Search

Dameron Levest Jones

Examiner (ID: 278, Phone: (571)272-0617 , Office: P/1618 )

Most Active Art Unit
1618
Art Unit(s)
3991, RD00, 1622, 1621, 1211, 1618, 1616, 1615, 1619
Total Applications
2444
Issued Applications
1478
Pending Applications
313
Abandoned Applications
653

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 17686441 [patent_doc_number] => 20220193733 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-06-23 [patent_title] => PROBE PIN CLEANING PAD AND CLEANING METHOD FOR PROBE PIN [patent_app_type] => utility [patent_app_number] => 17/691129 [patent_app_country] => US [patent_app_date] => 2022-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7863 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 49 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17691129 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/691129
Probe pin cleaning pad and cleaning method for probe pin Mar 9, 2022 Issued
Array ( [id] => 18066500 [patent_doc_number] => 20220397587 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-15 [patent_title] => ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE [patent_app_type] => utility [patent_app_number] => 17/679312 [patent_app_country] => US [patent_app_date] => 2022-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6612 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17679312 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/679312
ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE Feb 23, 2022 Pending
Array ( [id] => 17579464 [patent_doc_number] => 20220136319 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-05 [patent_title] => TESTER AND ELECTRICAL CONNECTORS FOR INSULATED GLASS UNITS [patent_app_type] => utility [patent_app_number] => 17/576862 [patent_app_country] => US [patent_app_date] => 2022-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15965 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -33 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17576862 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/576862
TESTER AND ELECTRICAL CONNECTORS FOR INSULATED GLASS UNITS Jan 13, 2022 Pending
Array ( [id] => 18392705 [patent_doc_number] => 20230160925 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-25 [patent_title] => POGO PIN-FREE TESTING DEVICE FOR IC CHIP TEST AND TESTING METHOD OF IC CHIP [patent_app_type] => utility [patent_app_number] => 17/571537 [patent_app_country] => US [patent_app_date] => 2022-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4299 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17571537 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/571537
Pogo pin-free testing device for IC chip test and testing method of IC chip Jan 9, 2022 Issued
Array ( [id] => 17721657 [patent_doc_number] => 20220214379 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-07 [patent_title] => PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND PROBE HEAD ADJUSTING METHOD [patent_app_type] => utility [patent_app_number] => 17/565075 [patent_app_country] => US [patent_app_date] => 2021-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7726 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 305 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17565075 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/565075
Probe head and die set having horizontally fine adjustable die and probe head adjusting method Dec 28, 2021 Issued
Array ( [id] => 18385505 [patent_doc_number] => 11656281 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-23 [patent_title] => Battery probe set [patent_app_type] => utility [patent_app_number] => 17/554687 [patent_app_country] => US [patent_app_date] => 2021-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5524 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17554687 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/554687
Battery probe set Dec 16, 2021 Issued
Array ( [id] => 17689411 [patent_doc_number] => 20220196704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-06-23 [patent_title] => MEASUREMENT UNIT [patent_app_type] => utility [patent_app_number] => 17/547400 [patent_app_country] => US [patent_app_date] => 2021-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5650 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17547400 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/547400
MEASUREMENT UNIT Dec 9, 2021 Pending
Array ( [id] => 17506600 [patent_doc_number] => 20220099703 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-31 [patent_title] => PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES [patent_app_type] => utility [patent_app_number] => 17/545851 [patent_app_country] => US [patent_app_date] => 2021-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6774 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17545851 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/545851
Probe card for a testing apparatus of electronic devices Dec 7, 2021 Issued
Array ( [id] => 18400232 [patent_doc_number] => 11662364 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-05-30 [patent_title] => Integrated waveguide tuner [patent_app_type] => utility [patent_app_number] => 17/544312 [patent_app_country] => US [patent_app_date] => 2021-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 12 [patent_no_of_words] => 2216 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17544312 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/544312
Integrated waveguide tuner Dec 6, 2021 Issued
Array ( [id] => 18421626 [patent_doc_number] => 20230176090 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-08 [patent_title] => MEASUREMENT PROBE AND METHOD [patent_app_type] => utility [patent_app_number] => 17/537249 [patent_app_country] => US [patent_app_date] => 2021-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4348 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17537249 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/537249
MEASUREMENT PROBE AND METHOD Nov 28, 2021 Pending
Array ( [id] => 17689412 [patent_doc_number] => 20220196705 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-06-23 [patent_title] => INSPECTION APPARATUS AND INSPECTION METHOD FOR ELECTRONIC DEVICE [patent_app_type] => utility [patent_app_number] => 17/524629 [patent_app_country] => US [patent_app_date] => 2021-11-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4555 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17524629 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/524629
INSPECTION APPARATUS AND INSPECTION METHOD FOR ELECTRONIC DEVICE Nov 10, 2021 Abandoned
Array ( [id] => 18247641 [patent_doc_number] => 11604220 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-03-14 [patent_title] => Test apparatuses for semiconductor devices [patent_app_type] => utility [patent_app_number] => 17/517057 [patent_app_country] => US [patent_app_date] => 2021-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 10271 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17517057 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/517057
Test apparatuses for semiconductor devices Nov 1, 2021 Issued
Array ( [id] => 17721659 [patent_doc_number] => 20220214381 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-07 [patent_title] => MICROELECTRONIC TEST INTERFACE SUBSTRATES, DEVICES, AND METHODS OF MOUNTING ON A PRINTED CIRCUIT TEST LOAD BOARD [patent_app_type] => utility [patent_app_number] => 17/514106 [patent_app_country] => US [patent_app_date] => 2021-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3622 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -22 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17514106 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/514106
MICROELECTRONIC TEST INTERFACE SUBSTRATES, DEVICES, AND METHODS OF MOUNTING ON A PRINTED CIRCUIT TEST LOAD BOARD Oct 28, 2021 Abandoned
Array ( [id] => 17762690 [patent_doc_number] => 20220236302 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-28 [patent_title] => HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING [patent_app_type] => utility [patent_app_number] => 17/500937 [patent_app_country] => US [patent_app_date] => 2021-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6716 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17500937 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/500937
Hybrid shielding sockets with impedance tuning for integrated circuit device test tooling Oct 12, 2021 Issued
Array ( [id] => 18576548 [patent_doc_number] => 11733067 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-22 [patent_title] => Variable differential transformer for position monitoring [patent_app_type] => utility [patent_app_number] => 17/497030 [patent_app_country] => US [patent_app_date] => 2021-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3473 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17497030 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/497030
Variable differential transformer for position monitoring Oct 7, 2021 Issued
Array ( [id] => 18006344 [patent_doc_number] => 20220365110 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-17 [patent_title] => PROBE CARD DEVICE AND DISPOSABLE ADJUSTMENT FILM THEREOF [patent_app_type] => utility [patent_app_number] => 17/491630 [patent_app_country] => US [patent_app_date] => 2021-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4385 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17491630 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/491630
Probe card device and disposable adjustment film thereof Sep 30, 2021 Issued
Array ( [id] => 17628550 [patent_doc_number] => 20220163565 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-26 [patent_title] => PROBE CARD DEVICE AND SELF-ALIGNED PROBE [patent_app_type] => utility [patent_app_number] => 17/491613 [patent_app_country] => US [patent_app_date] => 2021-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3809 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17491613 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/491613
Probe card device and self-aligned probe Sep 30, 2021 Issued
Array ( [id] => 17643222 [patent_doc_number] => 20220170960 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-06-02 [patent_title] => PROBE CARD DEVICE AND DUAL-ARM PROBE [patent_app_type] => utility [patent_app_number] => 17/491602 [patent_app_country] => US [patent_app_date] => 2021-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4406 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 231 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17491602 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/491602
Probe card device and dual-arm probe Sep 30, 2021 Issued
Array ( [id] => 18400234 [patent_doc_number] => 11662366 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-30 [patent_title] => Wafer probe with elastomer support [patent_app_type] => utility [patent_app_number] => 17/480230 [patent_app_country] => US [patent_app_date] => 2021-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 5960 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17480230 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/480230
Wafer probe with elastomer support Sep 20, 2021 Issued
Array ( [id] => 18103548 [patent_doc_number] => 11543430 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-01-03 [patent_title] => Probe assembly [patent_app_type] => utility [patent_app_number] => 17/469412 [patent_app_country] => US [patent_app_date] => 2021-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 6252 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 286 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17469412 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/469412
Probe assembly Sep 7, 2021 Issued
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