Search

Dameron Levest Jones

Examiner (ID: 278, Phone: (571)272-0617 , Office: P/1618 )

Most Active Art Unit
1618
Art Unit(s)
3991, RD00, 1622, 1621, 1211, 1618, 1616, 1615, 1619
Total Applications
2444
Issued Applications
1478
Pending Applications
313
Abandoned Applications
653

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18637389 [patent_doc_number] => 11761982 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-09-19 [patent_title] => Probes with planar unbiased spring elements for electronic component contact and methods for making such probes [patent_app_type] => utility [patent_app_number] => 17/139925 [patent_app_country] => US [patent_app_date] => 2020-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 48 [patent_no_of_words] => 17355 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17139925 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/139925
Probes with planar unbiased spring elements for electronic component contact and methods for making such probes Dec 30, 2020 Issued
Array ( [id] => 18888954 [patent_doc_number] => 11867721 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-01-09 [patent_title] => Probes with multiple springs, methods for making, and methods for using [patent_app_type] => utility [patent_app_number] => 17/139936 [patent_app_country] => US [patent_app_date] => 2020-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 54 [patent_figures_cnt] => 192 [patent_no_of_words] => 37787 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 655 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17139936 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/139936
Probes with multiple springs, methods for making, and methods for using Dec 30, 2020 Issued
Array ( [id] => 16794133 [patent_doc_number] => 20210123950 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-29 [patent_title] => PROBE CARD FOR HIGH FREQUENCY APPLICATIONS [patent_app_type] => utility [patent_app_number] => 17/139782 [patent_app_country] => US [patent_app_date] => 2020-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9784 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -31 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17139782 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/139782
Probe card for high frequency applications Dec 30, 2020 Issued
Array ( [id] => 16993299 [patent_doc_number] => 20210231719 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-29 [patent_title] => INSULATION RESISTANCE MEASUREMENT DEVICE AND INSULATION RESISTANCE MEASUREMENT METHOD [patent_app_type] => utility [patent_app_number] => 17/136099 [patent_app_country] => US [patent_app_date] => 2020-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5753 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17136099 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/136099
Insulation resistance measurement device and insulation resistance measurement method Dec 28, 2020 Issued
Array ( [id] => 17860923 [patent_doc_number] => 11442079 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-09-13 [patent_title] => Contact device for electrical test [patent_app_type] => utility [patent_app_number] => 17/132700 [patent_app_country] => US [patent_app_date] => 2020-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 5172 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 298 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17132700 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/132700
Contact device for electrical test Dec 22, 2020 Issued
Array ( [id] => 17527907 [patent_doc_number] => 11300587 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-04-12 [patent_title] => High-frequency measurement line structure [patent_app_type] => utility [patent_app_number] => 17/129011 [patent_app_country] => US [patent_app_date] => 2020-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 3271 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17129011 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/129011
High-frequency measurement line structure Dec 20, 2020 Issued
Array ( [id] => 17345032 [patent_doc_number] => 20220011363 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-13 [patent_title] => Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias [patent_app_type] => utility [patent_app_number] => 17/121851 [patent_app_country] => US [patent_app_date] => 2020-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5906 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17121851 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/121851
Terahertz plasmonics for testing very large-scale integrated circuits under bias Dec 14, 2020 Issued
Array ( [id] => 16750980 [patent_doc_number] => 20210102989 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-08 [patent_title] => COAXIAL LEAD STRUCTURE AND METHOD FOR RADIATING GIS PARTIAL DISCHARGE UHF SIGNAL OUTWARD [patent_app_type] => utility [patent_app_number] => 17/121730 [patent_app_country] => US [patent_app_date] => 2020-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1894 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17121730 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/121730
Coaxial lead structure and method for radiating GIS partial discharge UHF signal outward Dec 13, 2020 Issued
Array ( [id] => 18144898 [patent_doc_number] => 20230018751 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-19 [patent_title] => SOCKET AND INSPECTION SOCKET [patent_app_type] => utility [patent_app_number] => 17/779626 [patent_app_country] => US [patent_app_date] => 2020-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10471 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17779626 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/779626
SOCKET AND INSPECTION SOCKET Nov 19, 2020 Pending
Array ( [id] => 17437527 [patent_doc_number] => 11262859 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-03-01 [patent_title] => Rotation input device for a capacitive sense cord [patent_app_type] => utility [patent_app_number] => 16/951757 [patent_app_country] => US [patent_app_date] => 2020-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6286 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16951757 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/951757
Rotation input device for a capacitive sense cord Nov 17, 2020 Issued
Array ( [id] => 16856140 [patent_doc_number] => 20210156885 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-27 [patent_title] => PROBE [patent_app_type] => utility [patent_app_number] => 16/950721 [patent_app_country] => US [patent_app_date] => 2020-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5087 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16950721 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/950721
PROBE Nov 16, 2020 Abandoned
Array ( [id] => 17770493 [patent_doc_number] => 11402428 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-02 [patent_title] => High-performance probe card in high-frequency [patent_app_type] => utility [patent_app_number] => 17/098179 [patent_app_country] => US [patent_app_date] => 2020-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7051 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17098179 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/098179
High-performance probe card in high-frequency Nov 12, 2020 Issued
Array ( [id] => 16825707 [patent_doc_number] => 20210141000 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-13 [patent_title] => PROBE PIN CLEANING PAD AND CLEANING METHOD FOR PROBE PIN [patent_app_type] => utility [patent_app_number] => 17/095747 [patent_app_country] => US [patent_app_date] => 2020-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6220 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17095747 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/095747
PROBE PIN CLEANING PAD AND CLEANING METHOD FOR PROBE PIN Nov 11, 2020 Abandoned
Array ( [id] => 17400964 [patent_doc_number] => 20220043054 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-10 [patent_title] => ANALYSIS METHOD AND ANALYSIS SYSTEM OF VOLTAGE CONTRAST DEFECT [patent_app_type] => utility [patent_app_number] => 17/092324 [patent_app_country] => US [patent_app_date] => 2020-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3703 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17092324 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/092324
Analysis method and analysis system of voltage contrast defect Nov 8, 2020 Issued
Array ( [id] => 18078830 [patent_doc_number] => 20220404442 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-22 [patent_title] => SIGNAL PROCESSING METHOD, PROGRAM, AND SIGNAL PROCESSING SYSTEM [patent_app_type] => utility [patent_app_number] => 17/774791 [patent_app_country] => US [patent_app_date] => 2020-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9575 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 248 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17774791 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/774791
Signal processing method, program, and signal processing system Nov 4, 2020 Issued
Array ( [id] => 17580265 [patent_doc_number] => 20220137120 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-05 [patent_title] => SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS [patent_app_type] => utility [patent_app_number] => 17/083922 [patent_app_country] => US [patent_app_date] => 2020-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8060 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -32 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17083922 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/083922
SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS Oct 28, 2020 Abandoned
Array ( [id] => 16809591 [patent_doc_number] => 20210132145 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-06 [patent_title] => PROBE SYSTEMS AND METHODS FOR TESTING A DEVICE UNDER TEST [patent_app_type] => utility [patent_app_number] => 17/076279 [patent_app_country] => US [patent_app_date] => 2020-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8100 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17076279 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/076279
Probe systems and methods for testing a device under test Oct 20, 2020 Issued
Array ( [id] => 16584131 [patent_doc_number] => 20210018533 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-01-21 [patent_title] => INTEGRATED CIRCUIT CONTACT TEST APPARATUS WITH AND METHOD OF CONSTRUCTION [patent_app_type] => utility [patent_app_number] => 17/063279 [patent_app_country] => US [patent_app_date] => 2020-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5825 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17063279 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/063279
Integrated circuit contact test apparatus with and method of construction Oct 4, 2020 Issued
Array ( [id] => 17506602 [patent_doc_number] => 20220099705 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-31 [patent_title] => DYNAMIC CONNECTION INDICATION [patent_app_type] => utility [patent_app_number] => 17/038002 [patent_app_country] => US [patent_app_date] => 2020-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5269 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17038002 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/038002
Dynamic connection indication Sep 29, 2020 Issued
Array ( [id] => 17906647 [patent_doc_number] => 11460498 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-10-04 [patent_title] => Adjustable probe device for impedance testing for circuit board [patent_app_type] => utility [patent_app_number] => 17/034741 [patent_app_country] => US [patent_app_date] => 2020-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 7365 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 253 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17034741 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/034741
Adjustable probe device for impedance testing for circuit board Sep 27, 2020 Issued
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