020-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4549 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17783942 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/783942
Apparatus for aligning device having fine pitch, apparatus for testing device having fine pitch, and device alignment method Nov 2, 2020 Issued
Array ( [id] => 17816568 [patent_doc_number] => 11422175 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-23 [patent_title] => Live measurement method for three-winding transformer loss based on windowed frequency shift [patent_app_type] => utility [patent_app_number] => 17/081726 [patent_app_country] => US [patent_app_date] => 2020-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4538 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 551 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17081726 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/081726
Live measurement method for three-winding transformer loss based on windowed frequency shift Oct 26, 2020 Issued
Array ( [id] => 17400962 [patent_doc_number] => 20220043052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-10 [patent_title] => SEMICONDUCTOR COMPONENT BURN-IN TEST MODULE AND BURN-IN TEST EQUIPMENT [patent_app_type] => utility [patent_app_number] => 17/078126 [patent_app_country] => US [patent_app_date] => 2020-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4849 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17078126 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/078126
Semiconductor component burn-in test module and burn-in test equipment Oct 22, 2020 Issued
Array ( [id] => 16729059 [patent_doc_number] => 20210096206 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-01 [patent_title] => PROBE SYSTEMS AND METHODS FOR CHARACTERIZING OPTICAL COUPLING BETWEEN AN OPTICAL PROBE OF A PROBE SYSTEM AND A CALIBRATION STRUCTURE [patent_app_type] => utility [patent_app_number] => 17/028102 [patent_app_country] => US [patent_app_date] => 2020-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14463 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17028102 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/028102
Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure Sep 21, 2020 Issued
Array ( [id] => 17038257 [patent_doc_number] => 20210255216 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-08-19 [patent_title] => PROBE SHEET FOR NON-INVASIVE NANOSCALE ELECTRICAL CHARACTERIZATION [patent_app_type] => utility [patent_app_number] => 17/023085 [patent_app_country] => US [patent_app_date] => 2020-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4891 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17023085 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/023085
PROBE SHEET FOR NON-INVASIVE NANOSCALE ELECTRICAL CHARACTERIZATION Sep 15, 2020 Abandoned
Array ( [id] => 16538773 [patent_doc_number] => 20200405186 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-12-31 [patent_title] => CAPACITANCE MEASURING AND IMAGING SENSOR SYSTEM [patent_app_type] => utility [patent_app_number] => 17/021509 [patent_app_country] => US [patent_app_date] => 2020-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7625 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17021509 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/021509
Capacitance measuring and imaging sensor system Sep 14, 2020 Issued
Array ( [id] => 17898446 [patent_doc_number] => 20220308108 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-29 [patent_title] => SEMICONDUCTOR SAMPLE INSPECTION DEVICE AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 17/641504 [patent_app_country] => US [patent_app_date] => 2020-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14973 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17641504 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/641504
Semiconductor sample inspection device and inspection method Aug 26, 2020 Issued
Array ( [id] => 16438404 [patent_doc_number] => 20200355730 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-11-12 [patent_title] => THRU-LINE DIRECTIONAL POWER SENSOR HAVING MICROSTRIP COUPLER [patent_app_type] => utility [patent_app_number] => 16/941520 [patent_app_country] => US [patent_app_date] => 2020-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16969 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16941520 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/941520
Thru-line directional power sensor having microstrip coupler Jul 27, 2020 Issued
Array ( [id] => 18568370 [patent_doc_number] => 20230258706 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-17 [patent_title] => METHOD FOR PARTIAL DISCHARGE RECOGNITION IN HIGH VOLTAGE APPLICATIONS AND UNIT USING THE METHOD [patent_app_type] => utility [patent_app_number] => 18/015400 [patent_app_country] => US [patent_app_date] => 2020-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3241 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18015400 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/015400
Method for partial discharge recognition in high voltage applications and unit using the method Jul 16, 2020 Issued
Array ( [id] => 16599403 [patent_doc_number] => 20210025934 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-01-28 [patent_title] => Combined Transmitted and Reflected Light Imaging of Internal Cracks in Semiconductor Devices [patent_app_type] => utility [patent_app_number] => 16/926757 [patent_app_country] => US [patent_app_date] => 2020-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7129 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16926757 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/926757
Combined transmitted and reflected light imaging of internal cracks in semiconductor devices Jul 11, 2020 Issued
Array ( [id] => 16393482 [patent_doc_number] => 20200334423 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-10-22 [patent_title] => LOW LOSS ACOUSTIC WAVE SENSORS AND TAGS AND HIGH EFFICIENCY ANTENNAS AND METHODS FOR REMOTE ACTIVATION THEREOF [patent_app_type] => utility [patent_app_number] => 16/923138 [patent_app_country] => US [patent_app_date] => 2020-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10868 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -2 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16923138 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/923138
Low loss acoustic wave sensors and tags and high efficiency antennas and methods for remote activation thereof Jul 7, 2020 Issued
Array ( [id] => 17801142 [patent_doc_number] => 11415435 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-16 [patent_title] => Encoder and signal processing method using the same [patent_app_type] => utility [patent_app_number] => 16/917272 [patent_app_country] => US [patent_app_date] => 2020-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 13 [patent_no_of_words] => 4476 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16917272 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/917272
Encoder and signal processing method using the same Jun 29, 2020 Issued
Array ( [id] => 17944452 [patent_doc_number] => 20220331469 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-20 [patent_title] => A METHOD AND DEVICE FOR MONITORING THE STATUS OF A HIGH-LEVEL DISINFECTION DEVICE [patent_app_type] => utility [patent_app_number] => 17/621054 [patent_app_country] => US [patent_app_date] => 2020-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5247 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17621054 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/621054
Method and device for monitoring the status of a high-level disinfection device Jun 20, 2020 Issued
Array ( [id] => 18981414 [patent_doc_number] => 11906579 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-20 [patent_title] => Wafer-level test method for optoelectronic chips [patent_app_type] => utility [patent_app_number] => 17/770916 [patent_app_country] => US [patent_app_date] => 2020-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 5440 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 434 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17770916 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/770916
Wafer-level test method for optoelectronic chips Jun 18, 2020 Issued
Array ( [id] => 18180323 [patent_doc_number] => 20230041052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-02-09 [patent_title] => METHOD FOR PREDICTING AN ELECTRIC LOAD IMPARTED ON EACH BATTERY UNIT IN AN ELECTRIC ENERGY STORAGE SYSTEM [patent_app_type] => utility [patent_app_number] => 17/757636 [patent_app_country] => US [patent_app_date] => 2020-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12157 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -22 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17757636 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/757636
Method for predicting an electric load imparted on each battery unit in an electric energy storage system Jun 17, 2020 Issued
Array ( [id] => 16542415 [patent_doc_number] => 20200408829 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-12-31 [patent_title] => METHODS OF DETERMINING OPERATING CONDITIONS OF SILICON CARBIDE POWER MOSFET DEVICES ASSOCIATED WITH AGING, RELATED CIRCUITS AND COMPUTER PROGRAM PRODUCTS [patent_app_type] => utility [patent_app_number] => 16/897719 [patent_app_country] => US [patent_app_date] => 2020-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9711 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16897719 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/897719
Methods of determining operating conditions of silicon carbide power MOSFET devices associated with aging, related circuits and computer program products Jun 9, 2020 Issued
Array ( [id] => 19355071 [patent_doc_number] => 12055506 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-06 [patent_title] => Standardizing the output of an electrical property sensor [patent_app_type] => utility [patent_app_number] => 17/632043 [patent_app_country] => US [patent_app_date] => 2020-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4263 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 228 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17632043 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/632043
Standardizing the output of an electrical property sensor May 27, 2020 Issued
Array ( [id] => 19043992 [patent_doc_number] => 11933084 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-19 [patent_title] => Sensor and device for presence detection [patent_app_type] => utility [patent_app_number] => 17/606596 [patent_app_country] => US [patent_app_date] => 2020-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 4170 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17606596 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/606596
Sensor and device for presence detection May 17, 2020 Issued
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