Dameron Levest Jones

Array ( [id] => 12160403 [patent_doc_number] => 20180031668 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-02-01 [patent_title] => 'TEST APPARATUS WHICH TESTS SEMICONDUCTOR CHIPS' [patent_app_type] => utility [patent_app_number] => 15/448085 [patent_app_country] => US [patent_app_date] => 2017-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9626 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15448085 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11950704 [patent_doc_number] => 20170254855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-09-07 [patent_title] => 'VOLTAGE MEASUREMENT METHOD FOR BATTERY' [patent_app_type] => utility [patent_app_number] => 15/447874 [patent_app_country] => US [patent_app_date] => 2017-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 11806 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15447874 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 15980681 [patent_doc_number] => 10670662 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-06-02 [patent_title] => Method and apparatus for calibrating coulomb counting based state-of-charge estimation [patent_app_type] => utility [patent_app_number] => 15/447128 [patent_app_country] => US [patent_app_date] => 2017-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4629 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15447128 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12160341 [patent_doc_number] => 20180031607 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-02-01 [patent_title] => 'COMMON BOARD OF AN ADAPTOR FOR A TESTER, ADAPTOR FOR A TESTER, AND TESTER INCLUDING THE COMMON BOARD' [patent_app_type] => utility [patent_app_number] => 15/447084 [patent_app_country] => US [patent_app_date] => 2017-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7120 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15447084 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16030863 [patent_doc_number] => 10677845 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-06-09 [patent_title] => Converged test platforms and processes for class and system testing of integrated circuits [patent_app_type] => utility [patent_app_number] => 15/447095 [patent_app_country] => US [patent_app_date] => 2017-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 7730 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15447095 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 15515263 [patent_doc_number] => 10564213 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-02-18 [patent_title] => Dielectric breakdown monitor [patent_app_type] => utility [patent_app_number] => 15/443688 [patent_app_country] => US [patent_app_date] => 2017-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 7564 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15443688 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16322187 [patent_doc_number] => 10782145 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-09-22 [patent_title] => Devices and methods for determining a distance travelled [patent_app_type] => utility [patent_app_number] => 15/441829 [patent_app_country] => US [patent_app_date] => 2017-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3809 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15441829 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16757804 [patent_doc_number] => 10976346 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-04-13 [patent_title] => Socket [patent_app_type] => utility [patent_app_number] => 15/441366 [patent_app_country] => US [patent_app_date] => 2017-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 7162 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15441366 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 15823953 [patent_doc_number] => 10637179 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2020-04-28 [patent_title] => Hermetic RF connection for on-wafer operation [patent_app_type] => utility [patent_app_number] => 15/440734 [patent_app_country] => US [patent_app_date] => 2017-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 17 [patent_no_of_words] => 2734 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15440734 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11957394 [patent_doc_number] => 20170261547 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-09-14 [patent_title] => 'Temperature Forcing System and Method with Conductive Thermal Probes' [patent_app_type] => utility [patent_app_number] => 15/437861 [patent_app_country] => US [patent_app_date] => 2017-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3495 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15437861 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11937905 [patent_doc_number] => 20170242055 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-24 [patent_title] => 'KELVIN CONTACT ASSEMBLY AND METHOD OF INSTALLATION THEREOF' [patent_app_type] => utility [patent_app_number] => 15/438721 [patent_app_country] => US [patent_app_date] => 2017-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 3133 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15438721 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14425259 [patent_doc_number] => 10317429 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-06-11 [patent_title] => Bolt type probe [patent_app_type] => utility [patent_app_number] => 15/437464 [patent_app_country] => US [patent_app_date] => 2017-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3398 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 259 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15437464 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13374839 [patent_doc_number] => 20180238961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-08-23 [patent_title] => Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias [patent_app_type] => utility [patent_app_number] => 15/437713 [patent_app_country] => US [patent_app_date] => 2017-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5873 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15437713 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13816401 [patent_doc_number] => 10184966 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-01-22 [patent_title] => Signal inspection apparatus, signal inspection system, signal inspection method, and non-transitory computer-readable medium encoded with signal inspection program [patent_app_type] => utility [patent_app_number] => 15/436077 [patent_app_country] => US [patent_app_date] => 2017-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2904 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15436077 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12817513 [patent_doc_number] => 20180164343 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-06-14 [patent_title] => UNIVERSAL TEST MECHANISM FOR SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 15/434099 [patent_app_country] => US [patent_app_date] => 2017-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6076 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15434099 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14328979 [patent_doc_number] => 10295499 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-05-21 [patent_title] => Ferrous metals measuring magnetometer system and method [patent_app_type] => utility [patent_app_number] => 15/434293 [patent_app_country] => US [patent_app_date] => 2017-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 20 [patent_no_of_words] => 9143 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15434293 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14487435 [patent_doc_number] => 10330497 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2019-06-25 [patent_title] => Modified eddy current probe having a faraday shield [patent_app_type] => utility [patent_app_number] => 15/430601 [patent_app_country] => US [patent_app_date] => 2017-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 4030 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15430601 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16607179 [patent_doc_number] => 10908180 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-02-02 [patent_title] => Probe card case and probe card transfer method [patent_app_type] => utility [patent_app_number] => 15/428371 [patent_app_country] => US [patent_app_date] => 2017-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4101 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15428371 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 14459133 [patent_doc_number] => 10325535 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-06-18 [patent_title] => Circuit for testing display panel, method for testing display panel, and display panel [patent_app_type] => utility [patent_app_number] => 15/421123 [patent_app_country] => US [patent_app_date] => 2017-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 6231 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 414 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15421123 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11569893 [patent_doc_number] => 20170108537 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-04-20 [patent_title] => 'DIGITAL MULTI-METER' [patent_app_type] => utility [patent_app_number] => 15/393512 [patent_app_country] => US [patent_app_date] => 2016-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2689 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15393512 [rel_patent_id] =>[rel_patent_doc_number] =>)