
Cybille Delacroix Muirhei
Examiner (ID: 10366)
| Most Active Art Unit | 1614 |
| Art Unit(s) | 1614, 1102, 1811, 1654 |
| Total Applications | 893 |
| Issued Applications | 513 |
| Pending Applications | 176 |
| Abandoned Applications | 204 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
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[patent_doc_number] => 20080304080
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-11
[patent_title] => 'ASPHERIC LENS SURFACE-DECENTER MEASURING METHOD AND APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/047580
[patent_app_country] => US
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[pdf_file] => publications/A1/0304/20080304080.pdf
[firstpage_image] =>[orig_patent_app_number] => 12047580
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/047580 | Aspheric lens surface-decenter measuring method and apparatus | Mar 12, 2008 | Issued |
Array
(
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[patent_issue_date] => 2008-09-11
[patent_title] => 'Method of motion correction in optical coherence tomography imaging'
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Array
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[patent_title] => 'Methods and Systems for Dynamic Range Expansion'
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[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/043312 | Methods and systems for dynamic range expansion | Mar 5, 2008 | Issued |
Array
(
[id] => 4696582
[patent_doc_number] => 20080218766
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[patent_issue_date] => 2008-09-11
[patent_title] => 'APPARATUS AND METHOD FOR SIZING NANOPARTICLES BASED ON INTERFEROMETRIC FIELD DETECTION'
[patent_app_type] => utility
[patent_app_number] => 12/041873
[patent_app_country] => US
[patent_app_date] => 2008-03-04
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[firstpage_image] =>[orig_patent_app_number] => 12041873
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/041873 | Apparatus and method for sizing nanoparticles based on interferometric field detection | Mar 3, 2008 | Issued |
Array
(
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[patent_doc_number] => 07936462
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[patent_title] => 'Optical coherence tomography imaging system and method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/016484 | Optical coherence tomography imaging system and method | Jan 17, 2008 | Issued |
Array
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[patent_title] => 'Measurement apparatus, exposure apparatus, and device fabrication method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/971569 | Measurement apparatus, exposure apparatus, and device fabrication method | Jan 8, 2008 | Issued |
Array
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[patent_title] => 'FIBER OPTIC CURRENT SENSOR AND METHOD FOR SENSING CURRENT USING THE SAME'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/963371 | FIBER OPTIC CURRENT SENSOR AND METHOD FOR SENSING CURRENT USING THE SAME | Dec 20, 2007 | Abandoned |
Array
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[patent_issue_date] => 2010-09-21
[patent_title] => 'Method and apparatus for reducing fringe interference of light'
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[patent_app_number] => 11/998479
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/998479 | Method and apparatus for reducing fringe interference of light | Nov 29, 2007 | Issued |
Array
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[id] => 4783756
[patent_doc_number] => 20080137085
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[patent_issue_date] => 2008-06-12
[patent_title] => 'METHOD FOR DETERMINING OPTIMAL RESONANT LENGTH TO MAXIMIZE WAVE INTENSITY IN RESONANT STRUCTURE'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/946980 | Method for determining optimal resonant length to maximize wave intensity in resonant structure | Nov 28, 2007 | Issued |
Array
(
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[patent_doc_number] => 20080130012
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[patent_title] => 'DEVICE AND METHOD FOR THE DETERMINATION OF IMAGING ERRORS AND MICROLITHOGRAPHY PROJECTION EXPOSURE SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 11/945125
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/945125 | DEVICE AND METHOD FOR THE DETERMINATION OF IMAGING ERRORS AND MICROLITHOGRAPHY PROJECTION EXPOSURE SYSTEM | Nov 25, 2007 | Abandoned |
Array
(
[id] => 113770
[patent_doc_number] => 07719690
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[patent_issue_date] => 2010-05-18
[patent_title] => 'Optical inclination sensor'
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Array
(
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Array
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Array
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Array
(
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[patent_title] => 'NOISE CANCELLATION IN FOURIER TRANSFORM SPECTROPHOTOMETRY'
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Array
(
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Array
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Array
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