Search

Dameron Levest Jones

Examiner (ID: 278, Phone: (571)272-0617 , Office: P/1618 )

Most Active Art Unit
1618
Art Unit(s)
3991, RD00, 1622, 1621, 1211, 1618, 1616, 1615, 1619
Total Applications
2444
Issued Applications
1478
Pending Applications
313
Abandoned Applications
653

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18973308 [patent_doc_number] => 20240053400 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-15 [patent_title] => Semiconductor Test Equipment and Method of Performing Current and Voltage Test Measurements [patent_app_type] => utility [patent_app_number] => 17/818520 [patent_app_country] => US [patent_app_date] => 2022-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3052 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 31 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17818520 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/818520
Semiconductor Test Equipment and Method of Performing Current and Voltage Test Measurements Aug 8, 2022 Pending
Array ( [id] => 18629566 [patent_doc_number] => 20230288450 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-14 [patent_title] => PROBE CARD DEVICE [patent_app_type] => utility [patent_app_number] => 17/883830 [patent_app_country] => US [patent_app_date] => 2022-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3388 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17883830 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/883830
PROBE CARD DEVICE Aug 8, 2022 Pending
Array ( [id] => 18168264 [patent_doc_number] => 20230034874 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-02-02 [patent_title] => OSCILLATION DETECTOR AND OPERATING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 17/873795 [patent_app_country] => US [patent_app_date] => 2022-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6018 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17873795 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/873795
Oscillation detector and operating method thereof Jul 25, 2022 Issued
Array ( [id] => 17991330 [patent_doc_number] => 20220357367 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-10 [patent_title] => Method and System for Improved Current Sensor [patent_app_type] => utility [patent_app_number] => 17/868986 [patent_app_country] => US [patent_app_date] => 2022-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11668 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17868986 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/868986
Method and System for Improved Current Sensor Jul 19, 2022 Pending
Array ( [id] => 19227887 [patent_doc_number] => 12007521 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-11 [patent_title] => Detection method of a user of an apparatus for controlling one or more functionalities of the apparatus [patent_app_type] => utility [patent_app_number] => 17/867175 [patent_app_country] => US [patent_app_date] => 2022-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 8336 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 245 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17867175 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/867175
Detection method of a user of an apparatus for controlling one or more functionalities of the apparatus Jul 17, 2022 Issued
Array ( [id] => 18022096 [patent_doc_number] => 20220373595 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-24 [patent_title] => SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE [patent_app_type] => utility [patent_app_number] => 17/813298 [patent_app_country] => US [patent_app_date] => 2022-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20515 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17813298 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/813298
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE Jul 17, 2022 Pending
Array ( [id] => 18150188 [patent_doc_number] => 20230024045 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-26 [patent_title] => SEMICONDUCTOR TESTING APPARATUS WITH ADAPTOR [patent_app_type] => utility [patent_app_number] => 17/865419 [patent_app_country] => US [patent_app_date] => 2022-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8300 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17865419 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/865419
SEMICONDUCTOR TESTING APPARATUS WITH ADAPTOR Jul 14, 2022 Pending
Array ( [id] => 19340049 [patent_doc_number] => 12050234 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-07-30 [patent_title] => IC socket includes a base part with a contact pin and a sheet member for electrical connection between the IC package and the wiring board [patent_app_type] => utility [patent_app_number] => 17/863440 [patent_app_country] => US [patent_app_date] => 2022-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 20 [patent_no_of_words] => 11682 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17863440 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/863440
IC socket includes a base part with a contact pin and a sheet member for electrical connection between the IC package and the wiring board Jul 12, 2022 Issued
Array ( [id] => 18182985 [patent_doc_number] => 20230043715 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-02-09 [patent_title] => PROBE, PROBE DEVICE, AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 17/858333 [patent_app_country] => US [patent_app_date] => 2022-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4310 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 35 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17858333 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/858333
PROBE, PROBE DEVICE, AND INSPECTION METHOD Jul 5, 2022 Pending
Array ( [id] => 18122394 [patent_doc_number] => 20230007997 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-12 [patent_title] => VERTICAL PROBE HEAD [patent_app_type] => utility [patent_app_number] => 17/858424 [patent_app_country] => US [patent_app_date] => 2022-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9860 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 470 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17858424 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/858424
Vertical probe head Jul 5, 2022 Issued
Array ( [id] => 18226902 [patent_doc_number] => 20230065896 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => PROBE CARD AND WAFER TESTING ASSEMBLY THEREOF [patent_app_type] => utility [patent_app_number] => 17/856678 [patent_app_country] => US [patent_app_date] => 2022-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4238 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17856678 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/856678
Probe card and wafer testing assembly thereof Jun 30, 2022 Issued
Array ( [id] => 18863360 [patent_doc_number] => 20230417796 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHANISM [patent_app_type] => utility [patent_app_number] => 17/850858 [patent_app_country] => US [patent_app_date] => 2022-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6550 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17850858 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/850858
INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHANISM Jun 26, 2022 Pending
Array ( [id] => 17914760 [patent_doc_number] => 20220317155 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-06 [patent_title] => CONTACT PROBE AND PROBE UNIT [patent_app_type] => utility [patent_app_number] => 17/848603 [patent_app_country] => US [patent_app_date] => 2022-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11903 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17848603 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/848603
Contact probe and probe unit Jun 23, 2022 Issued
Array ( [id] => 18068674 [patent_doc_number] => 20220399762 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-15 [patent_title] => DEVICES AND METHODS FOR POSITION DETECTION BY A 3D MAGNETIC FIELD SENSOR [patent_app_type] => utility [patent_app_number] => 17/836211 [patent_app_country] => US [patent_app_date] => 2022-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5039 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17836211 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/836211
DEVICES AND METHODS FOR POSITION DETECTION BY A 3D MAGNETIC FIELD SENSOR Jun 8, 2022 Pending
Array ( [id] => 18710516 [patent_doc_number] => 20230333141 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-19 [patent_title] => CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD DEVICE HAVING THE SAME [patent_app_type] => utility [patent_app_number] => 17/804090 [patent_app_country] => US [patent_app_date] => 2022-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4246 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17804090 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/804090
CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD DEVICE HAVING THE SAME May 24, 2022 Pending
Array ( [id] => 17831557 [patent_doc_number] => 20220268861 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-25 [patent_title] => MAGNETIC SENSOR [patent_app_type] => utility [patent_app_number] => 17/743621 [patent_app_country] => US [patent_app_date] => 2022-05-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8370 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17743621 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/743621
MAGNETIC SENSOR May 12, 2022 Pending
Array ( [id] => 18059403 [patent_doc_number] => 20220390489 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => PROBE UNIT [patent_app_type] => utility [patent_app_number] => 17/730579 [patent_app_country] => US [patent_app_date] => 2022-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4879 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17730579 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/730579
Probe unit with a free length cantilever contactor and pedestal Apr 26, 2022 Issued
Array ( [id] => 18981411 [patent_doc_number] => 11906576 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-02-20 [patent_title] => Contact assembly array and testing system having contact assembly array [patent_app_type] => utility [patent_app_number] => 17/730391 [patent_app_country] => US [patent_app_date] => 2022-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 51 [patent_no_of_words] => 16336 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17730391 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/730391
Contact assembly array and testing system having contact assembly array Apr 26, 2022 Issued
Array ( [id] => 19227778 [patent_doc_number] => 12007412 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-11 [patent_title] => Differential measurement probe [patent_app_type] => utility [patent_app_number] => 17/729378 [patent_app_country] => US [patent_app_date] => 2022-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6110 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17729378 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/729378
Differential measurement probe Apr 25, 2022 Issued
Array ( [id] => 18644163 [patent_doc_number] => 11768227 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-09-26 [patent_title] => Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers [patent_app_type] => utility [patent_app_number] => 17/727336 [patent_app_country] => US [patent_app_date] => 2022-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 10326 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 214 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17727336 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/727336
Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers Apr 21, 2022 Issued
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