Search

Courtney G. Mcdonnough

Examiner (ID: 4260, Phone: (571)272-6552 , Office: P/2866 )

Most Active Art Unit
2866
Art Unit(s)
2866, 2858
Total Applications
694
Issued Applications
551
Pending Applications
51
Abandoned Applications
99

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20635289 [patent_doc_number] => 12596161 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-04-07 [patent_title] => Methods and systems for adjusting subject table behaviors [patent_app_type] => utility [patent_app_number] => 18/449595 [patent_app_country] => US [patent_app_date] => 2023-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9326 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18449595 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/449595
Methods and systems for adjusting subject table behaviors Aug 13, 2023 Issued
Array ( [id] => 18806525 [patent_doc_number] => 20230380855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-30 [patent_title] => System And Method For Controlling An Ultrasonic Tool [patent_app_type] => utility [patent_app_number] => 18/232872 [patent_app_country] => US [patent_app_date] => 2023-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8899 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18232872 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/232872
System and method for controlling an ultrasonic tool Aug 10, 2023 Issued
Array ( [id] => 18973307 [patent_doc_number] => 20240053399 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-15 [patent_title] => SEMICONDUCTOR WAFER TEST SYSTEM BY FEEDBACK CONTROL [patent_app_type] => utility [patent_app_number] => 18/232056 [patent_app_country] => US [patent_app_date] => 2023-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5002 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18232056 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/232056
Semiconductor wafer test system by feedback control Aug 8, 2023 Issued
Array ( [id] => 18941004 [patent_doc_number] => 20240036143 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-01 [patent_title] => DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTRUMENT [patent_app_type] => utility [patent_app_number] => 18/359789 [patent_app_country] => US [patent_app_date] => 2023-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6335 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18359789 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/359789
DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTRUMENT Jul 25, 2023 Pending
Array ( [id] => 19747001 [patent_doc_number] => 20250035566 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-30 [patent_title] => APPARATUS FOR GAS IDENTIFICATION USING HIGH FREQUENCY MICROWAVE CAVITIES [patent_app_type] => utility [patent_app_number] => 18/358626 [patent_app_country] => US [patent_app_date] => 2023-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5234 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18358626 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/358626
APPARATUS FOR GAS IDENTIFICATION USING HIGH FREQUENCY MICROWAVE CAVITIES Jul 24, 2023 Pending
Array ( [id] => 19052309 [patent_doc_number] => 20240094278 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE [patent_app_type] => utility [patent_app_number] => 18/350250 [patent_app_country] => US [patent_app_date] => 2023-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10123 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18350250 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/350250
APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE Jul 10, 2023 Pending
Array ( [id] => 18727179 [patent_doc_number] => 20230341463 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-26 [patent_title] => Architecture and Testing for an Integrated Circuit Package [patent_app_type] => utility [patent_app_number] => 18/217200 [patent_app_country] => US [patent_app_date] => 2023-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6102 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18217200 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/217200
Architecture and Testing for an Integrated Circuit Package Jun 29, 2023 Pending
Array ( [id] => 18924508 [patent_doc_number] => 20240027512 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-25 [patent_title] => MEASURING EQUIPMENT AND MEASURING METHOD FOR MEASURING ELECTRONIC PROPERTIES AND OPTICAL PROPERTIES [patent_app_type] => utility [patent_app_number] => 18/336939 [patent_app_country] => US [patent_app_date] => 2023-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5263 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18336939 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/336939
MEASURING EQUIPMENT AND MEASURING METHOD FOR MEASURING ELECTRONIC PROPERTIES AND OPTICAL PROPERTIES Jun 15, 2023 Pending
Array ( [id] => 18694077 [patent_doc_number] => 20230324481 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-12 [patent_title] => ELECTROMAGNETIC SHIELDING FOR MAGNETIC RESONANCE IMAGING METHODS AND APPARATUS [patent_app_type] => utility [patent_app_number] => 18/335961 [patent_app_country] => US [patent_app_date] => 2023-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 54367 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18335961 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/335961
Electromagnetic shielding for magnetic resonance imaging methods and apparatus Jun 14, 2023 Issued
Array ( [id] => 18694048 [patent_doc_number] => 20230324452 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-12 [patent_title] => TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 18/335360 [patent_app_country] => US [patent_app_date] => 2023-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11355 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18335360 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/335360
Test system Jun 14, 2023 Issued
Array ( [id] => 20772726 [patent_doc_number] => 12656393 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-06-16 [patent_title] => Methods and systems for measurement of semiconductor structures based on derivative measurement signals [patent_app_type] => utility [patent_app_number] => 18/210547 [patent_app_country] => US [patent_app_date] => 2023-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 6293 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18210547 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/210547
Methods and systems for measurement of semiconductor structures based on derivative measurement signals Jun 14, 2023 Issued
Array ( [id] => 18904006 [patent_doc_number] => 20240019491 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-18 [patent_title] => METHOD AND APPARATUS FOR PERFORMING DIE-LEVEL ELECTRICAL PARAMETER EXTRACTION THROUGH USING ESTIMATED MAPPING RELATIONSHIP BETWEEN ELECTRICAL PARAMETERS OF TRANSISTOR TYPES AND MEASUREMENT RESULTS OF LOGIC BLOCKS [patent_app_type] => utility [patent_app_number] => 18/207122 [patent_app_country] => US [patent_app_date] => 2023-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2862 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18207122 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/207122
METHOD AND APPARATUS FOR PERFORMING DIE-LEVEL ELECTRICAL PARAMETER EXTRACTION THROUGH USING ESTIMATED MAPPING RELATIONSHIP BETWEEN ELECTRICAL PARAMETERS OF TRANSISTOR TYPES AND MEASUREMENT RESULTS OF LOGIC BLOCKS Jun 6, 2023 Pending
Array ( [id] => 20379865 [patent_doc_number] => 20250362358 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-11-27 [patent_title] => JUMPER WIRE, MODULE AND METHOD FOR DIAGNOSING THE STATE OF HEALTH OF A PLURALITY OF ELECTRICAL CABLES [patent_app_type] => utility [patent_app_number] => 18/867854 [patent_app_country] => US [patent_app_date] => 2023-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1027 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18867854 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/867854
JUMPER WIRE, MODULE AND METHOD FOR DIAGNOSING THE STATE OF HEALTH OF A PLURALITY OF ELECTRICAL CABLES May 21, 2023 Pending
Array ( [id] => 18629583 [patent_doc_number] => 20230288467 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-14 [patent_title] => ELECTROSTATIC CHARGE SENSOR WITH HIGH IMPEDANCE CONTACT PADS [patent_app_type] => utility [patent_app_number] => 18/320867 [patent_app_country] => US [patent_app_date] => 2023-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4451 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18320867 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/320867
Electrostatic charge sensor with high impedance contact pads May 18, 2023 Issued
Array ( [id] => 19498660 [patent_doc_number] => 20240337678 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-10 [patent_title] => PROBE CARD AND CALIBRATION METHOD FOR PROBER [patent_app_type] => utility [patent_app_number] => 18/319507 [patent_app_country] => US [patent_app_date] => 2023-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4778 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18319507 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/319507
PROBE CARD AND CALIBRATION METHOD FOR PROBER May 17, 2023 Pending
Array ( [id] => 18831979 [patent_doc_number] => 20230400506 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-14 [patent_title] => TEMPERATURE CONTROL SYSTEM AND METHOD FOR ELECTRONIC DEVICE-TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 18/316691 [patent_app_country] => US [patent_app_date] => 2023-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4055 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18316691 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/316691
TEMPERATURE CONTROL SYSTEM AND METHOD FOR ELECTRONIC DEVICE-TESTING APPARATUS May 11, 2023 Pending
Array ( [id] => 19397923 [patent_doc_number] => 12072278 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-27 [patent_title] => Development of control samples to enhance the accuracy of HIC testing [patent_app_type] => utility [patent_app_number] => 18/134155 [patent_app_country] => US [patent_app_date] => 2023-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 13278 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18134155 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/134155
Development of control samples to enhance the accuracy of HIC testing Apr 12, 2023 Issued
Array ( [id] => 19498663 [patent_doc_number] => 20240337681 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-10 [patent_title] => MOUNTING SYSTEM, AND METHODS THEREOF [patent_app_type] => utility [patent_app_number] => 18/296884 [patent_app_country] => US [patent_app_date] => 2023-04-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 18559 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18296884 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/296884
MOUNTING SYSTEM, AND METHODS THEREOF Apr 5, 2023 Pending
Array ( [id] => 18729356 [patent_doc_number] => 20230343652 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-26 [patent_title] => TEST METHOD AND MANUFACTURING METHOD [patent_app_type] => utility [patent_app_number] => 18/190947 [patent_app_country] => US [patent_app_date] => 2023-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14157 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18190947 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/190947
TEST METHOD AND MANUFACTURING METHOD Mar 26, 2023 Pending
Array ( [id] => 19277298 [patent_doc_number] => 12027430 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-07-02 [patent_title] => Semiconductor doping characterization method using photoneutralization time constant of corona surface charge [patent_app_type] => utility [patent_app_number] => 18/123211 [patent_app_country] => US [patent_app_date] => 2023-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 6137 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18123211 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/123211
Semiconductor doping characterization method using photoneutralization time constant of corona surface charge Mar 16, 2023 Issued
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