
Craig Thompson
Examiner (ID: 2411)
| Most Active Art Unit | 2813 |
| Art Unit(s) | 2811, 2812, 2813, 3999 |
| Total Applications | 616 |
| Issued Applications | 589 |
| Pending Applications | 10 |
| Abandoned Applications | 17 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6434147
[patent_doc_number] => 20020127748
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[patent_kind] => A1
[patent_issue_date] => 2002-09-12
[patent_title] => 'INTEGRATED CIRCUIT DEVICE CHARACTERIZATION'
[patent_app_type] => new
[patent_app_number] => 09/800865
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[pdf_file] => publications/A1/0127/20020127748.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/800865 | Integrated circuit device characterization | Mar 6, 2001 | Issued |
Array
(
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[patent_issue_date] => 2004-04-27
[patent_title] => 'Methods of metal doping a chalcogenide material'
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Array
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[patent_issue_date] => 2002-05-14
[patent_title] => 'Production method for integrated angular speed sensor device'
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Array
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[patent_issue_date] => 2002-09-24
[patent_title] => 'High-temperature high-pressure processing method for semiconductor wafers, and an anti-oxidizing body used for the method'
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[patent_app_number] => 09/788416
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Array
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[patent_title] => 'Method of measuring meso-scale structures on wafers'
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Array
(
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Array
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[patent_title] => 'High stability optical encapsulation and packaging for light-emitting diodes in the green, blue, and near UV range'
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Array
(
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[patent_title] => 'Test structures for silicon etching'
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Array
(
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Array
(
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Array
(
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Array
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Array
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Array
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Array
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Array
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| 09/711125 | Process for monitoring the thickness of layers in a microelectronic device | Nov 8, 2000 | Abandoned |
Array
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