
D. Gabrielle Brouillette
Examiner (ID: 5484)
| Most Active Art Unit | 1502 |
| Art Unit(s) | 1615, 1502, 1721 |
| Total Applications | 827 |
| Issued Applications | 554 |
| Pending Applications | 72 |
| Abandoned Applications | 201 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
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[patent_doc_number] => 08034640
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[patent_title] => 'Apparatus and method to inspect defect of semiconductor device'
[patent_app_type] => utility
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[patent_app_country] => US
[patent_app_date] => 2009-11-30
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[pdf_file] => patents/08/034/08034640.pdf
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Array
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[patent_issue_date] => 2011-01-20
[patent_title] => 'Methods of forming a dielectric thin film of a semiconductor device and methods of manufacturing a capacitor having the same'
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Array
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[patent_issue_date] => 2011-08-18
[patent_title] => 'METHOD FOR PRODUCING A METAL CONTACT ON A SEMICONDUCTOR SUBSTRATE PROVIDED WITH A COATING'
[patent_app_type] => utility
[patent_app_number] => 13/125815
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[patent_app_date] => 2009-11-26
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Array
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[patent_issue_date] => 2010-06-03
[patent_title] => 'METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT'
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[patent_title] => 'Junction profile engineering using staged thermal annealing'
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[patent_title] => 'METHOD FOR FABRICATING MOS TRANSISTOR'
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/604332 | Stress management for tensile films | Oct 21, 2009 | Issued |
Array
(
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[patent_title] => 'Method for manufacturing semiconductor device'
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Array
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[patent_title] => 'ZINC OXIDE FILM METHOD AND STRUCTURE FOR CIGS CELL'
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Array
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Array
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Array
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