Search

Courtney G. Mcdonnough

Examiner (ID: 4260, Phone: (571)272-6552 , Office: P/2866 )

Most Active Art Unit
2866
Art Unit(s)
2866, 2858
Total Applications
694
Issued Applications
551
Pending Applications
51
Abandoned Applications
99

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18188613 [patent_doc_number] => 11579189 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-02-14 [patent_title] => Electronic component handling apparatus and electronic component testing apparatus [patent_app_type] => utility [patent_app_number] => 17/358528 [patent_app_country] => US [patent_app_date] => 2021-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 13443 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17358528 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/358528
Electronic component handling apparatus and electronic component testing apparatus Jun 24, 2021 Issued
Array ( [id] => 17371434 [patent_doc_number] => 20220026486 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-27 [patent_title] => ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 17/358414 [patent_app_country] => US [patent_app_date] => 2021-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12952 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17358414 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/358414
Electronic component handling apparatus and electronic component testing apparatus Jun 24, 2021 Issued
Array ( [id] => 18568409 [patent_doc_number] => 20230258745 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-17 [patent_title] => Magnetic Field Detection Apparatus, System, and Method [patent_app_type] => utility [patent_app_number] => 18/011092 [patent_app_country] => US [patent_app_date] => 2021-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8166 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18011092 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/011092
Magnetic Field Detection Apparatus, System, and Method Jun 23, 2021 Abandoned
Array ( [id] => 18874673 [patent_doc_number] => 11862495 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-01-02 [patent_title] => Monitor wafer measuring method and measuring apparatus [patent_app_type] => utility [patent_app_number] => 17/598807 [patent_app_country] => US [patent_app_date] => 2021-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3517 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17598807 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/598807
Monitor wafer measuring method and measuring apparatus Jun 15, 2021 Issued
Array ( [id] => 17947148 [patent_doc_number] => 20220334167 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-20 [patent_title] => METHOD FOR DETECTING DEFECTS IN GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR [patent_app_type] => utility [patent_app_number] => 17/343804 [patent_app_country] => US [patent_app_date] => 2021-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2480 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17343804 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/343804
METHOD FOR DETECTING DEFECTS IN GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR Jun 9, 2021 Abandoned
Array ( [id] => 17293915 [patent_doc_number] => 20210389754 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-12-16 [patent_title] => System for Optimizing Semiconductor Yield and enabling Product Traceability throughout Product Life [patent_app_type] => utility [patent_app_number] => 17/339992 [patent_app_country] => US [patent_app_date] => 2021-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4413 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17339992 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/339992
System for Optimizing Semiconductor Yield and enabling Product Traceability throughout Product Life Jun 4, 2021 Abandoned
Array ( [id] => 18527132 [patent_doc_number] => 11714122 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-01 [patent_title] => Semiconductor device and method of testing the same [patent_app_type] => utility [patent_app_number] => 17/338868 [patent_app_country] => US [patent_app_date] => 2021-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5101 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17338868 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/338868
Semiconductor device and method of testing the same Jun 3, 2021 Issued
Array ( [id] => 17387104 [patent_doc_number] => 20220034956 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-03 [patent_title] => WAFER INSPECTION SYSTEM AND WAFER INSPECTION EQUIPMENT THEREOF [patent_app_type] => utility [patent_app_number] => 17/337954 [patent_app_country] => US [patent_app_date] => 2021-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4258 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17337954 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/337954
Wafer inspection system and wafer inspection equipment thereof Jun 2, 2021 Issued
Array ( [id] => 18997168 [patent_doc_number] => 11914004 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-27 [patent_title] => Current transformer with embedded voltage field detection and thermal sensing [patent_app_type] => utility [patent_app_number] => 17/334605 [patent_app_country] => US [patent_app_date] => 2021-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 5592 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17334605 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/334605
Current transformer with embedded voltage field detection and thermal sensing May 27, 2021 Issued
Array ( [id] => 18037600 [patent_doc_number] => 20220381816 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-01 [patent_title] => TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) HETEROSTRUCTURE ON INSULATING AND SEMI-INSULATING SUBSTRATES [patent_app_type] => utility [patent_app_number] => 17/332952 [patent_app_country] => US [patent_app_date] => 2021-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5778 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17332952 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/332952
Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates May 26, 2021 Issued
Array ( [id] => 17337472 [patent_doc_number] => 20220003803 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-06 [patent_title] => METHOD FOR MONITORING POLARIZATION QUALITY OF PIEZOELECTRIC FILM [patent_app_type] => utility [patent_app_number] => 17/329172 [patent_app_country] => US [patent_app_date] => 2021-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6142 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17329172 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/329172
Method for monitoring polarization quality of piezoelectric film May 24, 2021 Issued
Array ( [id] => 17229962 [patent_doc_number] => 20210356519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-11-18 [patent_title] => STRUCTURE AND METHOD FOR TESTING OF PIC WITH AN UPTURNED MIRROR [patent_app_type] => utility [patent_app_number] => 17/242701 [patent_app_country] => US [patent_app_date] => 2021-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 38381 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17242701 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/242701
Structure and method for testing of PIC with an upturned mirror Apr 27, 2021 Issued
Array ( [id] => 18710434 [patent_doc_number] => 20230333058 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-19 [patent_title] => METHOD AND APPARATUS FOR DETECTING DEFECTS OR DETERIORATION IN THE SIDEWALLS OF CAN BODIES [patent_app_type] => utility [patent_app_number] => 17/922722 [patent_app_country] => US [patent_app_date] => 2021-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5985 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17922722 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/922722
Method and apparatus for detecting defects or deterioration in the sidewalls of can bodies Apr 19, 2021 Issued
Array ( [id] => 17853175 [patent_doc_number] => 20220283217 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-08 [patent_title] => EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 17/226460 [patent_app_country] => US [patent_app_date] => 2021-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3169 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17226460 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/226460
EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF Apr 8, 2021 Abandoned
Array ( [id] => 18275538 [patent_doc_number] => 11614478 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-03-28 [patent_title] => Fault detection circuits and methods for drivers [patent_app_type] => utility [patent_app_number] => 17/226924 [patent_app_country] => US [patent_app_date] => 2021-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4826 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17226924 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/226924
Fault detection circuits and methods for drivers Apr 8, 2021 Issued
Array ( [id] => 19764101 [patent_doc_number] => 12222387 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-02-11 [patent_title] => Semiconductor device inspection method and semiconductor device inspection apparatus [patent_app_type] => utility [patent_app_number] => 17/926376 [patent_app_country] => US [patent_app_date] => 2021-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 8869 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17926376 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/926376
Semiconductor device inspection method and semiconductor device inspection apparatus Apr 4, 2021 Issued
Array ( [id] => 17808797 [patent_doc_number] => 20220260632 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-18 [patent_title] => SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR DIE PACKAGES [patent_app_type] => utility [patent_app_number] => 17/212877 [patent_app_country] => US [patent_app_date] => 2021-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10220 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -35 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17212877 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/212877
Systems and methods for evaluating the reliability of semiconductor die packages Mar 24, 2021 Issued
Array ( [id] => 17900799 [patent_doc_number] => 20220310461 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-29 [patent_title] => IN-WAFER TESTING DEVICE [patent_app_type] => utility [patent_app_number] => 17/210550 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3545 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17210550 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/210550
IN-WAFER TESTING DEVICE Mar 23, 2021 Abandoned
Array ( [id] => 18029973 [patent_doc_number] => 11513151 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-11-29 [patent_title] => Test handler and semiconductor device equipment including same [patent_app_type] => utility [patent_app_number] => 17/211385 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 8034 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17211385 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/211385
Test handler and semiconductor device equipment including same Mar 23, 2021 Issued
Array ( [id] => 18470399 [patent_doc_number] => 20230204684 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => COMPUTER-AIDED TESTER FOR CHECKING CONTINUITY OF CIRCUIT [patent_app_type] => utility [patent_app_number] => 17/916073 [patent_app_country] => US [patent_app_date] => 2021-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1172 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17916073 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/916073
COMPUTER-AIDED TESTER FOR CHECKING CONTINUITY OF CIRCUIT Mar 22, 2021 Abandoned
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