Dameron Levest Jones

Array ( [id] => 19551634 [patent_doc_number] => 12135337 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-11-05 [patent_title] => Proximity detection for assessing sensing probe attachment state [patent_app_type] => utility [patent_app_number] => 17/240148 [patent_app_country] => US [patent_app_date] => 2021-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 34 [patent_no_of_words] => 15910 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17240148 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17201419 [patent_doc_number] => 20210341514 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-11-04 [patent_title] => TESTING DEVICE WITH POWER PROTECTION AND ITS TESTING PLATFORM [patent_app_type] => utility [patent_app_number] => 17/238221 [patent_app_country] => US [patent_app_date] => 2021-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4657 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17238221 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17954488 [patent_doc_number] => 11480589 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-10-25 [patent_title] => Wafer probe integration with load pull tuner [patent_app_type] => utility [patent_app_number] => 17/232603 [patent_app_country] => US [patent_app_date] => 2021-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 27 [patent_no_of_words] => 3423 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17232603 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18290817 [patent_doc_number] => 11619686 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-04 [patent_title] => Magnetic sensor and magnetic sensor system [patent_app_type] => utility [patent_app_number] => 17/227779 [patent_app_country] => US [patent_app_date] => 2021-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 35 [patent_no_of_words] => 17944 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17227779 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18527115 [patent_doc_number] => 11714105 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-01 [patent_title] => Socket and inspection socket [patent_app_type] => utility [patent_app_number] => 17/216748 [patent_app_country] => US [patent_app_date] => 2021-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 7491 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17216748 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17127698 [patent_doc_number] => 20210302467 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-09-30 [patent_title] => TEST KIT FOR TESTING A DEVICE UNDER TEST [patent_app_type] => utility [patent_app_number] => 17/211738 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6144 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -30 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17211738 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18370061 [patent_doc_number] => 11650228 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-05-16 [patent_title] => Very-wide-bandwidth current sensor [patent_app_type] => utility [patent_app_number] => 17/995130 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4112 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17995130 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18103550 [patent_doc_number] => 11543432 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-01-03 [patent_title] => Probe head and probe card having same [patent_app_type] => utility [patent_app_number] => 17/211812 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 17 [patent_no_of_words] => 8431 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17211812 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17143081 [patent_doc_number] => 20210311094 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-07 [patent_title] => TESTING APPARATUS AND METHOD OF CONTROLLING TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 17/209400 [patent_app_country] => US [patent_app_date] => 2021-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4712 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 417 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17209400 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16949522 [patent_doc_number] => 20210208213 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-08 [patent_title] => MAGNETIC FIELD MONITOR HAVING AUTOMATED QUANTITATIVE CALIBRATION OF MAGNETIC FIELD SENSOR [patent_app_type] => utility [patent_app_number] => 17/202995 [patent_app_country] => US [patent_app_date] => 2021-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7778 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17202995 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16933800 [patent_doc_number] => 20210199689 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-01 [patent_title] => SOCKET [patent_app_type] => utility [patent_app_number] => 17/202334 [patent_app_country] => US [patent_app_date] => 2021-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7143 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17202334 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16917730 [patent_doc_number] => 20210190822 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-06-24 [patent_title] => MULTI-LAYER MEMS SPRING PIN [patent_app_type] => utility [patent_app_number] => 17/193449 [patent_app_country] => US [patent_app_date] => 2021-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4818 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17193449 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18290818 [patent_doc_number] => 11619687 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-04 [patent_title] => Magnetic field measurement apparatus and magnetic field measurement method [patent_app_type] => utility [patent_app_number] => 17/192639 [patent_app_country] => US [patent_app_date] => 2021-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4999 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17192639 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18014448 [patent_doc_number] => 11506740 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-11-22 [patent_title] => Test apparatus which tests semiconductor chips [patent_app_type] => utility [patent_app_number] => 17/190697 [patent_app_country] => US [patent_app_date] => 2021-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9444 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 264 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17190697 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17008574 [patent_doc_number] => 20210239735 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-08-05 [patent_title] => PROBE HEAD AND PROBE CARD HAVING SAME [patent_app_type] => utility [patent_app_number] => 17/161460 [patent_app_country] => US [patent_app_date] => 2021-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8617 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17161460 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17969373 [patent_doc_number] => 11486897 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-11-01 [patent_title] => Contact and test socket device for testing semiconductor device [patent_app_type] => utility [patent_app_number] => 17/158441 [patent_app_country] => US [patent_app_date] => 2021-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 34 [patent_figures_cnt] => 39 [patent_no_of_words] => 8704 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 240 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17158441 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16825704 [patent_doc_number] => 20210140997 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-13 [patent_title] => CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 17/157538 [patent_app_country] => US [patent_app_date] => 2021-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8682 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17157538 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16809602 [patent_doc_number] => 20210132156 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-06 [patent_title] => Battery Diagnostics System and Method Using Second Path Redundant Measurement Approach [patent_app_type] => utility [patent_app_number] => 17/144813 [patent_app_country] => US [patent_app_date] => 2021-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9187 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17144813 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18370060 [patent_doc_number] => 11650227 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-16 [patent_title] => System and method for attenuating and/or terminating RF circuit [patent_app_type] => utility [patent_app_number] => 17/142987 [patent_app_country] => US [patent_app_date] => 2021-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 3807 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17142987 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18734164 [patent_doc_number] => 11802891 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-10-31 [patent_title] => Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using [patent_app_type] => utility [patent_app_number] => 17/139933 [patent_app_country] => US [patent_app_date] => 2020-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 35 [patent_no_of_words] => 17191 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 437 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17139933 [rel_patent_id] =>[rel_patent_doc_number] =>)